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    • 1. 发明授权
    • Test clip for five pitch IC
    • 精密间距IC测试夹
    • US5373230A
    • 1994-12-13
    • US4806
    • 1993-01-13
    • Marik BalyasnyMark S. Fisher
    • Marik BalyasnyMark S. Fisher
    • G01R1/04G01R31/00
    • G01R1/0425
    • A fine pitch test clip is provided, which assures accurate alignment of the test lead contacts with the IC (integrated circuit) device leads. The test clip includes a center for lying over the IC body and four arms (e.g. 41 in FIG. 4 ) pivotally mounted on the center, with each arm including a row of contacts (52) mounted in the arm housing. Lower portions of the contacts, which engage the IC device leads (30), are separated by barriers of the housing with endmost barriers (106, 108) being positioned so they can engage the endmost leads (30E) of the IC device to assure alignment of the lower contact portions with the IC device leads. A rigid board (204, FIG. 11) with connectors (211-214) thereon is mounted on the center of the test clip frame, above the arms, and flexible resilient circuit boards (231-234) each extend in a horizontal loop between the top of the contacts that lie at the top of an arm, to the rigid board where they are coupled to terminals of one of the connectors on the rigid board.
    • 提供了一个细间距测试夹,确保测试引线触点与IC(集成电路)器件引线的精确对准。 测试夹包括用于躺在IC体上的中心和枢转地安装在中心的四个臂(例如图4中的41),每个臂包括安装在臂壳体中的一排触点(52)。 接触IC器件引线(30)的下部通过壳体的屏障分开,最终的阻挡层(106,108)定位成使得它们能够接合IC器件的最末端引线(30E),以确保对准 与IC器件引线的下接触部分。 其上具有连接器(211-214)的刚性板(204,图11)安装在测试夹框架的中心,臂的上方,柔性弹性电路板(231-234)分别在 位于臂顶部的触点的顶部到刚性板,刚性板与刚性板上的一个连接器的端子连接。
    • 2. 发明授权
    • Fiber optic connector
    • 光纤连接器
    • US4799759A
    • 1989-01-24
    • US855401
    • 1986-06-26
    • Marik Balyasny
    • Marik Balyasny
    • G02B6/32G02B6/38
    • G02B6/3847G02B6/32G02B6/3834G02B6/3874G02B6/3833G02B6/3857
    • A contact for an optical fiber has a ferrule onto one end of which a tip is releasably fitted. The end wall of the tip includes an opening of predetermined diameter within which a bare fiber of only very slightly less diameter is to located. The optical fiber with bare fiber end portion is received through the opposite end of the ferrule and the bare fiber end is located within the tip opening spaced inwardly from the tip end wall. The contact is received within a hollow tubular terminus body and extends out one end thereof, the remainder being retained within the terminus body by a flange on the ferrule. Additional parts terminate the fiber strength member externally of the contact and a spring provides axial resiliency to the contact. The tip outer end surface may have a concavity for receiving a spherical lens and a lens holder secures the lens against the tip end.
    • 用于光纤的接触件具有套管,其一端可释放地装配。 尖端的端壁包括具有预定直径的开口,在该开口内仅定位直径非常小的裸露纤维。 具有裸光纤端部的光纤通过套管的相对端接收,裸光纤端部位于从顶端壁向内间隔开的顶端开口内。 接触件容纳在中空的管状端体内,并延伸出其一端,其余部分通过套圈上的凸缘保持在端体内。 附加部件将纤维强度部件终止于接触件的外部,并且弹簧向接触件提供轴向弹性。 尖端外端表面可以具有用于接收球面透镜的凹部,并且透镜支架将透镜固定在顶端。
    • 3. 发明授权
    • Optical fiber releasable connector backshell
    • 光纤可拆卸连接器后壳
    • US4743088A
    • 1988-05-10
    • US678873
    • 1984-12-06
    • Marik BalyasnyDouglas A. Parker
    • Marik BalyasnyDouglas A. Parker
    • G02B6/38G02B6/44G02B6/36
    • G02B6/3887G02B6/3823G02B6/3882G02B6/389G02B6/4439
    • The backshell construction is identical for use with either a plug or receptacle fiber optics connector part and includes a short mounting sleeve threaded onto the rear of the connector part with a central bore facing outwardly of the connector and a central axis aligned with the logitudinal axis of the connector part. A second mounting sleeve fits into the end of a clamp which is received on the optical fiber cable. One or more fiber optics from the cable extend between the first and second mounting sleeve means and through a cylindrical extension tube. A sufficient length of the optical fibers are coiled or loosely curved within the extension tube to provide the desired strain relief, as well as storage of a sufficient length for retermination, if needed.
    • 后壳结构与插头或插座光纤连接器部件一起使用是相同的,并且包括螺纹连接到连接器部分的后部上的短安装套筒,中心孔面向连接器的外侧,中心轴线与纵向轴线对准 连接器部分。 第二安装套管装配在接收在光纤电缆上的夹具的端部。 来自电缆的一个或多个光纤在第一和第二安装套筒装置之间延伸并且通过圆柱形延伸管。 如果需要,足够的长度的光纤被卷绕或松散地弯曲在延伸管内以提供期望的应变消除,以及存储足够的长度用于重新定位。
    • 5. 发明授权
    • Contact arrangement
    • 联系方式
    • US5942905A
    • 1999-08-24
    • US448234
    • 1995-05-23
    • Marik Balyasny
    • Marik Balyasny
    • G01R1/073G01R1/04G01R31/26G01R31/28G01R31/02
    • G01R31/2886G01R1/0425Y10S439/912
    • A connecting device is described for use in a test clip whose multiple contacts engage multiple leads of an IC (integrated circuit) device, which can be constructed reliably and at low cost. The test clip includes a flat flexible cable (54, FIG. 7) mounted on a clip housing, the cable having parallel conductors (50) mounted on insulation 53. Lower end portions of the conductors serve as lead-engaging contacts. Each conductor lower end portion extends in a substantially 180.degree. loop (62), with one side (70) of each loop being positioned to engage a corresponding lead of the IC device.
    • 描述了一种用于测试夹中的连接装置,该测试夹的多个触点接合可以可靠且低成本地构造的IC(集成电路)装置的多个引线。 测试夹包括安装在夹子壳体上的扁平柔性电缆(54,图7),该电缆具有安装在绝缘体53上的平行导体(50)。导体的下端部分用作引线接合触点。 每个导体下端部分在大致180度的环路(62)中延伸,每个环路的一侧(70)定位成与IC器件的相应导线接合。
    • 6. 发明授权
    • Test clip for IC device
    • IC器件测试夹
    • US5415560A
    • 1995-05-16
    • US169835
    • 1993-12-17
    • Marik Balyasny
    • Marik Balyasny
    • G01R1/04G01R31/02
    • G01R1/0425Y10S439/912
    • A test clip is provided for IC (integrated circuit) devices of the SOP (small outline package) type which effectively positions the clip on the IC device, which facilitates manufacture of test clips for IC devices of different lengths, and which simplifies connection to the contacts of the test clip. The test clip includes a base (44, FIG. 1) with a cavity at its bottom which closely receives the body of the IC device (18), and a pair of arms (46, 48) pivotally mounted on the base and carrying rows of contacts (42). The cavity has opposite side cavity walls (82, 84) that lie adjacent to the sides of the body of the IC device, and end cavity walls (100, FIG. 5) that lie in interference fit with the ends (30) of the body. A group of test clips for IC devices having different numbers of leads at their opposite sides, have identical arms but have bases (44, 44A, FIG. 7) with different size cavities (80, 80A). A pair of flexible flat cables each has a lower end (60b, FIG. 2) connected to the tops of the contacts and an upper end (60u) directly connected to a header (66) that is directly mounted to the top of the base.
    • 提供了一种用于将夹子有效地定位在IC器件上的SOP(小外形封装)类型的IC(集成电路)器件的测试夹,这有助于制造不同长度的IC器件的测试夹,并且简化了与 测试夹的接触。 测试夹具包括底座(44),其底部具有空腔,其紧密地容纳IC器件(18)的主体,以及一对臂(46,48),其枢转地安装在基座上并承载行 的触点(42)。 空腔具有邻近IC器件本体侧面的相对侧腔壁(82,84)以及位于与IC器件的端部(30)过盈配合的端部空腔壁(100,图5) 身体。 一组用于在其相对侧具有不同数量的引线的IC器件的测试夹具具有相同的臂,但具有具有不同尺寸空腔(80,80A)的底座(44,44A,图7)。 一对柔性扁平电缆各自具有连接到触头顶部的下端(图2)和直接连接到集管(66)的上端(60u),该头部直接安装在基座的顶部 。
    • 7. 发明授权
    • Test clip for surface mount device
    • 表贴装置测试夹
    • US4996476A
    • 1991-02-26
    • US432093
    • 1989-11-06
    • Marik BalyasnyKenneth B. Baldwin
    • Marik BalyasnyKenneth B. Baldwin
    • G01R1/04
    • G01R1/0425Y10S439/912
    • A test clip is provided which has multiple contacts that can engage the leads of a surface mount integrated circuit device whose leads are very closely spaced, while being reliably held down to the circuit device during a test procedure. The test clip has a housing with a recess (72, FIG. 10) that very closely recieves the top of the body of the circuit device (12) to align the clip with the circuit device, the clip being devoid of engagement with the lower part of the device. Instead, the test clip relies solely on frictional engagement of its contacts (24) with the circuit device leads (64) to hold down the test clip. Each contact has a first part (80) that initially lies against a contact-locating outer surface (82) of the housing. Each contact also has a second part (84) that extends below the contact-locating outer surface and that is positioned to be outwardly deflected slightly as it wipes across a circuit device lead, as the test clip is moved directly downwardly against the circuit device.
    • 提供了一种测试夹,其具有多个触点,其可以接合其引线非常紧密地间隔开的表面安装集成电路器件的引线,同时在测试过程中被可靠地保持在电路器件上。 测试夹具有具有凹部(72,图10)的壳体,其非常接近电路装置(12)的主体的顶部以将夹子与电路装置对准,夹子与下部 设备的一部分。 相反,测试夹只依靠其触点(24)与电路装置引线(64)的摩擦接合来按压测试夹。 每个触点具有最初位于壳体的接触定位外表面(82)上的第一部分(80)。 每个接触件还具有在接触定位外表面下方延伸的第二部分(84),并且当第二部分(84)被擦拭穿过电路装置引线时,第二部分(84)被定位成稍微向外偏转,因为测试夹直接向下移动抵靠电路装置。
    • 8. 发明授权
    • Test clip with standard interface
    • 测试夹具有标准接口
    • US5788524A
    • 1998-08-04
    • US681143
    • 1996-07-22
    • Marik BalyasnyRondal Keith Harmon, Jr.
    • Marik BalyasnyRondal Keith Harmon, Jr.
    • G01R1/04H01R11/22H01R13/629
    • H01R11/22G01R1/0425
    • A test clip is described with contacts (50) for engaging leads (26) of an IC (integrated circuit) device, wherein the contacts have lower lead-contacting parts (56) arranged in a single row (62) at a predetermined lead spacing S, and have header pins (60) lying in a header arrangement that allows connection to a standard instrument connector (40). Each contact has an intermediate portion (70) where the contact has a first offset part (72) extending in a longitudinal direction (L) by a distance S/2, and has a second lower offset part that extends partially in a lateral direction (M) by a lateral distance S. The upper first offset part extends horizontally, with 90.degree. angles (76, 78) at it opposite ends, so the contact can be installed by pressing on a shoulder (90) of the first offset part. The first offset part with 90.degree. angles is formed by initially stamping the contact from sheet metal to form a stamped part with such angles and such first offset part. The second, lower offset part extends at an angle (B) from the vertical of about 45.degree. so its opposite ends form angles of 45.degree., with the second offset part resulting from bending of the stamped contact. The contact intermediate portions (which contains the two offset parts) lie in a recess (104) at the top of the connector housing and are held in place by a header insert (106).
    • 使用用于接合IC(集成电路)装置的引线(26)的触点(50)来描述测试夹,其中触点具有以预定引线间隔排列成单列(62)的下引线接触部分(56) S,并且具有位于头部布置中的插头引脚(60),其允许连接到标准仪器连接器(40)。 每个触点具有中间部分(70),其中触点具有沿纵向方向(L)延伸距离S / 2的第一偏移部分(72),并且具有沿横向方向部分延伸的第二下偏移部分 M)横向距离S.上部第一偏移部分在其相对端处水平地延伸90度角(76,78),因此可以通过按压在第一偏移部分的肩部(90)上来安装接触。 90度角的第一偏移部分通过从金属板初始冲压接触形成具有这种角度的冲压部分和这样的第一偏移部分而形成。 第二下偏移部分以大约45°的垂直方向以一角度(B)延伸,使得其相对端形成45°的角度,而第二偏移部分由冲压接触件的弯曲产生。 接触中间部分(其包含两个偏移部分)位于连接器壳体的顶部处的凹部(104)中并且通过头部插入件(106)保持就位。
    • 9. 发明授权
    • Locking mechanism for IC test clip
    • IC测试夹的锁定机构
    • US5739697A
    • 1998-04-14
    • US557787
    • 1995-11-13
    • Marik BalyasnyGeorge Ray Hirvela
    • Marik BalyasnyGeorge Ray Hirvela
    • G01R1/04G01R31/02
    • G01R1/0425Y10S439/912
    • A mechanism is provided as part of a test clip for locking the clip to the body of an integrated circuit device, at the corner regions of the IC body. The mechanism includes locking fingers (62, FIG. 4 ) that are formed of metal spring wire, with each finger having an upper part (84) fixed to a base (22) that closely engages an upper portion of the IC body, a middle part (84) that extends at a downward-axially outward incline, and a lower finger end (66) that engages a lower portion of the IC body. When a shaft (72) is pushed down against the biasing of a spring (74), the shaft moves down an actuator (64) that has prongs (80) which press against the middle parts of the locking fingers to deflect them radially inwardly, so the finger lower ends slide radially inwardly along grooves (112) formed in the base, to engage the lower portion of the IC body.
    • 作为用于将夹子锁定到IC体的拐角区域处的集成电路装置的主体的测试夹具的一部分提供了机构。 该机构包括由金属弹簧线形成的锁定指状物(62,图4),每个指状物具有固定到与IC体的上部紧密接合的基部(22)的上部(84),中间 部分(84),其沿向下轴向向外倾斜延伸;以及下指端(66),其接合IC体的下部。 当轴(72)抵抗弹簧(74)的偏压被向下推动时,轴向下移动具有尖头(80)的致动器(64),该尖头(80)压靠在锁定指的中间部分以使其径向向内偏转, 因此手指下端沿着形成在基座中的凹槽(112)径向向内滑动,以接合IC体的下部。
    • 10. 发明授权
    • Flexible interface IC test clip
    • 灵活的接口IC测试夹
    • US5497104A
    • 1996-03-05
    • US305531
    • 1994-09-13
    • Marik Balyasny
    • Marik Balyasny
    • G01R1/073G01R1/04G01R31/26G01R31/28H01R23/72
    • G01R31/2886G01R1/0425Y10S439/912
    • A test clip is provided, of the type that has multiple contacts that engage the leads of an IC (integrated circuit) device with closely spaced leads, which can be constructed reliably and at low cost. The test clip includes a flat flexible cable (52, FIG. 5) mounted on the clip housing (30), the cable having parallel conductors mounted on an insulative layer. The lower ends (58) of the conductors serve as lead-engaging contacts, and have exposed inner surfaces that directly engage largely vertical parts (60) of the IC device leads. A stiffener (70) formed by a sheet of stiff but flexible material, is attached to the lower portion of the cable on its outer surface, the stiffener having a lower portion that biases the lower ends of the conductors towards the leads. A circuit board (40) is mounted on the clip housing to lie in a horizontal plane, and has contact pads (80) on its lower surface. The flexible cable is bent so its upper end extends horizontally and has exposed upper conductor ends (92) that connect to the pads on the lower surface of the circuit board, the pads being connected to contact elements (36) of connectors on the upper surface of the circuit board.
    • 提供了一种测试夹具,其具有接合具有紧密间隔的引线的IC(集成电路)器件的引线的多个触点,可以可靠且低成本地构造。 测试夹包括安装在夹子壳体(30)上的扁平柔性电缆(52,图5),该电缆具有安装在绝缘层上的平行导体。 导体的下端(58)用作引线接合触头,并且具有暴露的内表面,其直接接合IC器件引线的大部分竖直部分(60)。 由刚性但柔性材料的片形成的加强件(70)在其外表面上附接到电缆的下部,加强件具有将导体的下端朝向引线偏压的下部。 电路板(40)安装在夹子壳体上以位于水平面中,并且在其下表面上具有接触垫(80)。 柔性电缆被弯曲,使得其上端水平延伸并且具有连接到电路板的下表面上的焊盘的暴露的上导体端(92),焊盘连接到上表面上的连接器的接触元件(36) 的电路板。