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    • 1. 发明授权
    • Surface metal balancing to reduce chip carrier flexing
    • 表面金属平衡,减少芯片载体弯曲
    • US06497943B1
    • 2002-12-24
    • US09503395
    • 2000-02-14
    • Lisa J. JimarezMiguel A. JimarezMark V. Pierson
    • Lisa J. JimarezMiguel A. JimarezMark V. Pierson
    • B32B300
    • B32B15/08B32B15/20B32B17/10229B32B2250/40B32B2425/00H01L23/142H01L23/49822H01L2224/16225H01L2924/00014H01L2924/01322H05K1/0271H05K3/4602H05K2201/0949H05K2201/09781H05K2201/10674H05K2201/10734Y10T428/24917H01L2924/00H01L2224/0401
    • A surface metal balancing structure for a chip carrier, and an associated method of fabrication, to reduce or eliminate thermally induced chip carrier flexing. A substrate, such as a chip carrier made of organic dielectric material, is formed and includes: internal circuitization layers, a plated through hole, and outer layers comprised of an allylated polyphenylene ether. A stiffener ring for mechanically stabilizing the substrate is bonded to an outer portion, such as an outer perimeter portion, of the top surface of the substrate, in light of the soft and conformal organic material of the substrate. The top and bottom surfaces of the substrate have metal structures, such as copper pads and copper circuitization, wherein a surface area (A) multiplied by a coefficient of thermal expansion (C) is greater for the metal structure at the bottom surface than for the metal structure at the top surface. A metal pattern is adjacent to the top surface so as to make the product AC of metal structures at or near the top and bottom surfaces approximately equal. The metal pattern reduces or eliminates flexing of the substrate in an elevated temperature environment, such as during a reflow of solder that couples a semiconductor chip to the substrate.
    • 用于芯片载体的表面金属平衡结构以及相关的制造方法,以减少或消除热诱导的芯片载体弯曲。 形成诸如由有机电介质材料制成的芯片载体的衬底,其包括:内部电路层,电镀通孔和由烯丙基化聚苯醚构成的外层。 根据衬底的软和保形有机材料,用于机械稳定衬底的加强环被结合到衬底的顶表面的外部部分,例如外周部分。 衬底的顶表面和底表面具有诸如铜焊盘和铜电路的金属结构,其中在底表面处的金属结构的表面积(A)乘以热膨胀系数(C)大于对于 金属结构在顶面。 金属图案与顶表面相邻,以使金属结构的产品AC在顶表面和底表面处或附近大致相等。 金属图案减少或消除了在升高的温度环境中的衬底的弯曲,例如在将半导体芯片耦合到衬底的焊料的回流期间。
    • 2. 发明授权
    • Reduction of chip carrier flexing during thermal cycling
    • 在热循环期间减少芯片载体弯曲
    • US06818972B2
    • 2004-11-16
    • US10262023
    • 2002-09-30
    • Lisa J. JimarezMiguel A. Jimarez
    • Lisa J. JimarezMiguel A. Jimarez
    • H01L23495
    • H01L23/49822B32B15/08H01L23/142H01L2224/16225H01L2924/01322H05K1/0271H05K3/4602H05K2201/0949H05K2201/09781H05K2201/10674H05K2201/10734Y10T428/125Y10T428/12528Y10T428/24917H01L2924/00
    • A method and structure for reducing chip carrier flexing during thermal cycling. A semiconductor chip is coupled to a stiff chip carrier (i.e., a chip carrier having an elastic modulus of at least about 3×105 psi), and there is no stiffener ring on a periphery of the chip carrier. Without the stiffener ring, the chip carrier is able to undergo natural flexing (in contrast with constrained flexing) in response to a temperature change that induces thermal strains due to a mismatch in coefficient of thermal expansion between the chip and the chip carrier. If the temperature at the chip carrier changes from room temperature to a temperature of about −40° C., a maximum thermally induced displacement of a surface of the chip carrier is at least about 25% less if the stiffener ring is absent than if the stiffener ring is present. Since a propensity for cracking of the stiff chip carrier increases as the thermally induced displacement increases, the present invention, which avoids use of the stiffener ring, improves a structural integrity of the chip carrier.
    • 用于减少热循环期间芯片载体弯曲的方法和结构。 半导体芯片耦合到刚性芯片载体(即具有至少约3×10 5 psi的弹性模量的芯片载体),并且在芯片载体的外围没有加强环。 没有加强环,芯片载体响应于由于芯片和芯片载体之间的热膨胀系数不匹配而引起热应变的温度变化,能够经受自然弯曲(与受限制的弯曲相反)。 如果芯片载体上的温度从室温变化到约-40℃的温度,如果加强环不存在,则芯片载体的表面的最大热诱导位移比如下 存在加强环。 由于热引起的位移增加,刚性芯片载体的开裂倾向增加,所以避免使用加强环的本发明改善了芯片载体的结构完整性。
    • 9. 发明授权
    • Fixture for attaching a conformal chip carrier to a flip chip
    • 将保形芯片载体连接到倒装芯片的夹具
    • US06337509B2
    • 2002-01-08
    • US09116368
    • 1998-07-16
    • David N. CokelyThomas M. CulnaneLisa J. JimarezMiguel A. JimarezLi LiDonald I. Mead
    • David N. CokelyThomas M. CulnaneLisa J. JimarezMiguel A. JimarezLi LiDonald I. Mead
    • H01L23495
    • H01L24/81H01L21/6835H01L24/75H01L2224/75H01L2224/75755H01L2224/7598H01L2224/75983H01L2224/81801H01L2924/01005H01L2924/01006H01L2924/01033H01L2924/014
    • Fixtures for attaching a semiconductor chip to a substrate. The semiconductor chip has an array of joining material bumps, such as C4 solder balls. The substrate has an array of conductive pads corresponding to the array of joining material bumps. In a first embodiment the fixture has a body having a first cavity for containing the semiconductor chip and a second cavity in communication with the first cavity for containing the substrate. Whereby the substrate is placed over the semiconductor chip with the conductive pads opposing and in contact with the joining material bumps, such that during reflow of the joining material bumps, the weight of the substrate acts against the joining material bumps and aids in the attachment of the semiconductor chip to the substrate to form electrical connections therebetween. In a second embodiment the fixture has a first plate having a first opening for disposal of the semiconductor chip therein, a second plate stacked below the first plate and having a thickness substantially equal to the thickness of the substrate, the second plate further having a second opening opposing the first opening for disposal of the substrate therein, and a third plate stacked below the second plate such that the substrate is flattened in the second opening under the weight of the first plate thereby aiding in the attachment of the joining material bumps to their corresponding conductive pads during solder reflow to form electrical connections therebetween. Methods for use of the fixtures is also provided.
    • 用于将半导体芯片附接到基板的夹具。 半导体芯片具有连接材料凸块的阵列,例如C4焊球。 衬底具有对应于接合材料凸块阵列的导电焊盘阵列。 在第一实施例中,固定装置具有主体,该主体具有用于容纳半导体芯片的第一空腔和与第一空腔连通以容纳基板的第二空腔。 由此将衬底放置在半导体芯片上,其中导电焊盘与接合材料凸块相对并接触,使得在接合材料凸块的回流期间,衬底的重量抵抗接合材料凸起并且有助于附接 半导体芯片到基板以在它们之间形成电连接。 在第二实施例中,固定装置具有第一板,其具有用于在其中处理半导体芯片的第一开口,堆叠在第一板下方并且具有基本上等于衬底厚度的厚度的第二板,第二板还具有第二板 与第一开口相对地打开以处理其中的基板;以及第三板,堆叠在第二板下方,使得基板在第一板的重量下在第二开口中变平,由此辅助将接合材料凸块附接到它们 焊料回流期间相应的导电焊盘在其间形成电连接。 还提供了使用固定装置的方法。
    • 10. 发明授权
    • Reduction of chip carrier flexing during thermal cycling
    • 在热循环期间减少芯片载体弯曲
    • US06528179B1
    • 2003-03-04
    • US09691935
    • 2000-10-19
    • Lisa J. JimarezMiguel A. Jimarez
    • Lisa J. JimarezMiguel A. Jimarez
    • H01L2912
    • H01L23/49822B32B15/08H01L23/142H01L2224/16225H01L2924/01322H05K1/0271H05K3/4602H05K2201/0949H05K2201/09781H05K2201/10674H05K2201/10734Y10T428/125Y10T428/12528Y10T428/24917H01L2924/00
    • A method and structure for reducing chip carrier flexing during thermal cycling. A semiconductor chip is coupled to a stiff chip carrier (i.e., a chip carrier having an elastic modulus of at least about 3×105 psi), and there is no stiffener ring on a periphery of the chip carrier. Without the stiffener ring, the chip carrier is able to undergo natural flexing (in contrast with constrained flexing) in response to a temperature change that induces thermal strains due to a mismatch in coefficient of thermal expansion between the chip and the chip carrier. If the temperature at the chip carrier changes from room temperature to a temperature of about −40° C., a maximum thermally induced displacement of a surface of the chip carrier is at least about 25% less if the stiffener ring is absent than if the stiffener ring is present. Since a propensity for cracking of the stiff chip carrier increases as the thermally induced displacement increases, the present invention, which avoids use of the stiffener ring, improves a structural integrity of the chip carrier.
    • 用于减少热循环期间芯片载体弯曲的方法和结构。 半导体芯片耦合到刚性芯片载体(即具有至少约3×10 5 psi的弹性模量的芯片载体),并且在芯片载体的外围没有加强环。 没有加强环,芯片载体响应于由于芯片和芯片载体之间的热膨胀系数不匹配而引起热应变的温度变化,能够经受自然弯曲(与受限制的弯曲相反)。 如果芯片载体上的温度从室温变化到约-40℃的温度,如果加强环不存在,则芯片载体的表面的最大热诱导位移比如下 存在加强环。 由于热引起的位移增加,刚性芯片载体的开裂倾向增加,所以避免使用加强环的本发明改善了芯片载体的结构完整性。