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    • 1. 发明授权
    • Frequency multiplexed architecture
    • 频率多路复用架构
    • US07583650B2
    • 2009-09-01
    • US10558726
    • 2004-05-26
    • Manel Collados AsensioGerben Willem De Jong
    • Manel Collados AsensioGerben Willem De Jong
    • H04W20/67
    • H04B1/006H04B1/005H04B1/406
    • A receiver (10) is arranged to simultaneously receive at least a first (S1) radio frequency signal having a first frequency band (1) and a second radio frequency signal (S3) having a second frequency band (3) that is at least partly overlapping the first frequency band (1). The receiver has frequency down-conversion means (32,33) for frequency down converting the at least first (S1) and second radio frequency signals (S3) to at least a first (S2) and a second (S4) lower frequency signal and multiplexing means (34) for sequentially multiplexing the at least first (S2) and second lower frequency signals (S4) into a frequency multiplexed signal (S5).
    • 接收器(10)被布置成同时接收具有第一频带(1)的第一(S1)射频信号和具有至少部分地具有第二频带(3)的第二射频信号(S3) 与第一频带(1)重叠。 接收机具有频率下变频装置(32,33),用于将至少第一(S1)和第二射频信号(S3)降频转换成至少第一(S2)和第二(S4)较低频率信号,以及 用于将所述至少第一(S2)和第二低频信号(S4)顺序多路复用为频率复用信号(S5)的多路复用装置(34)。
    • 3. 发明申请
    • CIRCUIT WITH REFERENCE SOURCE TO CONTROL THE SMALL SIGNAL TRANSCONDUCTANCE OF AN AMPLIFIER TRANSISTOR
    • 具有参考源的电路,用于控制放大器晶体管的小信号超导
    • US20120154050A1
    • 2012-06-21
    • US13391600
    • 2009-08-19
    • Gerben Willem De Jong
    • Gerben Willem De Jong
    • H03F3/45
    • H03F1/30H03F3/45475H03F2200/447H03F2200/453H03F2200/456H03F2203/45101H03F2203/45138
    • A circuit has a reference source (12) for supplying a bias signal to set a small signal transconductance of an amplifier transistor in an amplifier (10) to a predetermined value. The reference source has at least one reference transistor (120a-b, 30). A feedback circuit (128, 129, 38) has an input coupled to the main current channel of the reference transistor or reference transistors (120a-b, 30) and an output coupled to the control electrode of the reference transistor or reference transistors (120a-b, 30). The feedback circuit controls a control voltage at the control electrode, so as to equalize an offset current and a difference between main currents flowing through the current channel of the reference transistor or reference transistors (120a-b, 30), obtained with and without a small voltage offset added to the control voltage. The main currents flowing with and without a small voltage offset may be obtained by using a first and second reference transistor (122a,b), matching each other and an offset voltage source (126) coupled between the control electrodes of the first and second reference transistor (122a,b), to apply the small voltage offset between their control electrodes.
    • 电路具有用于提供偏置信号以将放大器(10)中的放大器晶体管的小信号跨导设置为预定值的参考源(12)。 参考源具有至少一个参考晶体管(120a-b,30)。 反馈电路(128,129,38)具有耦合到参考晶体管或参考晶体管(120a-b,30)的主电流通道的输入端和耦合到参考晶体管或参考晶体管(120a)的控制电极的输出 -b,30)。 反馈电路控制控制电极处的控制电压,以便使偏移电流和流过参考晶体管或参考晶体管(120a-b,30)的电流通道的主电流之间的差值相等 小电压偏移加到控制电压上。 可以通过使用彼此匹配的第一和第二参考晶体管(122a,b)和耦合在第一和第二参考的控制电极之间的偏移电压源(126)来获得流动有和没有小的电压偏移的主电流 晶体管(122a,b),以在其控制电极之间施加小电压偏移。
    • 4. 发明授权
    • Current mirror circuit with interconnected control electrodies coupled to a bias voltage source
    • 具有互连控制电极的电流镜电路耦合到偏置电压源
    • US06747330B2
    • 2004-06-08
    • US10111547
    • 2002-04-24
    • Johannes Otto VoormanGerben Willem De JongRachid El Waffaoui
    • Johannes Otto VoormanGerben Willem De JongRachid El Waffaoui
    • H01L2714
    • G05F3/265G05F3/267
    • A current mirror circuit is described which includes a current input terminal (14A), a current output terminal (14B) and a common terminal (14C). A first controllable semiconductor element (T1) is arranged between the current input terminal (14A) and the common terminal (14C). A second controllable semiconductor element (T2) is arranged between the current output terminal (14B) and the common terminal (14C). The controllable semiconductor elements (T1, T2) have interconnected control electrodes (T1A, T2A) which are also coupled to a bias voltage source (VBIAS), for biasing said control electrodes at a reference voltage. The circuit further includes a transconductance stage (12) with an input (12A) coupled to the current input terminal (14A) and an output (12B) coupled to the common terminal (14C). The control electrodes (T1A, T2A) are coupled to the common terminal (14C) via a third controllable semiconductor element (T3). The bias voltage source (VBIAS) is coupled to the control electrodes of the first and the second controllable semiconductor element (T1, T2) via a control electrode (T3A) of the third controllable semiconductor element (T3). The current mirror circuit has high bandwidth also at low input currents and is very suitable for application in an arrangement for reproducing an optical record carrier.
    • 描述了电流镜电路,其包括电流输入端子(14A),电流输出端子(14B)和公共端子(14C)。 第一可控半导体元件(T1)布​​置在电流输入端子(14A)和公共端子(14C)之间。 第二可控半​​导体元件(T2)布置在电流输出端子(14B)和公共端子(14C)之间。 可控半导体元件(T1,T2)具有互连的控制电极(T1A,T2A),其也耦合到偏置电压源(VBIAS),用于以参考电压偏置所述控制电极。 电路还包括具有耦合到电流输入端子(14A)的输入端(12A)和耦合到公共端子(14C)的输出端(12B)的跨导级(12)。 控制电极(T1A,T2A)经由第三可控半导体元件(T3)耦合到公共端子(14C)。 偏置电压源(VBIAS)经由第三可控半导体元件(T3)的控制电极(T3A)耦合到第一和第二可控半​​导体元件(T1,T2)的控制电极。 电流镜电路在低输入电流下也具有高带宽,并且非常适合于用于再现光学记录载体的布置。
    • 7. 发明申请
    • CALIBRATION OF LINEAR TIME-INVARIANT SYSTEM'S STEP RESPONSE
    • 线性时间不确定系统的步骤响应的校准
    • US20110043267A1
    • 2011-02-24
    • US12989909
    • 2009-04-30
    • Dennis JeurissenGerben Willem De JongJan Van Sinderen
    • Dennis JeurissenGerben Willem De JongJan Van Sinderen
    • H03F1/34G01R27/28
    • G01R31/2837
    • The invention concerns in general measurement of the transfer function of linear time invariant systems, more particular the calibration of such systems based on a measured transfer function. According to a first aspect the present invention an arrangement for measuring the transfer function of a linear time-invariant system is disclosed. According to a second aspect of the present invention the arrangement is implemented into a linear time-invariant circuitry having a transfer function representing the amplitude and phase characteristic of the circuitry, where by means of the arrangement for measuring the transfer function the transfer function can be optimized in accordance with certain criteria on-the-fly, i.e. in or before operation of the circuit. Finally, an effective and simple method for measuring of the transfer function of a linear time-invariant system together with the use or application of the method is shown.
    • 本发明涉及线性时间不变系统的传递函数的一般测量,更具体地,基于测量的传递函数来校准这样的系统。 根据第一方面,本发明公开了一种用于测量线性时不变系统的传递函数的装置。 根据本发明的第二方面,该布置被实现为具有表示电路的幅度和相位特性的传递函数的线性时不变电路,其中通过用于测量传递函数的布置,传递函数可以是 根据某些标准进行优化,即在电路运行期间或之前进行。 最后,显示了一种用于测量线性时不变系统的传递函数以及该方法的使用或应用的有效和简单的方法。
    • 10. 发明授权
    • Calibration of linear time-invariant system's step response
    • 线性时变不变系统阶跃响应的校准
    • US08686779B2
    • 2014-04-01
    • US12989909
    • 2009-04-30
    • Dennis JeurissenGerben Willem De JongJan Van Sinderen
    • Dennis JeurissenGerben Willem De JongJan Van Sinderen
    • H03L5/00
    • G01R31/2837
    • The invention concerns in general measurement of the transfer function of linear time invariant systems, more particular the calibration of such systems based on a measured transfer function. According to a first aspect the present invention an arrangement for measuring the transfer function of a linear time-invariant system is disclosed. According to a second aspect of the present invention the arrangement is implemented into a linear time-invariant circuitry having a transfer function representing the amplitude and phase characteristic of the circuitry, where by means of the arrangement for measuring the transfer function the transfer function can be optimized in accordance with certain criteria on-the-fly, i.e. in or before operation of the circuit. Finally, an effective and simple method for measuring of the transfer function of a linear time-invariant system together with the use or application of the method is shown.
    • 本发明涉及线性时间不变系统的传递函数的一般测量,更具体地,基于测量的传递函数来校准这样的系统。 根据第一方面,本发明公开了一种用于测量线性时不变系统的传递函数的装置。 根据本发明的第二方面,该布置被实现为具有表示电路的幅度和相位特性的传递函数的线性时不变电路,其中通过用于测量传递函数的布置,传递函数可以是 根据某些标准进行优化,即在电路运行期间或之前进行。 最后,显示了一种用于测量线性时不变系统的传递函数以及该方法的使用或应用的有效和简单的方法。