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1. 发明授权

US4115148A Method for preventing corrosion of a sulfur dioxide regenerating apparatus 失效
标题翻译：防止二氧化硫再生装置腐蚀的方法
公开(公告)号：US4115148A
公开(公告)日：1978-09-19
申请号：US733282
申请日：1976-10-15
申请人： Masao Okubo , Masayoshi Miki , Takeshi Ueda
发明人： Masao Okubo , Masayoshi Miki , Takeshi Ueda
IPC分类号： B01D53/50 , B08B7/04
CPC分类号： B01D53/501
摘要： Corrosion of an SO.sub.2 regeneration apparatus is prevented upon suspending its operation by introducing an inert gas into the apparatus to produce an air concentration of not more than 5% by volume therein and maintaining that concentration while reducing temperature in the apparatus to room temperature.
摘要翻译：通过向设备中引入惰性气体来阻止SO 2再生装置的腐蚀，以产生不大于5体积％的空气浓度，并保持该浓度同时将装置中的温度降至室温。

2. 发明授权

US4381941A Method for improving surface defect of specific steel resistant to concentrated nitric acid 失效
标题翻译：改善耐硝酸浓度的钢的表面缺陷的方法
公开(公告)号：US4381941A
公开(公告)日：1983-05-03
申请号：US246859
申请日：1981-03-23
申请人： Naoya Ito , Takeshi Yoshida , Masahiro Aoki , Masao Okubo , Masayoshi Miki
发明人： Naoya Ito , Takeshi Yoshida , Masahiro Aoki , Masao Okubo , Masayoshi Miki
IPC分类号： C21C7/04 , C21C7/00 , C22C38/48 , C22C38/50 , C22C38/58 , C22C33/00
CPC分类号： C22C38/50 , C21C7/0006 , C22C38/48 , C22C38/58
摘要： A method for improving surface defect of specific steel resistant to concentrated nitric acid, wherein the specific steel in a molten state, either a stainless steel comprising C.ltoreq.0.1 wt %, 2.5.ltoreq.Si.ltoreq.5 wt %, Mn.ltoreq.2 wt %,15.ltoreq.Cr.ltoreq.20 wt %, 10.ltoreq.Ni.ltoreq.22 wt %,C.times.10.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2.5 wt %,the balance being iron and inevitable impurities,or a high-silicon-nickel-chromium steel comprisingC.ltoreq.0.03 wt %, 5.ltoreq.Si.ltoreq.7 wt %, Mn.ltoreq.10 wt %,7.ltoreq.Cr.ltoreq.16 wt %, 10.ltoreq.Ni.ltoreq.19 wt %,C.times.4.ltoreq. at least one of Nb, Ta and Zr.ltoreq.2 wt %,the balance being iron and inevitable impurities,is admixed with titanium (0.05.ltoreq.Ti.ltoreq.0.2 wt %) when producing said steel.
摘要翻译：一种改善对浓硝酸耐腐蚀的特种钢的表面缺陷的方法，其中熔融状态的特定钢，包括C≤0.1重量％，2.5≤Si≤5重量％的不锈钢，Mn Nb，Ta和Zr中的至少一种2.5重量％，25重量％，15重量％，20重量％，10重量％，余量为铁和不可避免的杂质，或包含C <0.03重量％，5≤Si≤7重量％，Mn <10重量％，7重量％ / = Cr <16wt％，10≤Ni≤19wt％，Cx4 = Nb，Ta和Zr中的至少一种2wt％，余量为铁和不可避免的杂质，在制造所述钢时与钛（0.05≤Ti≤0.2wt％）混合。

3. 发明授权

US4279648A High silicon chromium nickel steel for strong nitric acid 失效
标题翻译：高硅铬镍钢用于强硝酸
公开(公告)号：US4279648A
公开(公告)日：1981-07-21
申请号：US103922
申请日：1979-12-17
申请人： Naoya Ito , Kiichi Saito , Takeshi Yoshida , Masahiro Aoki , Masao Okubo , Masayoshi Miki
发明人： Naoya Ito , Kiichi Saito , Takeshi Yoshida , Masahiro Aoki , Masao Okubo , Masayoshi Miki
IPC分类号： C22C38/00 , B23K35/30 , C22C38/40 , C22C38/48 , C22C38/50 , C22C38/58 , F16J3/04 , C22C38/02
CPC分类号： C22C38/48 , C22C38/40 , C22C38/50 , C22C38/58
摘要： A high-silicon-nickel-chromium steel resistant to concentrated nitric acid with a good workability and a good weldability, comprisingcarbon in an amount of not more than 0.03% (C.ltoreq.0.03%),silicon in an amount of from more than 5% to not more than 7% (5%
摘要翻译：耐高浓度硝酸的高硅镍铬钢，具有良好的可加工性和良好的可焊性，其中碳含量不超过0.03％（C≤0.03％），硅量较多 5％〜7％以下（5％

4. 发明授权

US4171218A Anticorrosive bellows 失效
标题翻译：防腐波纹管
公开(公告)号：US4171218A
公开(公告)日：1979-10-16
申请号：US907345
申请日：1978-05-18
申请人： Taiji Hoshino , Masao Okubo , Masayoshi Miki
发明人： Taiji Hoshino , Masao Okubo , Masayoshi Miki
IPC分类号： C22C38/00 , C22C38/26 , C22C38/28 , F16J3/04 , C22C38/02 , C22C38/48 , C22C38/50
CPC分类号： C22C38/28 , C22C38/26 , F16J3/047 , Y10T29/49877
摘要： An anticorrosive bellows made of stainless steel containing 0.10% by weight or less of C, 2.5-5% by weight of Si, 2% by weight or less of Mn, 15-20% by weight of Cr, 10-22% by weight of Ni, 10 times or more as much as the C content but at most 2.5% by weight of at least one element selected from the group consisting of Ta and Zr, and the remainder consisiting substantially of Fe shows excellent corrosion resistance even under strongly corrosive circumstances, e.g. fuming or concentrated nitric acid. Said stainless steel has improved workability, weldability and endurance and the produced bellows can be used as a bellows valve, a bellows joint, and the like.
摘要翻译：由不锈钢制成的防锈波纹管，含有0.10重量％以下的C，2.5-5重量％的Si，2重量％以下的Mn，15〜20重量％的Cr，10〜22重量％的Ni，比C含量高10倍以上，但至少2.5重量％的选自Ta和Zr的至少一种元素，其余基本上由Fe组成，即使在强腐蚀性下也具有优异的耐腐蚀性情况，例如发烟或浓硝酸。所述不锈钢具有提高的可加工性，可焊性和耐久性，并且生产的波纹管可用作波纹管阀，波纹管接头等。

5. 发明授权

US5729799A Image forming method and apparatus having a semiconductive intermediate transfer member 失效
标题翻译：具有半导体中间转印构件的图像形成方法和装置
公开(公告)号：US5729799A
公开(公告)日：1998-03-17
申请号：US730760
申请日：1996-10-15
申请人： Kazunori Numao , Noriaki Kojima , Masao Okubo , Nobukazu Takahashi
发明人： Kazunori Numao , Noriaki Kojima , Masao Okubo , Nobukazu Takahashi
IPC分类号： G03G15/00 , G03G15/16 , G03G21/06 , G03G21/08 , G03G21/10 , G03G21/00
CPC分类号： G03G21/06
摘要： An image forming apparatus of such a type as is provided with a photosensitive member having a semi-conductive intermediate transfer member disposed opposite the photosensitive member. A charger electrically charges the photosensitive member. An exposure device forms an electrostatic latent image on the photosensitive member and developer visualizes the electrostatic latent image using toner identical in polarity to the photosensitive member. A primary transfer device transfers the toner image to the intermediate transfer member by applying a bias opposite in polarity to the photosensitive member, and a secondary transfer apparatus transfers the toner image on the intermediate transfer member to a transfer material. An optical charge-eliminator optically removes the electrical charge from the photosensitive member. A contact charge-eliminator is provided between the optical charge-eliminator and the primary transfer device so as to completely eliminate the electric charge injected into the photosensitive member at the time of the primary transfer.
摘要翻译：这种类型的图像形成装置设置有具有与感光构件相对设置的半导体中间转印构件的感光构件。充电器使感光元件充电。曝光装置在感光构件上形成静电潜像，并且显影剂使用与感光构件极性相同的调色剂使静电潜像显现。一次转印装置通过施加与感光构件极性相反的偏压将调色剂图像转印到中间转印部件，二次转印装置将中间转印部件上的调色剂图像转印到转印材料上。光学电荷消除器从光敏元件光学去除电荷。在光学电荷消除器和一次转印装置之间提供接触电荷消除器，以便完全消除在一次转印时注入到感光构件中的电荷。

6. 发明授权

US5413789A Antimicrobial composition of aluminosilicate coated silica gel 失效
标题翻译：硅铝酸盐涂层硅胶的抗微生物组成
公开(公告)号：US5413789A
公开(公告)日：1995-05-09
申请号：US61685
申请日：1993-05-17
申请人： Zenji Hagiwara , Masao Okubo
发明人： Zenji Hagiwara , Masao Okubo
IPC分类号： A61L2/16 , A01N25/10 , A01N25/26 , A01N59/16 , A01N59/20 , A01N61/00 , C01B33/159 , C02F1/50 , C08K9/02 , D01F1/10 , D01F6/04
CPC分类号： D01F6/04 , A01N25/10 , A01N25/26 , A01N59/16 , A01N59/20 , C02F1/505 , C08K9/02 , D01F1/103
摘要： The invention provides a novel antibacterial compound and a process for producing it. Futhermore, the invention provides a novel antibacterial polymer composite comprising a polymer and the antimicrobial compositon.
摘要翻译：本发明提供了一种新型的抗菌化合物及其生产方法。此外，本发明提供了包含聚合物和抗微生物组合物的新型抗菌聚合物复合物。

7. 发明授权

US4518914A Testing apparatus of semiconductor wafers 失效
标题翻译：半导体晶片测试装置
公开(公告)号：US4518914A
公开(公告)日：1985-05-21
申请号：US404055
申请日：1982-08-02
申请人： Masao Okubo , Yasuro Yoshimitsu , Fumio Nakai , Oliver R. Garretson
发明人： Masao Okubo , Yasuro Yoshimitsu , Fumio Nakai , Oliver R. Garretson
IPC分类号： G01R1/073 , H01L21/66 , G01R1/06 , G01R31/02
CPC分类号： G01R1/07314 , G01R1/07342
摘要： A testing apparatus of semiconductor wafers includes a base plate and a probe card including probe needles, wherein the probe card is detachably affixed to the base plate under air suction, which is derived from a vacuum produced in an airtightly sealed space provided between the base plate and the probe card.
摘要翻译：半导体晶片的测试装置包括基板和包括探针的探针卡，其中探针卡在空气抽吸下可拆卸地固定到底板，该真空源是由设置在基板之间的气密密封空间中产生的真空和探针卡。

8. 发明申请

US20090242411A1 POLYIMIDE-METAL LAMINATED BODY AND POLYIMIDE CIRCUIT BOARD 审中-公开
标题翻译：聚酰亚胺金属层压体和聚酰亚胺电路板
公开(公告)号：US20090242411A1
公开(公告)日：2009-10-01
申请号：US12465922
申请日：2009-05-14
申请人： Tadahiro Yokozawa , Hiroaki Yamaguchi , Keita Banba , Masao Okubo , Sumiko Okubo
发明人： Tadahiro Yokozawa , Hiroaki Yamaguchi , Keita Banba , Masao Okubo , Sumiko Okubo
IPC分类号： H05K3/00 , C25D5/02
CPC分类号： H05K3/38 , H05K1/0346 , H05K3/181 , H05K3/426 , H05K2201/0154 , H05K2201/0175 , Y10T428/24917 , Y10T428/31721
摘要： A process for producing a polyimide-metal laminated body includes forming a metal conductive layer on a polyimide film having a ceramic-modified or pseudoceramic-modified surface with a wet plating process which includes forming at least a ground treatment layer by electroless plating, conducting electroless metal plating and conducting electrolytic copper plating.
摘要翻译：一种聚酰亚胺 - 金属层叠体的制造方法，其特征在于，在具有陶瓷改性或假陶瓷改性面的聚酰亚胺膜上形成金属导电层，其中，所述湿式电镀工艺包括通过无电镀形成至少一层地面处理层，金属电镀和导电电解镀铜。

9. 发明申请

US20080286538A1 Polyimide-Metal Laminated Body and Polyimide Circuit Board 审中-公开
标题翻译：聚酰亚胺金属层压体和聚酰亚胺电路板
公开(公告)号：US20080286538A1
公开(公告)日：2008-11-20
申请号：US10585533
申请日：2005-01-11
申请人： Tadahiro Yokozawa , Hiroaki Yamaguchi , Keita Banba , Masao Okubo , Sumiko Okubo
发明人： Tadahiro Yokozawa , Hiroaki Yamaguchi , Keita Banba , Masao Okubo , Sumiko Okubo
IPC分类号： B32B15/08 , H05K1/03
CPC分类号： H05K3/38 , H05K1/0346 , H05K3/181 , H05K3/426 , H05K2201/0154 , H05K2201/0175 , Y10T428/24917 , Y10T428/31721
摘要： A polyimide-metal laminated body obtained by forming a metal conductive layer on a polyimide film, which has been ceramic-modified or pseudoceramic-modified on at least the surface, by a wet plating process capable of accomplishing metal plating on ceramic. A polyimide-metal laminated body and polyimide circuit board having satisfactory cohesion in wet plating steps, maintain practical cohesion even after high temperature aging treatment, and exhibiting satisfactory electrical insulating reliability, can be obtained.
摘要翻译：在聚酰亚胺膜上形成金属导电层的聚酰亚胺 - 金属层叠体，其通过能够在陶瓷上进行金属电镀的湿式电镀法在至少表面进行陶瓷改性或者假陶瓷改性。在湿式电镀步骤中具有令人满意的内聚力的聚酰亚胺 - 金属层压体和聚酰亚胺电路板，即使在高温时效处理之后也能保持实用的内聚力，并且可以获得令人满意的电绝缘可靠性。

10. 发明授权

US06294922B1 Probe for testing a semiconductor integrated circuit 失效
标题翻译：用于测试半导体集成电路的探头
公开(公告)号：US06294922B1
公开(公告)日：2001-09-25
申请号：US08773252
申请日：1996-12-23
申请人： Masao Okubo , Kazumasa Okubo , Hiroshi Iwata
发明人： Masao Okubo , Kazumasa Okubo , Hiroshi Iwata
IPC分类号： G01R3102
CPC分类号： G01R3/00 , G01R1/07357
摘要： A first assembly configuration features in including: a plurality of probes having a buckling portion to buckle, upon a contact by an end of a contact portion onto an electrode of semiconductor integrated circuit; a first board provided with a first wiring pattern connected with a connecting portion of the probe; a second board removably fastened with the first board and provided with a second wiring pattern connected with the first wiring pattern; housing members mounted with the second board for holding the contact portion of the probe. Next configuration features in including: two kinds of probes; measurement probes and connection probes anew, and a plurality of connection probes include buckling portions to buckle, upon a contact by an end of contact portion onto the wiring pattern provided with the first board when inserted into holes provided with the a second board; wherein through holes provided with the second board are positioned to align to the arrangement of wiring pattern provided with the first board. Thereby, undesirable deviation of contact point by the probe is avoided and a suitable contact pressure is preferably kept, and further convenience in the work of exchanging damaged probes is brought about.
摘要翻译：第一组装构造的特征在于包括：多个探针，其在接触部分的端部接触到半导体集成电路的电极上时具有弯曲部分以弯曲; 第一板，其设置有与所述探针的连接部分连接的第一布线图案; 第二板，其与所述第一板可移除地紧固并设置有与所述第一布线图形连接的第二布线图案; 安装有第二板的壳体构件用于保持探针的接触部分。下一个配置功能包括：两种探头; 重新测量探针和连接探针，并且当插入设置有第二板的孔中时，接触部分的端部与设置有第一板的布线图案接触时，多个连接探针包括弯曲部分以弯曲; 其中设置有第二板的通孔被定位成与设置有第一板的布线图案的布置对准。因此，避免了由探针引起的接触点的不期望的偏差，并且优选地保持适当的接触压力，并且进一步方便了更换损坏的探针的工作。

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