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1. 发明申请

US20130002274A1 AGING DEGRADATION DIAGNOSIS CIRCUIT AND AGING DEGRADATION DIAGNOSIS METHOD FOR SEMICONDUCTOR INTEGRATED CIRCUIT 审中-公开
标题翻译：老化衰减诊断电路和老化衰减诊断方法半导体集成电路
公开(公告)号：US20130002274A1
公开(公告)日：2013-01-03
申请号：US13634188
申请日：2011-03-11
申请人： Eisuke Saneyoshi , Koichi Nose
发明人： Eisuke Saneyoshi , Koichi Nose
IPC分类号： G01R31/26
CPC分类号： G01R31/2856 , G01R31/2849 , G01R31/31725 , H03K5/133
摘要： Provided is an aging degradation diagnosis circuit, including: a first delay circuit including a gate array for allowing aging degradation to progress, the first delay circuit being configured to delay an input signal and output a first output signal; a second delay circuit including a gate array having the same number of stages as the first delay circuit, the second delay circuit being configured to delay an input signal and output a second output signal; and an arbitrary delay unit, which is capable of varying a delay period in the second delay circuit by a predetermined amount. A delay comparison unit outputs comparison information obtained by relatively comparing delays between the first output signal and the second output signal. An adjustment unit uses the comparison information, to thereby readjust the delay period in the second delay circuit.
摘要翻译：提供一种老化劣化诊断电路，包括：第一延迟电路，包括用于允许老化劣化进行的门阵列，第一延迟电路被配置为延迟输入信号并输出第一输出信号; 第二延迟电路，包括具有与第一延迟电路相同数量级的门阵列，第二延迟电路被配置为延迟输入信号并输出第二输出信号; 以及任意延迟单元，其能够将第二延迟电路中的延迟周期改变预定量。延迟比较单元输出通过相对比较第一输出信号和第二输出信号之间的延迟而获得的比较信息。调整单元使用比较信息，从而重新调整第二延迟电路中的延迟周期。

2. 发明申请

US20080165355A1 High-Resolution High-Speed Terahertz Spectrometer 失效
标题翻译：高分辨率高速太赫兹光谱仪
公开(公告)号：US20080165355A1
公开(公告)日：2008-07-10
申请号：US11885335
申请日：2005-08-30
申请人： Takeshi Yasui , Tsutomu Araki , Eisuke Saneyoshi
发明人： Takeshi Yasui , Tsutomu Araki , Eisuke Saneyoshi
IPC分类号： G01J3/433
CPC分类号： G01N21/3586
摘要： A high-resolution high-speed terahertz spectrometry for measuring a terahertz frequency spectrum at high speed with a laser mode-locking frequency which is the theoretical limitation frequency resolution of the terahertz time-domain spectroscopy. The mode-locking frequencies of two femtosecond laser light sources are controlled so that they are stabilized at high degree and the difference between the mode-locking frequencies is constant. The output of the laser light sources are used as a pumping light for generating terahertz pulses and a probe pulse light for terahertz detection. Since the time delay timings of the terahertz pulses and the probe pulse light the pulse periods of which are slightly different from each other shift from each other and the difference increases. Therefore, the temporally expanded terahertz pulses are measured by high-speed sampling without using any mechanical stage for time delay scanning. Part of the laser beams are extracted and time origin signals are generated by trigger signal generating means and used as trigger signals. Consequently the influence of the timing jitter can be eliminated. The terahertz electric field time waveform measured by high-speed sampling with the measurement time window of the pulse period is subjected to time-scale conversion and Fourier transform. Therefore, a terahertz frequency spectrum can be measured with high resolution of the theoretical limitation frequency resolution (=mode-locking frequency) and at high speed.
摘要翻译：高分辨率高速太赫兹光谱法，用于以激光锁模频率高速测量太赫兹频谱，这是太赫兹时域光谱的理论极限频率分辨率。控制两个飞秒激光的模式锁定频率，使其稳定在高度，并且模式锁定频率之间的差异是恒定的。激光源的输出用作产生太赫兹脉冲的泵浦光和用于太赫兹检测的探针脉冲光。由于太赫兹脉冲和探针脉冲的时间延迟定时彼此稍微不同的脉冲周期彼此偏移并且差异增大。因此，通过高速采样来测量时间上扩展的太赫兹脉冲，而不用任何用于时间延迟扫描的机械级。部分激光束被提取，时间原点信号由触发信号发生装置产生并用作触发信号。因此，可以消除定时抖动的影响。用脉冲周期测量时间窗高速采样测得的太赫兹电场时间波形进行时标转换和傅里叶变换。因此，可以以理论限制频率分辨率（=锁模频率）的高分辨率和高速度测量太赫兹频谱。

3. 发明授权

US08674774B2 Aging diagnostic device, aging diagnostic method 失效
标题翻译：老化诊断仪，老化诊断方法
公开(公告)号：US08674774B2
公开(公告)日：2014-03-18
申请号：US13394542
申请日：2010-09-01
申请人： Eisuke Saneyoshi , Koichi Nose , Masayuki Mizuno
发明人： Eisuke Saneyoshi , Koichi Nose , Masayuki Mizuno
IPC分类号： H03L7/24 , G01R31/28
CPC分类号： G01R31/2856 , G01R31/2882 , G01R31/2884 , H03K5/133
摘要： There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
摘要翻译：提供了一种老化诊断装置，包括：构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器（101）使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器（102）; 负载单元（104），其向所述测试环形振荡器（102）输入负载信号; 控制单元（105），其同时将参考环形振荡器（101）和测试环形振荡器（102）的振荡开始的控制信号输入到参考环形振荡器（101）和测试环形振荡器（102）; 以及比较单元（103），其分别同时比较参考环形振荡器（101）和测试环形振荡器（102）中的脉冲的移动量的差异。

4. 发明申请

US20120161885A1 AGING DIAGNOSTIC DEVICE, AGING DIAGNOSTIC METHOD 失效
标题翻译：老化诊断装置，老化诊断方法
公开(公告)号：US20120161885A1
公开(公告)日：2012-06-28
申请号：US13394542
申请日：2010-09-01
申请人： Eisuke Saneyoshi , Koichi Nose , Masayuki Mizuno
发明人： Eisuke Saneyoshi , Koichi Nose , Masayuki Mizuno
IPC分类号： H03L7/24
CPC分类号： G01R31/2856 , G01R31/2882 , G01R31/2884 , H03K5/133
摘要： There is provided an aging diagnostic device including: a reference ring oscillator (101) that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator (102) that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit (104) that inputs a load signal to the test ring oscillator (102); a control unit (105) that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator (101) and the test ring oscillator (102) to the reference ring oscillator (101) and the test ring oscillator (102); and a comparison unit (103) that compares differences in the amount of movement of pulses within the reference ring oscillator (101) and the test ring oscillator (102), respectively, in the same time.
摘要翻译：提供了一种老化诊断装置，包括：构成使用CMOS电路构成的奇数多个逻辑门的环形振荡器的参考环形振荡器（101）使用具有与逻辑门相同配置的奇数多个逻辑门构成环形振荡器的测试环振荡器（102）; 负载单元（104），其向所述测试环形振荡器（102）输入负载信号; 控制单元（105），其同时将参考环形振荡器（101）和测试环形振荡器（102）的振荡开始的控制信号输入到参考环形振荡器（101）和测试环形振荡器（102）; 以及比较单元（103），其分别同时比较参考环形振荡器（101）和测试环形振荡器（102）中的脉冲的移动量的差异。

5. 发明申请

US20140218060A1 DEGRADATION DIAGNOSING CIRCUIT AND DEGRADATION DIAGNOSING METHOD 审中-公开
标题翻译：降解诊断电路和降解诊断方法
公开(公告)号：US20140218060A1
公开(公告)日：2014-08-07
申请号：US14240024
申请日：2012-08-15
申请人： Eisuke Saneyoshi
发明人： Eisuke Saneyoshi
IPC分类号： G01R31/28
CPC分类号： G01R31/3187 , G01R31/30
摘要： In order to measure a state of degradation of a semiconductor integrated circuit more correctly by use of a simple configuration, a degradation diagnosing circuit includes: a test block including a first circuit which is an object of a degradation diagnosis; a reference block including a second circuit which has a configuration identical with a configuration of the first circuit; a judgment unit that judges whether a component of the test block is degraded or not by comparing a characteristic of a first signal outputted from the test block, and a characteristic of a second signal outputted from the reference block, in the case in which a signal indicating a measurement mode is inputted; and a control unit that outputs the signal which indicates the measurement mode to the judgment unit.
摘要翻译：为了通过简单的配置更正确地测量半导体集成电路的劣化状态，劣化诊断电路包括：测试块，包括作为劣化诊断对象的第一电路; 参考块，包括具有与第一电路的配置相同的配置的第二电路; 判断单元，通过比较从测试块输出的第一信号的特性和从参考块输出的第二信号的特性来判断测试块的分量是否劣化，在信号指示测量模式被输入; 以及控制单元，其向所述判断单元输出指示所述测量模式的信号。

6. 发明授权

US07605371B2 High-resolution high-speed terahertz spectrometer 失效
标题翻译：高分辨率高速太赫兹光谱仪
公开(公告)号：US07605371B2
公开(公告)日：2009-10-20
申请号：US11885335
申请日：2005-08-30
申请人： Takeshi Yasui , Tsutomu Araki , Eisuke Saneyoshi
发明人： Takeshi Yasui , Tsutomu Araki , Eisuke Saneyoshi
IPC分类号： G01J3/02
CPC分类号： G01N21/3586
摘要： The mode-locking frequencies of two femtosecond laser light sources are controlled so that they are stabilized at high degree and the difference between the mode-locking frequencies is constant. The output of the laser light sources are used as a pumping light for generating terahertz pulses and a probe pulse light for terahertz detection. Since the time delay timings of the terahertz pulses and the probe pulse light the pulse periods of which are slightly different from each other shift from each other and the difference increases. Therefore, the temporally expanded terahertz pulses are measured by high-speed sampling without using any mechanical stage for time delay scanning. The terahertz electric field time waveform measured by high-speed sampling with the measurement time window of the pulse period is subjected to time-scale conversion and Fourier transform.
摘要翻译：控制两个飞秒激光的模式锁定频率，使其稳定在高度，并且模式锁定频率之间的差异是恒定的。激光源的输出用作产生太赫兹脉冲的泵浦光和用于太赫兹检测的探针脉冲光。由于太赫兹脉冲和探针脉冲的时间延迟定时彼此稍微不同的脉冲周期彼此偏移并且差异增大。因此，通过高速采样来测量时间上扩展的太赫兹脉冲，而不用任何用于时间延迟扫描的机械级。用脉冲周期测量时间窗高速采样测得的太赫兹电场时间波形进行时标转换和傅里叶变换。

7. 发明授权

US08444316B2 Temperature measuring device and method 失效
标题翻译：温度测量装置及方法
公开(公告)号：US08444316B2
公开(公告)日：2013-05-21
申请号：US12746947
申请日：2008-11-27
申请人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
发明人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
IPC分类号： G01K13/00
CPC分类号： G01K7/01 , G01K2219/00
摘要： Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.
摘要翻译：电流读取装置检测输出电流随温度变化而变化的电流源的输出电流，并输出与输出电流成比例的值。测量与电流读取装置的输出值对应的电流源的温度，其与电流源的输出电流成比例，并且根据电流的输出值确定将输出值转换为温度信息的参数读数手段和对应于输出值的电流源的温度测量值。使用所确定的参数将电流读取装置的输出值转换为温度信息。

8. 发明申请

US20100272149A1 TEMPERATURE MEASURING DEVICE AND METHOD 失效
标题翻译：温度测量装置及方法
公开(公告)号：US20100272149A1
公开(公告)日：2010-10-28
申请号：US12746947
申请日：2008-11-27
申请人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
发明人： Eisuke Saneyoshi , Koichi Nose , Mikihiro Kajita , Masayuki Mizuno
IPC分类号： G01K13/00
CPC分类号： G01K7/01 , G01K2219/00
摘要： Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.
摘要翻译：电流读取装置检测输出电流随温度变化而变化的电流源的输出电流，并输出与输出电流成比例的值。测量与电流读取装置的输出值对应的电流源的温度，其与电流源的输出电流成比例，并且根据电流的输出值确定将输出值转换为温度信息的参数读数手段和对应于输出值的电流源的温度测量值。使用所确定的参数将电流读取装置的输出值转换为温度信息。

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