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    • 1. 发明授权
    • Method of making an EEPROM cell with separate erasing and programming
regions
    • 制造具有单独擦除和编程区域的EEPROM单元的方法
    • US5523249A
    • 1996-06-04
    • US364529
    • 1994-12-23
    • Manzur GillDavid J. McElroySung-Wei LinInn K. Lee
    • Manzur GillDavid J. McElroySung-Wei LinInn K. Lee
    • H01L21/8247
    • H01L27/11521
    • An electrically-erasable, electrically-programmable, read-only-memory cell array is formed in pairs at a face of a semiconductor substrate (22). Each memory cell includes a source region (11) and a drain region (12), with a corresponding channel region between. A Fowler-Nordheim tunnel-window (13a) is located over the source line (17) connected to source (11). A floating gate (13) includes a tunnel-window section. A control gate (14) is disposed over the floating gate (13), insulated by an intervening inter-level dielectric (27). The floating gate (13) and the control gate (14) include a channel section (Ch). The channel section (Ch) is used as a self-alignment implant mask for the source (11) and drain (12) regions, such that the channel-junction edges are aligned with the corresponding edges of the channel section (Ch). The memory cell is programmed by hot-carrier injection from the channel to the floating gate (13), and erased by Fowler-Nordheim tunneling from the floating gate (13) through the tunnel window (13a) to the source-line (17 ). The program and erase regions of the cells are physically separate from each other, and the characteristics, including the oxides, of each of those regions may be made optimum independently from each other.
    • 在半导体衬底(22)的表面上成对地形成电可擦除的电可编程的只读存储单元阵列。 每个存储单元包括源极区域(11)和漏极区域(12),其间具有相应的沟道区域。 福勒 - 诺德海姆隧道窗口(13a)位于连接到源(11)的源极线(17)上。 浮动门(13)包括隧道窗部分。 控制栅极(14)设置在浮置栅极(13)上,由中间层间电介质(27)绝缘。 浮动栅极(13)和控制栅极(14)包括通道部分(Ch)。 通道部分(Ch)用作源(11)和漏极(12)区域的自对准注入掩模,使得沟道结边缘与通道部分(Ch)的相应边缘对齐。 存储单元通过从通道的热载流子注入到浮动栅极(13)进行编程,并由Fowler-Nordheim从浮动栅极(13)通过隧道窗口(13a)到源极线(17)的隧道擦除, 。 单元的程序和擦除区域在物理上彼此分离,并且这些区域中的每一个的特性,包括氧化物可以彼此独立地最优化。
    • 2. 发明授权
    • Electrically-erasable, electrically-programmable read-only memory cell,
an array of such cells and methods for making and using the same
    • 电可擦除的电可编程只读存储器单元,这样的单元阵列以及制造和使用它们的方法
    • US5218568A
    • 1993-06-08
    • US809462
    • 1991-12-17
    • Sung-Wei LinManzur GillInn K. Lee
    • Sung-Wei LinManzur GillInn K. Lee
    • G11C16/04H01L21/8247H01L27/115
    • H01L27/11521G11C16/0433H01L27/115H01L27/11524
    • An electrically-erasable, electrically-programmable read-only memory cell 10 is formed at a face of a layer of semiconductor 30 of a first conductivity type. A first source/drain region 16 and a second source/drain region 20 are formed in the face of layer of semiconductor 30 of a second conductivity type opposite the first conductivity type and spaced by a first channel area 50. A third source/drain region 18 is formed in the face of semiconductor layer 30 of the second conductivity type spaced from second source/drain region 20 by a second channel area 52. A thick insulator region 44 is formed adjacent at least a portion of second source/drain region 20 and includes a lateral margin of sloped thickness overlying a corresponding lateral margin of second source/drain region 20. The corresponding lateral margin of second source/drain region 20 has a graded dopant concentration directly proportionate with the sloped thickness of the overlying lateral margin of thick insulator region 44. A differentially grown insulator region 54 overlies second source/drain region 20 and includes a lateral margin of sloped thickness. A thin insulator tunneling window 62 overlies an area 60 of second source/drain region 20, tunneling window 62 formed between and spacing the lateral margin of the thick insulator region 44 and the lateral margin of differentially grown insulator region 54. A floating gate conductor 26 is disposed adjacent tunneling window 62 and insulatively adjacent second channel area 52. A control gate conductor 28 is disposed insulatively adjacent floating gate conductor 28. A gate conductor 24 is disposed insulatively adjacent first channel area 50.
    • 电可擦除的电可编程只读存储单元10形成在第一导电类型的半导体层30的表面。 第一源极/漏极区域16和第二源极/漏极区域20形成在与第一导电类型相反并且由第一沟道区域50间隔开的第二导电类型的半导体层30的表面中。第三源极/漏极区域 18形成在第二导电类型的半导体层30的表面上,第二导电类型的第二导电类型与第二源极/漏极区域20间隔开第二沟道区域52.邻近第二源极/漏极区域20的至少一部分形成厚的绝缘体区域44, 包括覆盖第二源极/漏极区域20的相应横向边缘的倾斜厚度的横向边缘。第二源极/漏极区域20的对应横向边缘具有与厚度绝缘体的上覆侧边缘的倾斜厚度成正比的渐变掺杂剂浓度 差分生长的绝缘体区域54覆盖第二源极/漏极区域20并且包括倾斜厚度的侧向边缘。 薄的绝缘体隧道窗口62覆盖在第二源极/漏极区域20的区域60之间,形成在厚绝缘体区域44的侧边缘之间并且间隔着厚的绝缘体区域44的侧边缘和差分生长的绝缘体区域54的横向边缘之间的隧道窗口62.浮动栅极导体26 被布置在相邻的隧道窗口62和绝对相邻的第二通道区域52处。控制栅极导体28被隔离地邻近浮置栅极导体28设置。栅极导体24与第一沟道区域50绝缘地邻近设置。
    • 8. 发明授权
    • Method of making EEPROM array with buried N+ windows and with separate
erasing and programming regions
    • 制造具有埋入式N +窗口并具有单独擦除和编程区域的EEPROM阵列的方法
    • US5371031A
    • 1994-12-06
    • US89206
    • 1993-07-09
    • Manzur GillInn K. Lee
    • Manzur GillInn K. Lee
    • H01L21/8247H01L21/70
    • H01L27/11521
    • An electrically-erasable, electrically-programmable, read-only-memory cell array is formed in pairs at a face of a semiconductor substrate (22). Each memory cell includes a source region (11) and a drain region (12), with a corresponding channel region between. A Fowler-Nordheim tunnel-window (13a) is located over the source line (17) connected to source (11). The source line (17) consists of alternating buried N+ windows (17a) and source regions (11). A floating gate (13) includes a tunnel-window section. A control gate (14) is disposed over the floating gate (13), insulated by an intervening inter-level dielectric (27). The floating gate (13) and the control gate (14) include a channel section (Ch). The channel section (Ch) is used as a self-alignment implant mask for the source (11) and drain (12) regions, such that the channel-junction edges are aligned with the corresponding edges of the channel section (Ch). The memory cell is programmed by hot-carrier injection from the channel to the floating gate (13), and erased by Fowler-Nordheim tunneling from the floating gate (13) through the tunnel window (13a) to the source-line (17). The program and erase regions of the cells are physically separate from each other, and the characteristics, including the oxides, of each of those regions may be made optimum independently from each other.
    • 在半导体衬底(22)的表面上成对地形成电可擦除的电可编程的只读存储单元阵列。 每个存储单元包括源极区域(11)和漏极区域(12),其间具有相应的沟道区域。 福勒 - 诺德海姆隧道窗口(13a)位于连接到源(11)的源极线(17)上。 源极线(17)由交替的掩埋N +窗口(17a)和源极区域(11)组成。 浮动门(13)包括隧道窗部分。 控制栅极(14)设置在浮置栅极(13)上,由中间层间电介质(27)绝缘。 浮动栅极(13)和控制栅极(14)包括通道部分(Ch)。 通道部分(Ch)用作源(11)和漏极(12)区域的自对准注入掩模,使得沟道结边缘与通道部分(Ch)的相应边缘对齐。 存储单元通过从通道的热载流子注入到浮动栅极(13)进行编程,并由Fowler-Nordheim从浮动栅极(13)通过隧道窗口(13a)到源极线(17)的隧道擦除, 。 单元的程序和擦除区域在物理上彼此分离,并且这些区域中的每一个的特性,包括氧化物可以彼此独立地最优化。
    • 9. 发明授权
    • Method for programming EEPROM memory arrays
    • EEPROM存储器阵列编程方法
    • US5187683A
    • 1993-02-16
    • US576307
    • 1990-08-31
    • Manzur GillSung-Wei LinSebastiano D'Arrigo
    • Manzur GillSung-Wei LinSebastiano D'Arrigo
    • G11C17/00G11C16/02G11C16/08G11C16/10H01L21/8247H01L27/115
    • G11C16/08G11C16/10
    • A method is described for programming a semiconductor array of EEPROM cells. A selected cell is connected, by definition, to a selected source-column line, a selected drain-column line and a selected wordline. Each deselected memory cell in the array is connected to a deselected source-column line, a deselected drain-column line and/or a deselected wordline. The method includes preselecting first, second, third, fourth and fifth programming voltages such that the second programming voltage is more positive than the first programming voltage and such that the third, fourth and fifth programming voltages are intermediate between the first and second programming voltages. The first programming voltage is applied at least to a selected column line and to each of the same-type deselected column lines. The third programming voltage is applied to the selected wordline and the fourth programming voltage is applied to each deselected wordline. After a pre-charge time interval, the fifth programming voltage is applied to each same-type deselected column line and, after an optional additional pre-charge time interval, the second programming voltage is applied to the selected wordline. After a program time interval, the third programming voltage is applied to the selected wordline and, after an optional discharge time interval, the first programming voltage is applied to each same-type deselected column line. Each deselected wordline is maintained at the fourth programming voltage for an additional discharge time interval. The third, fourth and fifth programming voltages may have the same value.
    • 描述了一种用于编程EEPROM单元的半导体阵列的方法。 根据定义,所选择的单元格连接到所选择的源列行,所选的排列列线和所选择的字线。 阵列中的每个取消选择的存储单元连接到未选择的源 - 列线,取消选择的漏 - 列线和/或未选择的字线。 该方法包括预选第一,第二,第三,第四和第五编程电压,使得第二编程电压比第一编程电压更正,并且使得第三,第四和第五编程电压在第一和第二编程电压之间。 至少将第一编程电压施加到所选择的列线和每个相同类型的未选择的列线。 将第三编程电压施加到所选择的字线,并且将第四编程电压施加到每个取消选择的字线。 在预充电时间间隔之后,将第五编程电压施加到每个相同类型的未选择的列线,并且在可选的附加预充电时间间隔之后,将第二编程电压施加到所选择的字线。 在编程时间间隔之后,将第三编程电压施加到所选择的字线,并且在可选的放电时间间隔之后,将第一编程电压施加到每个相同类型的未选择的列线。 每个取消选择的字线保持在第四个编程电压下一个额外的放电时间间隔。 第三,第四和第五编程电压可以具有相同的值。
    • 10. 发明授权
    • Electrically programmable, electrically erasable memory array cell with
field plate
    • 电可编程,电可擦除存储阵列单元与现场板
    • US5168335A
    • 1992-12-01
    • US741975
    • 1991-08-06
    • Iano D'ArrigoManzur GillSung-Wei Lin
    • Iano D'ArrigoManzur GillSung-Wei Lin
    • H01L21/8247H01L29/788
    • H01L27/11517H01L29/7883
    • A pair of electrically erasable, electrically programmable memory cells are formed at a face of a semiconductor layer (10) and include respective source regions (30a, 30b), a shared drain region (28) and respective channel regions (38a, 38b). Each cell has a floating gate conductor (46a, 46b) that controls the conductance of a respective subchannel region (74a, 74b) and may be programmed through Fowler-Nordheim electron tunneling through a respective tunnel oxide window (40a, 40b) from a respective source region (30a, 30b). A field plate conductor (40a) controls the conductance of respective subchannel regions (70a, 70b) within each channel region (38a, 38b). A word line or control gate conductor (62) is insulatively disposed adjacent respective third, remaining channel subregions (53a, 53b) and further is disposed insulatively adjacent the floating gates (46a, 46b) to program or erase them.
    • 在半导体层(10)的表面上形成一对电可擦除的电可编程存储单元,并且包括各自的源极区(30a,30b),共用漏极区(28)和各个沟道区(38a,38b)。 每个单元具有控制相应子通道区域(74a,74b)的电导的浮栅导体(46a,46b),并且可以通过Fowler-Nordheim电子隧穿通过相应的隧道氧化物窗(40a,40b)从相应的 源区域(30a,30b)。 场板导体(40a)控制每个通道区域(38a,38b)内各个子通道区域(70a,70b)的电导。 字线或控制栅极导体(62)被绝对地设置在相邻的第三剩余通道子区域(53a,53b)附近,并且还与浮动栅极(46a,46b)绝缘地设置以编程或擦除它们。