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1. 发明授权

US5739697A Locking mechanism for IC test clip 失效
标题翻译： IC测试夹的锁定机构
公开(公告)号：US5739697A
公开(公告)日：1998-04-14
申请号：US557787
申请日：1995-11-13
申请人： Marik Balyasny , George Ray Hirvela
发明人： Marik Balyasny , George Ray Hirvela
IPC分类号： G01R1/04 , G01R31/02
CPC分类号： G01R1/0425 , Y10S439/912
摘要： A mechanism is provided as part of a test clip for locking the clip to the body of an integrated circuit device, at the corner regions of the IC body. The mechanism includes locking fingers (62, FIG. 4 ) that are formed of metal spring wire, with each finger having an upper part (84) fixed to a base (22) that closely engages an upper portion of the IC body, a middle part (84) that extends at a downward-axially outward incline, and a lower finger end (66) that engages a lower portion of the IC body. When a shaft (72) is pushed down against the biasing of a spring (74), the shaft moves down an actuator (64) that has prongs (80) which press against the middle parts of the locking fingers to deflect them radially inwardly, so the finger lower ends slide radially inwardly along grooves (112) formed in the base, to engage the lower portion of the IC body.
摘要翻译：作为用于将夹子锁定到IC体的拐角区域处的集成电路装置的主体的测试夹具的一部分提供了机构。该机构包括由金属弹簧线形成的锁定指状物（62，图4），每个指状物具有固定到与IC体的上部紧密接合的基部（22）的上部（84），中间部分（84），其沿向下轴向向外倾斜延伸;以及下指端（66），其接合IC体的下部。当轴（72）抵抗弹簧（74）的偏压被向下推动时，轴向下移动具有尖头（80）的致动器（64），该尖头（80）压靠在锁定指的中间部分以使其径向向内偏转，因此手指下端沿着形成在基座中的凹槽（112）径向向内滑动，以接合IC体的下部。

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