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    • 2. 发明申请
    • SYSTEM AND METHOD FOR MEASURING A DISTANCE TO AN OBJECT
    • 用于测量距离对象的系统和方法
    • US20120314058A1
    • 2012-12-13
    • US13156598
    • 2011-06-09
    • Clark Alexander BendallDaniel HJ McClung
    • Clark Alexander BendallDaniel HJ McClung
    • H04N7/18
    • G01C3/08G01C11/00G06T7/50H04N5/23293
    • A system for measuring a distance to an object includes a camera positioned at a location and a signal generated by the camera that is reflective of a camera setting. A controller operably connected to the camera receives the signal and generates an accuracy signal based on the signal. The accuracy signal is reflective of a predicted accuracy of a distance measurement. An indicator operably connected to the controller provides an indication reflective of the accuracy signal. A method for measuring a distance to an object includes positioning a camera and generating a signal reflective of a predicted accuracy of a distance measurement. The method further includes providing an indication reflective of the signal, capturing one or more images of the object at the location, and calculating a distance to the object based on the one or more captured images of the object at the location.
    • 用于测量到物体的距离的系统包括位于位置的照相机和由相机产生的反映相机设置的信号。 可操作地连接到相机的控制器接收信号并且基于该信号产生精度信号。 精度信号反映了距离测量的预测精度。 可操作地连接到控制器的指示器提供反映精度信号的指示。 用于测量到物体的距离的方法包括定位相机并产生反映距离测量的预测精度的信号。 该方法还包括提供反映该信号的指示,在该位置拍摄对象的一个​​或多个图像,以及基于该位置处的对象的一个​​或多个拍摄图像来计算到对象的距离。
    • 3. 发明申请
    • SYSTEM FOR PROVIDING TWO POSITION ZOOM-FOCUS
    • 用于提供两个位置变焦的系统
    • US20110149413A1
    • 2011-06-23
    • US12645636
    • 2009-12-23
    • Joshua Lynn SCOTTClark Alexander BendallTheodore Alexander Chilek
    • Joshua Lynn SCOTTClark Alexander BendallTheodore Alexander Chilek
    • G02B7/10
    • G02B7/10G02B23/2438
    • A system for providing a two-position zoom-focus capability in a video inspection device comprising, in one embodiment, a focus lens cell and primary aperture attached to a set of fixed rails and connected to a zoom lens cell. In one embodiment, the focus lens cell is moveable into a first position along the rails through activation of a proximally located lens movement mechanism, and moveable into a second position through relaxation of a tensioned focus spring. In one embodiment, movement of the focus lens cell between first and second focus positions causes movement of the zoom lens cell and a secondary aperture between corresponding first and second zoom and aperture positions to provide unmagnified and magnified images of a target object.
    • 一种用于在视频检查装置中提供双位置变焦聚焦能力的系统,其包括在一个实施例中,附着到一组固定轨道并连接到变焦透镜单元的聚焦透镜单元和主孔。 在一个实施例中,聚焦透镜单元通过激活近端定位的透镜移动机构而沿着轨道可移动到第一位置,并且通过松弛张紧的聚焦弹簧可移动到第二位置。 在一个实施例中,聚焦透镜单元在第一和第二对焦位置之间的移动引起变焦透镜单元的移动和相应的第一和第二缩放和孔径位置之间的次级孔,以提供目标对象的未放大和放大的图像。
    • 5. 发明授权
    • Probe assembly and methods for use in inspecting a component
    • 探头组件和检测组件的方法
    • US08786300B2
    • 2014-07-22
    • US13367814
    • 2012-02-07
    • Clark Alexander Bendall
    • Clark Alexander Bendall
    • G01R31/308G01B11/24
    • G01B11/25
    • A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light patterns from the light emitters for performing a phase-shift analysis using a plurality of images of the light patterns that are projected onto a component being inspected. The control circuit controls the projection of the light patterns by receiving electrical energy from a drive circuit. At least one of the light emitters is identified for receiving a power input based at least in part on the electrical energy received from the drive circuit. The power input is transmitted to the identified light emitter, based at least in part on the electrical energy received from the drive circuit, to enable the activation of the identified light emitter.
    • 探针尖端包括多个发光体和耦合到发光体的控制电路。 控制电路被配置为控制来自发光体的多个光图案的投影,用于使用投影到正被检查的部件上的光图案的多个图像进行相移分析。 控制电路通过从驱动电路接收电能来控制光图案的投影。 至少一个光发射器被识别用于至少部分地基于从驱动电路接收的电能来接收功率输入。 至少部分地基于从驱动电路接收的电能,将功率输入传输到所识别的光发射器,以使能识别的光发射器的激活。
    • 7. 发明授权
    • System aspects for a probe system that utilizes structured-light
    • 利用结构光的探针系统的系统方面
    • US08107083B2
    • 2012-01-31
    • US12249513
    • 2008-10-10
    • Clark Alexander BendallKevin George HardingThomas KarpenGuiju SongLi Tao
    • Clark Alexander BendallKevin George HardingThomas KarpenGuiju SongLi Tao
    • G01B9/02
    • G01B11/25G01N21/954G01N2021/9544G06T7/521
    • A probe system includes an imager and an inspection light source. The probe system is configured to operate in an inspection mode and a measurement mode. During inspection mode, the inspection light source is enabled. During measurement mode, the inspection light source is disabled, and a structured-light pattern is projected. The probe system is further configured to capture at least one measurement mode image. In the at least one measurement mode image, the structured-light pattern is projected onto an object. The probe system is configured to utilize pixel values from the at least one measurement mode image to determine at least one geometric dimension of the object. A probe system configured to detect relative movement between a probe and the object between captures of two or more of a plurality of images is also provided.
    • 探针系统包括成像器和检查光源。 探针系统被配置为在检查模式和测量模式下操作。 在检查模式下,检查光源被使能。 在测量模式期间,检查光源被禁用,并且结构化光图案被投影。 探测系统还被配置成捕获至少一个测量模式图像。 在至少一个测量模式图像中,将结构光图案投影到对象上。 探测系统被配置为利用来自至少一个测量模式图像的像素值来确定对象的至少一个几何尺寸。 还提供了一种探测系统,其被配置为在多个图像中的两个或更多个图像的捕获之间检测探测器与物体之间的相对运动。
    • 8. 发明授权
    • System and method to determine an object distance from a reference point to a point on the object surface
    • 确定从参考点到物体表面上的点的物体距离的系统和方法
    • US07969583B2
    • 2011-06-28
    • US12042800
    • 2008-03-05
    • Clark Alexander BendallKevin George HardingGuiju SongLi Tao
    • Clark Alexander BendallKevin George HardingGuiju SongLi Tao
    • G01B11/14G01B11/02
    • G01B11/25G02B23/2407
    • A system for determining an object distance z includes a plurality of light emitters. A group of at least one of the plurality of light emitters includes an emitter group, and the pattern projected when one emitter group is emitting includes a fringe set. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The system further includes a processing unit that is configured to compute a ripple metric value associated with each of a plurality of possible z values. The processing unit is further configured to determine an approximated z value using the computed ripple metric values. A probe system is also provided. The probe system is configured to project a plurality of fringe sets from the probe onto an object. The light pattern of one fringe set exhibits a phase-shift relative to the light patterns of the other fringe sets, and the phase-shift varies as the distance from the origin of the plurality of fringe sets varies. The probe system is further configured to compute a ripple metric value associated with each of a plurality of possible z values, where z is an object distance. The probe system is also configured to determine an approximated z value using the computed ripple metric values. A method for determining an object distance z is also provided.
    • 用于确定对象距离z的系统包括多个发光器。 多个发光体中的至少一个的一组包括发射体组,并且当一个发射体组发射时投射的图案包括边缘组。 一个条纹集合的光图案相对于其他条纹集合的光图案显示相移,并且相移随着多个条纹集合的原点的距离变化而变化。 该系统还包括处理单元,其被配置为计算与多个可能z值中的每一个相关联的纹波度量值。 处理单元还被配置为使用所计算的纹波度量值来确定近似的z值。 还提供探针系统。 探针系统被配置为将多个边缘组从探针投影到物体上。 一个条纹集合的光图案相对于其他条纹集合的光图案显示相移,并且相移随着多个条纹集合的原点的距离变化而变化。 探针系统还被配置为计算与多个可能z值中的每一个相关联的波纹度量值,其中z是对象距离。 探针系统还被配置为使用计算的纹波度量值来确定近似的z值。 还提供了一种用于确定对象距离z的方法。
    • 10. 发明申请
    • PROBE ASSEMBLY AND METHODS FOR USE IN INSPECTING A COMPONENT
    • 用于检查组件的探头组件和方法
    • US20130201489A1
    • 2013-08-08
    • US13367814
    • 2012-02-07
    • Clark Alexander Bendall
    • Clark Alexander Bendall
    • G01B11/24
    • G01B11/25
    • A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light patterns from the light emitters for performing a phase-shift analysis using a plurality of images of the light patterns that are projected onto a component being inspected. The control circuit controls the projection of the light patterns by receiving electrical energy from a drive circuit. At least one of the light emitters is identified for receiving a power input based at least in part on the electrical energy received from the drive circuit. The power input is transmitted to the identified light emitter, based at least in part on the electrical energy received from the drive circuit, to enable the activation of the identified light emitter.
    • 探针尖端包括多个发光体和耦合到发光体的控制电路。 控制电路被配置为控制来自发光体的多个光图案的投影,用于使用投影到正被检查的部件上的光图案的多个图像进行相移分析。 控制电路通过从驱动电路接收电能来控制光图案的投影。 至少一个光发射器被识别用于至少部分地基于从驱动电路接收的电能来接收功率输入。 至少部分地基于从驱动电路接收的电能,将功率输入传输到所识别的光发射器,以使能识别的光发射器的激活。