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    • 8. 发明申请
    • Phase-Shift Analysis System and Method
    • 相移分析系统与方法
    • US20090225329A1
    • 2009-09-10
    • US12042800
    • 2008-03-05
    • Clark Alexander BendallKevin George HardingGuiju SongLi Tao
    • Clark Alexander BendallKevin George HardingGuiju SongLi Tao
    • G01B11/00
    • G01B11/25G02B23/2407
    • A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The probe system is further configured to compute a ripple metric value associated with each of a plurality of possible z values, where z is an object distance. The probe system is also configured to determine an approximated z value using the computed ripple metric values. A method for determining an object distance z is also provided.
    • 用于确定对象距离z的系统包括多个发光器。 多个发光体中的至少一个的一组包括发射体组,并且当一个发射体组发射时投射的图案包括边缘组。 一个条纹集合的光图案相对于其他条纹集合的光图案显示相移,并且相移随着多个条纹集合的原点的距离变化而变化。 该系统还包括处理单元,其被配置为计算与多个可能z值中的每一个相关联的纹波度量值。 处理单元还被配置为使用所计算的纹波度量值来确定近似的z值。 还提供探针系统。 探针系统被配置为将多个边缘组从探针投影到物体上。 一个条纹集合的光图案相对于其他条纹集合的光图案显示相移,并且相移随着多个条纹集合的原点的距离变化而变化。 探针系统还被配置为计算与多个可能z值中的每一个相关联的波纹度量值,其中z是对象距离。 探针系统还被配置为使用计算的纹波度量值来确定近似的z值。 还提供了一种用于确定对象距离z的方法。
    • 10. 发明申请
    • OPTICAL GAGE AND THREE-DIMENSIONAL SURFACE PROFILE MEASUREMENT METHOD
    • 光栅和三维表面轮廓测量方法
    • US20130057650A1
    • 2013-03-07
    • US13257268
    • 2009-03-19
    • Guiju SongKevin George HardingMing JiaBo YangQingying HuJianming ZhengLi Tao
    • Guiju SongKevin George HardingMing JiaBo YangQingying HuJianming ZhengLi Tao
    • H04N13/02G06K9/00
    • G01B11/2527
    • An optical gage (10) with a small field of view for three-dimensional surface profile measurement includes a projector (20) having a light source (22) and projection optics (28, 30, 42) that guide light along a projection light path. An optical grating device (34) is arranged in the projection light path and modifies the projection light distribution to project a structured light pattern (46). A phase shifting apparatus (47) shifts the structured light pattern to at least three positions with desired phase shift on said surface (80) to be measured. A viewer (50) includes viewing optics with a viewing light path that is non-parallel to the projection light path, a light sensing array (58) for sensing images of diffuse reflections of the structured light patterns from said surface, and a camera (57) for recording the images. The optical gage further includes a computer (61) which comprises data input communication with the camera and a processor for modeling the surface being profiled based on surface contour information provided by the images.
    • 具有用于三维表面轮廓测量的小视野的光学计(10)包括具有光源(22)和投影光学器件(28,30,42)的投影仪(20),其沿着投影光路 。 光栅装置(34)布置在投影光路中并修改投影光分布以投影结构光图案(46)。 相移装置(47)将结构化光图案移动到要测量的所述表面(80)上期望的相移的至少三个位置。 观察器(50)包括具有不平行于投影光路的观察光路的观察光学器件,用于感测来自所述表面的结构化光图案的漫反射的图像的光感测阵列(58)和相机 57)用于记录图像。 光学计进一步包括计算机(61),其包括与相机的数据输入通信,以及处理器,用于基于由图像提供的表面轮廓信息来对正在被轮廓的表面进行建模。