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1. 发明授权

US07786746B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07786746B2
公开(公告)日：2010-08-31
申请号：US11847712
申请日：2007-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

2. 发明申请

US20090128134A1 SEMICONDUCTOR INTEGRATED CIRCUIT APPARATUS, MEASUREMENT RESULT MANAGEMENT SYSTEM, AND MANAGEMENT SERVER 审中-公开
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20090128134A1
公开(公告)日：2009-05-21
申请号：US12358652
申请日：2009-01-23
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/00
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

3. 发明授权

US07911220B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07911220B2
公开(公告)日：2011-03-22
申请号：US11512361
申请日：2006-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/28
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors.A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip.Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

4. 发明授权

US07307439B2 Semiconductor integrated circuit apparatus, measurement result management system, and management server 失效
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US07307439B2
公开(公告)日：2007-12-11
申请号：US10926364
申请日：2004-08-26
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/02
CPC分类号： G01R31/31709
摘要： A semiconductor integrated circuit apparatus, and more particularly a technology for measuring and managing a physical amount of factors that exert an influence upon an operation of a semiconductor integrated circuit is provided; more particularly, a semiconductor integrated circuit that is an object of measurement, and a measurement circuit which measures a physical factor that exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are provided on an identical chip; also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is the object of measurement.
摘要翻译：更具体地说，提供一种用于测量和管理对半导体集成电路的操作产生影响的因素的物理量的技术的半导体集成电路装置。更具体地，是作为测量对象的半导体集成电路，以及测量对半导体集成电路的实际操作（例如抖动或噪声抖动）和该半导体集成的噪声产生影响的物理因素的测量电路电路设置在相同的芯片上; 此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

5. 发明申请

US20060290373A1 Semiconductor integrated circuit apparatus, measurement result management system, and management server 有权
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20060290373A1
公开(公告)日：2006-12-28
申请号：US11512361
申请日：2006-08-30
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/26
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

6. 发明申请

US20050165573A1 Semiconductor integrated circuit apparatus, measurement result management system, and management server 失效
标题翻译：半导体集成电路设备，测量结果管理系统和管理服务器
公开(公告)号：US20050165573A1
公开(公告)日：2005-07-28
申请号：US10926364
申请日：2004-08-26
申请人： Makoto Takamiya , Masayuki Mizuno
发明人： Makoto Takamiya , Masayuki Mizuno
IPC分类号： G01R31/26 , G01R31/28 , G01R31/317 , G01R31/319 , G06F15/00 , H01L21/822 , H01L27/04
CPC分类号： G01R31/31709
摘要： An objective is to provide a semiconductor integrated circuit apparatus capable of analyzing factors that exert an influence upon an actual operation of a semiconductor integrated circuit that is actually working, and further of reducing its factors. A semiconductor integrated circuit that is an object of measurement, and a measurement circuit for measuring a physical amount, which exerts an influence upon the actual operation of the semiconductor integrated circuit, such as jitter or noise jitter, and noise of this semiconductor integrated circuit are configured on an identical chip. Also, a measurement result of the measurement circuit of the present invention is analyzed, and is fed back to a circuit for adjusting the semiconductor integrated circuit that is an object of measurement.
摘要翻译：目的是提供能够分析对实际工作的半导体集成电路的实际操作产生影响的因素的半导体集成电路装置，并进一步降低其因素。作为测量对象的半导体集成电路和用于测量对该半导体集成电路的抖动或噪声抖动以及噪声等半导体集成电路的实际操作产生影响的物理量的测量电路，配置在相同的芯片上。此外，分析本发明的测量电路的测量结果，并将其反馈到用于调整作为测量对象的半导体集成电路的电路。

7. 发明授权

US09000751B2 Voltage detecting circuit 有权
标题翻译：电压检测电路
公开(公告)号：US09000751B2
公开(公告)日：2015-04-07
申请号：US13396235
申请日：2012-02-14
申请人： Po-Hung Chen , Makoto Takamiya , Takayasu Sakurai
发明人： Po-Hung Chen , Makoto Takamiya , Takayasu Sakurai
IPC分类号： G01R1/30 , G01R19/165 , G01F3/20
CPC分类号： G01R19/16519 , G01F3/20
摘要： In a voltage detecting circuit, a transistor is configured as a P-type MOSFET, and includes a source connected with an input terminal, a gate connected with a ground voltage terminal and a drain connected with an output terminal. A transistor is configured as a P-type MOSFET, and includes a gate and a source connected with the output terminal and a drain connected with the ground terminal. Gate width and gate length of the transistor and gate width and gate length of the transistor are adjusted so that source-drain current flowing between the source and the drain of the transistor becomes equal to source-drain current flowing between the source and the drain of the transistor when the voltage applied to the input terminal is set to be preset trigger voltage. This configuration accomplishes detecting that the input voltage exceeds the trigger voltage with simple configuration.
摘要翻译：在电压检测电路中，晶体管被配置为P型MOSFET，并且包括与输入端连接的源极，与接地电压端子连接的栅极和与输出端子连接的漏极。晶体管被配置为P型MOSFET，并且包括与输出端连接的栅极和源极以及与接地端子连接的漏极。调节晶体管的栅极宽度和栅极长度，并调整晶体管的栅极宽度和栅极长度，使得在晶体管的源极和漏极之间流动的源极 - 漏极电流变得等于在源极和漏极之间流动的源极 - 漏极电流当施加到输入端子的电压被设置为预置触发电压时，晶体管。该配置通过简单的配置实现了输入电压超过触发电压的检测。

8. 发明申请

US20140104952A1 INTEGRATED CIRCUIT DEVICE 有权
标题翻译：集成电路设备
公开(公告)号：US20140104952A1
公开(公告)日：2014-04-17
申请号：US14118464
申请日：2012-05-11
申请人： Ken Takeuchi , Teruyoshi Hatanaka , Koichi Ishida , Tadashi Yasufuku , Makoto Takamiya , Takayasu Sakurai
发明人： Ken Takeuchi , Teruyoshi Hatanaka , Koichi Ishida , Tadashi Yasufuku , Makoto Takamiya , Takayasu Sakurai
IPC分类号： H02M3/155 , G11C16/30
CPC分类号： H02M3/155 , G11C16/06 , G11C16/26 , G11C16/30 , G11C16/3418 , H02M3/158 , H02M2001/007
摘要： A booster circuit is configured, such that: in response to a reading request for reading data from a flash memory, when a voltage of an output terminal detected by a voltage detection circuit is not higher than a voltage, an oscillator outputs a control clock signal of predetermined on time and off time to a transistor of a boost converter to perform switching control of the transistor; and when the voltage detection circuit detects that the voltage of the output terminal reaches a voltage, an oscillator outputs a control clock signal of an on time and an off time input from a selection circuit to a transistor of a boost converter to perform switching control of the transistor.
摘要翻译：升压电路被配置为：响应于从闪速存储器读取数据的读取请求，当由电压检测电路检测到的输出端子的电压不高于电压时，振荡器输出控制时钟信号对升压转换器的晶体管进行预定的时间和关断时间，以执行晶体管的切换控制; 并且当电压检测电路检测到输出端子的电压达到电压时，振荡器输出从选择电路输入到升压转换器的晶体管的接通时间和截止时间的控制时钟信号，以执行切换控制晶体管。

9. 发明授权

US08514013B2 Integrated circuit device having a plurality of integrated circuit chips and an interposer 有权
标题翻译：具有多个集成电路芯片和插入器的集成电路装置
公开(公告)号：US08514013B2
公开(公告)日：2013-08-20
申请号：US13093343
申请日：2011-04-25
申请人： Ken Takeuchi , Teruyoshi Hatanaka , Koichi Ishida , Tadashi Yasufuku , Makoto Takamiya , Takayasu Sakurai
发明人： Ken Takeuchi , Teruyoshi Hatanaka , Koichi Ishida , Tadashi Yasufuku , Makoto Takamiya , Takayasu Sakurai
IPC分类号： H01L25/00
CPC分类号： H01L25/0657 , H01L25/18 , H01L2225/06565 , H01L2924/0002 , H01L2924/00
摘要： The channel number detecting circuit detects the operation channel number based on the output terminal voltage after falling down when the output terminal voltage falls down during the voltage boosting control, and the switching control circuit generates the control clock signal having the on-time and the off-time adjusted based on the operation channel number and performs the voltage boosting control using generating control clock signal. The voltage boosting control is properly performed based on the operation channel number when the operation channel number increase during performing the voltage boosting control. Thus boosting the power supply voltage up to a second voltage is accomplished.
摘要翻译：通道号检测电路在升压控制期间当输出端子电压下降时，基于输出端子电压在下降之后检测操作通道数，并且开关控制电路产生具有导通时间和关断的控制时钟信号根据操作通道号进行时间调整，并使用产生控制时钟信号进行升压控制。当在执行升压控制期间操作通道号增加时，基于操作通道号适当地执行升压控制。从而实现将电源电压提高到第二电压。

10. 发明申请

US20110025904A1 FOCUS DETECTION DEVICE AND IMAGING APPARATUS HAVING THE SAME 有权
标题翻译：聚焦检测装置及其成像装置
公开(公告)号：US20110025904A1
公开(公告)日：2011-02-03
申请号：US12921466
申请日：2009-03-06
申请人： Ichiro Onuki , Akihiko Nagano , Makoto Takamiya
发明人： Ichiro Onuki , Akihiko Nagano , Makoto Takamiya
IPC分类号： H04N5/225
CPC分类号： H04N5/23212 , G02B7/34 , G02B7/346 , G03B13/36 , H04N5/3696 , H04N2101/00
摘要： A focus detection device having imaging pixels and focus-detecting pixels using a phase-difference focus detection method implements high-precision focus detection. In the focus detection device, a plurality of pixels each having a photoelectric conversion unit for converting an incident light flux into signal charges, and a microlens having a focus position near the photoelectric conversion unit are arranged. The plurality of pixels include a plurality of imaging pixels for generating a shot image, and a plurality of focus-detecting pixels for generating an image signal for focus detection by the phase-difference focus detection method. An opening for giving a pupil division function to the focus-detecting pixel is formed using electrodes arranged to read out signal charges from the photoelectric conversion unit.
摘要翻译：具有成像像素和使用相位差焦点检测方法的聚焦检测像素的焦点检测装置实现高精度聚焦检测。在焦点检测装置中，配置有具有用于将入射光束转换为信号电荷的光电转换单元的多个像素和具有靠近光电转换单元的聚焦位置的微透镜。多个像素包括用于产生镜头图像的多个成像像素和用于通过相位差焦点检测方法生成用于焦点检测的图像信号的多个焦点检测像素。使用用于从光电转换单元读出信号电荷的电极形成用于向焦点检测像素提供光瞳分割功能的开口。

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