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    • 1. 发明授权
    • Multiphoton-excitation laser scanning microscope
    • 多光子激发扫描显微镜
    • US07889341B2
    • 2011-02-15
    • US12148671
    • 2008-04-21
    • Makoto ArakiYasunari MatsukawaHiroshi SasakiMakio Ueno
    • Makoto ArakiYasunari MatsukawaHiroshi SasakiMakio Ueno
    • G01N21/25
    • G02B21/0076G01N21/6458G02B21/0064G02B21/008
    • A multiphoton-excitation laser scanning microscope capable of efficiently collecting fluorescence emitted from a specimen to acquire a brighter multiphoton-excitation fluorescence image is provided. This multiphoton-excitation laser scanning microscope includes a multiphoton-excitation laser light source for emitting ultrashort pulsed laser light, a light-scanning unit configured to scan a specimen with the ultrashort pulsed laser light emitted from the multiphoton-excitation laser light source in two dimensions, an objective lens configured to focus the ultrashort pulsed laser light scanned by the light-scanning unit on the specimen, a collector lens disposed opposite the objective lens, with the light-scanning unit disposed therebetween, to collect fluorescence emitted from the specimen, and a light detector configured to detect the fluorescence collected by the collector lens. The collector lens has a higher numerical aperture and a larger field number than the objective lens.
    • 提供能够有效地收集从样本发出的荧光以获得更明亮的多光子激发荧光图像的多光子激发激光扫描显微镜。 该多光子激发激光扫描显微镜包括用于发射超短脉冲激光的多光子激发激光光源,被配置为使用从多光子激发激光光源发射的超短脉冲激光二维扫描样本的光扫描单元 配置为将由所述光扫描单元扫描的超短脉冲激光对准在所述检体上的物镜,与所述物镜相对设置的集光透镜,其间设置有所述光扫描单元,以收集从所述检体发出的荧光,以及 光检测器,被配置为检测由所述收集透镜收集的荧光。 收集透镜具有比物镜更高的数值孔径和更大的场数。
    • 2. 发明申请
    • Multiphoton-excitation laser scanning microscope
    • 多光子激发扫描显微镜
    • US20080266551A1
    • 2008-10-30
    • US12148671
    • 2008-04-21
    • Makoto ArakiYasunari MatsukawaHiroshi SasakiMakio Ueno
    • Makoto ArakiYasunari MatsukawaHiroshi SasakiMakio Ueno
    • G01N21/00G01J3/30
    • G02B21/0076G01N21/6458G02B21/0064G02B21/008
    • A multiphoton-excitation laser scanning microscope capable of efficiently collecting fluorescence emitted from a specimen to acquire a brighter multiphoton-excitation fluorescence image is provided. This multiphoton-excitation laser scanning microscope includes a multiphoton-excitation laser light source for emitting ultrashort pulsed laser light, a light-scanning unit configured to scan a specimen with the ultrashort pulsed laser light emitted from the multiphoton-excitation laser light source in two dimensions, an objective lens configured to focus the ultrashort pulsed laser light scanned by the light-scanning unit on the specimen, a collector lens disposed opposite the objective lens, with the light-scanning unit disposed therebetween, to collect fluorescence emitted from the specimen, and a light detector configured to detect the fluorescence collected by the collector lens. The collector lens has a higher numerical aperture and a larger field number than the objective lens.
    • 提供能够有效地收集从样本发出的荧光以获得更明亮的多光子激发荧光图像的多光子激发激光扫描显微镜。 该多光子激发激光扫描显微镜包括用于发射超短脉冲激光的多光子激发激光光源,被配置为使用从多光子激发激光光源发射的超短脉冲激光二维扫描样本的光扫描单元 配置为将由所述光扫描单元扫描的超短脉冲激光对准在所述检体上的物镜,与所述物镜相对设置的集光透镜,其间设置有所述光扫描单元,以收集从所述检体发出的荧光,以及 光检测器,被配置为检测由所述收集透镜收集的荧光。 收集透镜具有比物镜更高的数值孔径和更大的场数。
    • 3. 发明授权
    • Multiphoton-excitation observation apparatus
    • 多光子激发观测装置
    • US07488955B2
    • 2009-02-10
    • US11726577
    • 2007-03-22
    • Junichi OkadaMakio UenoYasunari Matsukawa
    • Junichi OkadaMakio UenoYasunari Matsukawa
    • G02B21/06
    • G01N21/6458
    • The invention provides a multiphoton-excitation observation apparatus comprising a light-source unit for emitting pulsed laser light; an observation apparatus main unit for irradiating a specimen with laser light emitted from the light-source unit and observing fluorescence emitted from the specimen; an incidence adjusting device, disposed between the light-source unit and the observation apparatus main unit, for adjusting the beam diameter of the laser light emitted from the light-source unit; and a control apparatus for controlling the incidence-adjusting unit according to the depth of an observation plane in the specimen.
    • 本发明提供了一种多光子激发观测装置,包括用于发射脉冲激光的光源单元; 观察装置主单元,用于从从所述光源单元发射的激光照射样本并观察从所述样本发射的荧光; 入射调节装置,设置在所述光源单元和所述观察装置主单元之间,用于调节从所述光源单元发射的所述激光的光束直径; 以及控制装置,用于根据样本中观察平面的深度来控制入射调节单元。
    • 5. 发明授权
    • Scanning laser microscope apparatus
    • 扫描激光显微镜装置
    • US07268344B2
    • 2007-09-11
    • US11447761
    • 2006-06-06
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • G01J1/32
    • G02B21/008G01N21/6458
    • A scanning laser microscope that can quantitatively display a laser irradiation power on a display unit and that can suppress fluctuations in the laser irradiation power is provided. The scanning laser microscope includes a light source configured to emit laser light, a scanning unit configured to scan the laser light emitted from the light source on a sample, a photodetector configured to detect light from the sample, a processing unit configured to convert a signal from the photodetector into an image signal of the sample and to output the image signal, a reference light detector configured to detect part of the laser light emitted from the light source as a reference light signal, a laser light control unit configured to control the power of the laser light emitted from the light source, an irradiation-power calculation unit configured to calculate an irradiation power value at the sample on the basis of the reference light signal detected by the reference light detector, and a display unit configured to display the calculated irradiation power value at the sample.
    • 提供了一种可以在显示单元上定量显示激光照射功率并且可以抑制激光照射功率的波动的扫描激光显微镜。 该扫描激光显微镜包括配置为发射激光的光源,被配置为扫描从样品上的光源发射的激光的扫描单元,被配置为检测来自样品的光的光电检测器,被配置为将信号 从光电检测器到样品的图像信号并输出​​图像信号;参考光检测器,被配置为检测从光源发射的激光的一部分作为参考光信号;激光控制单元,被配置为控制功率 照射功率计算单元,被配置为基于由参考光检测器检测的参考光信号计算样本处的照射功率值;以及显示单元,被配置为显示所计算的 样品照射功率值。
    • 6. 发明授权
    • Scanning laser microscope
    • 扫描激光显微镜
    • US08054542B2
    • 2011-11-08
    • US12251602
    • 2008-10-15
    • Hiroshi SasakiYasunari Matsukawa
    • Hiroshi SasakiYasunari Matsukawa
    • G02B21/00
    • G02B21/0032G02B21/0064G02B21/0076G02B21/008
    • A scanning laser microscope includes a laser light source; an acousto-optic deflector having a crystal, being arranged in an optical path of a laser beam emitted from the laser light source and capable of changing a traveling direction of the laser beam when frequencies of acoustic waves applied to the crystal are changed; a frequency control unit configured to simultaneously apply acoustic waves having a plurality of frequencies to the crystal of the acousto-optic deflector; an objective lens configured to converge the laser beam emitted from the laser light source to form a beam spot on a specimen; and an optical scanning device configured to two-dimensionally scan the scanning spot by deflecting the laser beam in two directions perpendicular to each other. The acousto-optic deflector, the optical scanning device, and a pupil of the objective lens are arranged at positions optically conjugate with each other.
    • 扫描激光显微镜包括激光光源; 具有晶体的声光偏转器布置在从激光光源发射的激光束的光路中,并且当施加到晶体的声波的频率改变时能够改变激光束的行进方向; 频率控制单元,被配置为向声光偏转器的晶体同时施加具有多个频率的声波; 物镜,其被配置为会聚从激光光源发射的激光束,以在样本上形成束斑; 以及光学扫描装置,被配置为通过使激光束在彼此垂直的两个方向上偏转来二维地扫描扫描光点。 声光偏转器,光学扫描装置和物镜的光瞳被布置在彼此光学共轭的位置。
    • 7. 发明申请
    • Scanning laser microscope apparatus
    • 扫描激光显微镜装置
    • US20060278530A1
    • 2006-12-14
    • US11447761
    • 2006-06-06
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • Kunihiko SasakiYasunari MatsukawaHiroshi SasakiTatsuo Nakata
    • B01D57/02B01D59/42B01D59/50
    • G02B21/008G01N21/6458
    • A scanning laser microscope that can quantitatively display a laser irradiation power on a display unit and that can suppress fluctuations in the laser irradiation power is provided. The scanning laser microscope includes a light source configured to emit laser light, a scanning unit configured to scan the laser light emitted from the light source on a sample, a photodetector configured to detect light from the sample, a processing unit configured to convert a signal from the photodetector into an image signal of the sample and to output the image signal, a reference light detector configured to detect part of the laser light emitted from the light source as a reference light signal, a laser light control unit configured to control the power of the laser light emitted from the light source, an irradiation-power calculation unit configured to calculate an irradiation power value at the sample on the basis of the reference light signal detected by the reference light detector, and a display unit configured to display the calculated irradiation power value at the sample.
    • 提供了一种可以在显示单元上定量显示激光照射功率并且可以抑制激光照射功率的波动的扫描激光显微镜。 该扫描激光显微镜包括配置为发射激光的光源,被配置为扫描从样品上的光源发射的激光的扫描单元,被配置为检测来自样品的光的光电检测器,被配置为将信号 从光电检测器到样品的图像信号并输出​​图像信号;参考光检测器,被配置为检测从光源发射的激光的一部分作为参考光信号;激光控制单元,被配置为控制功率 照射功率计算单元,被配置为基于由参考光检测器检测的参考光信号计算样本处的照射功率值;以及显示单元,被配置为显示所计算的 样品照射功率值。
    • 8. 发明申请
    • Scanning microscope and adjusting method for the same
    • 扫描显微镜和调整方法相同
    • US20080259442A1
    • 2008-10-23
    • US12079153
    • 2008-03-25
    • Yasunari MatsukawaMasaharu TomiokaAkinori ArayaToshiyuki Hattori
    • Yasunari MatsukawaMasaharu TomiokaAkinori ArayaToshiyuki Hattori
    • G02B21/06
    • G02B21/008G02B21/365
    • A scanning microscope includes an objective lens for focusing illumination light onto a specimen; a scanning device for deflecting and scanning the illumination light; a pupil-projection optical system for illuminating a pupil of the objective lens with the scanned illumination light; and a total-magnification specifying unit for specifying a total magnification. An optical-system selecting unit changes at least one of the objective lens and the pupil-projection optical system such that a magnification of an optical system including the objective lens and the pupil-projection optical system is equal to or less than the total magnification specified by the total-magnification specifying unit and that the numerical aperture of the optical system is maximized. A deflection-angle determination unit determines a deflection angle of the illumination light deflected by the scanning device based on the ratio of the magnification of the optical system to the total magnification to achieve the total magnification.
    • 扫描显微镜包括用于将照明光聚焦到样本上的物镜; 用于偏转和扫描照明光的扫描装置; 用于利用扫描的照明光照射物镜的光瞳的光瞳投影光学系统; 以及用于指定总放大率的总放大率指定单元。 光学系统选择单元改变物镜和瞳孔投影光学系统中的至少一个,使得包括物镜和瞳孔投影光学系统的光学系统的放大倍数等于或小于指定的总倍率 通过总倍率指定单元,并且光学系统的数值孔径最大化。 偏转角确定单元基于光学系统的倍率与总放大率的比率确定由扫描装置偏转的照明光的偏转角,以实现总放大率。