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1. 发明授权

US07098647B2 Coaxial cable unit, test apparatus, and CPU system 有权
标题翻译：同轴电缆单元，测试仪器和CPU系统
公开(公告)号：US07098647B2
公开(公告)日：2006-08-29
申请号：US10738617
申请日：2003-12-17
申请人： Hironori Tanaka , Kunihiro Matsuura , Satoshi Kodera , Hiroki Ando , Yasuhiro Urabe
发明人： Hironori Tanaka , Kunihiro Matsuura , Satoshi Kodera , Hiroki Ando , Yasuhiro Urabe
IPC分类号： G01R31/02 , H04B3/26
CPC分类号： G01R31/2851 , G01R1/02 , G01R31/2822
摘要： A testing apparatus for testing a device under test, includes a power source for generating a current, a coaxial cable unit for supplying the current to the device under test, a detecting unit for detecting a voltage applied to the device under test when the current is supplied to the device under test and a judging unit for judging quality of the device under test based on the detected voltage, wherein the coaxial cable unit includes a first coaxial cable including a first internal conductor and a first external conductor, and a second coaxial cable including a second internal conductor and a second external conductor, wherein the first internal conductor and the second external conductor conduct a current from the power source towards the device under test, and the first external conductor and the second internal conductor conduct a current from the device under test towards the power source.
摘要翻译：一种用于测试被测设备的测试装置，包括用于产生电流的电源，用于将电流提供给被测器件的同轴电缆单元，检测单元，用于当电流为待测器件时检测施加到被测器件的电压提供给被测设备，以及判断单元，用于基于检测到的电压来判定被测设备的质量，其中同轴电缆单元包括包括第一内部导体和第一外部导体的第一同轴电缆和第二同轴电缆包括第二内部导体和第二外部导体，其中所述第一内部导体和所述第二外部导体将来自所述电源的电流传导到被测设备，并且所述第一外部导体和所述第二内部导体从所述装置传导电流正在对电源进行测试。

2. 发明授权

US07119547B2 Testing apparatus 有权
标题翻译：测试仪器
公开(公告)号：US07119547B2
公开(公告)日：2006-10-10
申请号：US10776030
申请日：2004-02-10
申请人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
发明人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
IPC分类号： G01R31/02 , G01R31/00
CPC分类号： H03F3/3018 , G01R31/2851 , G01R31/31924 , H03F1/342
摘要： A testing apparatus includes a first power supply unit and first and second coaxial cables. The first power supply supplies current to a device under test. The first coaxial cable includes a first internal conductor and a first external conductor. The second coaxial cable includes a second internal conductor and a second external conductor. The first internal conductor and the second external conductor conducts current from the first power supply unit to the device under test. The second internal conductor and the first external conductor conducts current from the device under test to the first power supply unit.
摘要翻译：测试装置包括第一电源单元和第一和第二同轴电缆。第一个电源向被测设备供电。第一同轴电缆包括第一内部导体和第一外部导体。第二同轴电缆包括第二内部导体和第二外部导体。第一内部导体和第二外部导体将电流从第一电源单元传导到被测器件。第二内部导体和第一外部导体将电流从被测器件传导到第一个电源单元。

3. 发明申请

US20050174105A1 Testing apparatus 有权
标题翻译：测试仪器
公开(公告)号：US20050174105A1
公开(公告)日：2005-08-11
申请号：US10776030
申请日：2004-02-10
申请人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
发明人： Kunihiro Matsuura , Hiroki Ando , Hironori Tanaka , Yasuhiro Urabe , Satoshi Kodera
IPC分类号： G01R1/00 , G01R31/28 , G01R31/319 , H03F1/34 , H03F3/30
CPC分类号： H03F3/3018 , G01R31/2851 , G01R31/31924 , H03F1/342
摘要： A testing apparatus includes a first power supply unit for generating a current to be supplied to the device under test and first and second coaxial cables through which the current generated by the first power supply unit is supplied to the device under test, wherein the first power supply unit includes a current detecting unit for detecting an amount of a voltage drop when the current generated by the first power supply unit passes through a predetermined resistor and a current controlling unit for controlling the current being supplied to the device under test in response to the amount of the voltage drop detected by the current detecting unit, the first coaxial cable includes a first internal conductor for conducting the current from the first power supply unit towards the device under test and a first external conductor provided around the first internal conductor with an insulator interposed therebetween for conducting the current from the device under test towards the first power supply unit, and the second coaxial cable includes a second internal conductor for conducting the current from the device under test towards the first power supply unit and a second external conductor around the first internal conductor with an insulator interposed therebetween for conducting the current from the first power supply unit towards the device under test.
摘要翻译：测试装置包括：第一电源单元，用于产生要供给到被测器件的电流;以及第一和第二同轴电缆，由第一电源单元产生的电流通过该第一和第二同轴电缆提供给被测器件，其中第一功率供电单元包括电流检测单元，用于当由第一电源单元产生的电流通过预定电阻器时检测电压降的量;以及电流控制单元，用于响应于所述电流控制单元控制供应给被测设备的电流由电流检测单元检测的电压降的量，第一同轴电缆包括用于将来自第一电源单元的电流传导到被测器件的第一内部导体，以及设置在第一内部导体周围的第一外部导体，绝缘体插入其间以将来自被测器件的电流传导到第一电源 r供电单元，并且第二同轴电缆包括用于将来自被测器件的电流传导到第一电源单元的第二内部导体，以及围绕第一内部导体的第二外部导体，其间插入绝缘体，用于将电流从第一个供电单元朝向被测设备。

4. 发明申请

US20050134255A1 Coaxial cable unit, test apparatus, and CPU system 有权
标题翻译：同轴电缆单元，测试仪器和CPU系统
公开(公告)号：US20050134255A1
公开(公告)日：2005-06-23
申请号：US10738617
申请日：2003-12-17
申请人： Hironori Tanaka , Kunihiro Matsuura , Satoshi Kodera , Hiroki Ando , Yasuhiro Urabe
发明人： Hironori Tanaka , Kunihiro Matsuura , Satoshi Kodera , Hiroki Ando , Yasuhiro Urabe
IPC分类号： G01R1/02 , G01R31/26 , G01R31/28 , H01B11/18 , H01R9/05
CPC分类号： G01R31/2851 , G01R1/02 , G01R31/2822
摘要： A testing apparatus for testing a device under test, includes a power source for generating a current, a coaxial cable unit for supplying the current to the device under test, a detecting unit for detecting a voltage applied to the device under test when the current is supplied to the device under test and a judging unit for judging quality of the device under test based on the detected voltage, wherein the coaxial cable unit includes a first coaxial cable including a first internal conductor and a first external conductor, and a second coaxial cable including a second internal conductor and a second external conductor, wherein the first internal conductor and the second external conductor conduct a current from the power source towards the device under test, and the first external conductor and the second internal conductor conduct a current from the device under test towards the power source.
摘要翻译：一种用于测试被测设备的测试装置，包括用于产生电流的电源，用于将电流提供给被测器件的同轴电缆单元，检测单元，用于当电流为待测器件时检测施加到被测器件的电压提供给被测设备，以及判断单元，用于基于检测到的电压来判定被测设备的质量，其中同轴电缆单元包括包括第一内部导体和第一外部导体的第一同轴电缆和第二同轴电缆包括第二内部导体和第二外部导体，其中所述第一内部导体和所述第二外部导体将来自所述电源的电流传导到被测设备，并且所述第一外部导体和所述第二内部导体从所述装置传导电流正在对电源进行测试。

5. 发明授权

US08368366B2 Driver circuit and test apparatus 失效
标题翻译：驱动电路和测试仪器
公开(公告)号：US08368366B2
公开(公告)日：2013-02-05
申请号：US12553755
申请日：2009-09-03
申请人： Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
发明人： Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
IPC分类号： G05F1/40
CPC分类号： H03F3/45
摘要： Provided is a driver circuit that outputs, from an output end, an output signal corresponding to an input signal supplied thereto, comprising an output resistance section that is provided between a constant voltage source and the output end; an output switching section that switches voltage of the output end according to the input signal; and a switching section that switches a resistance value of the output resistance section. The output resistance section includes an output resistance FET having a source/drain connection between the constant voltage source and the output end, and the switching section supplies a control voltage to a gate of the output resistance FET such that the resistance between the source and the drain of the output resistance FET switches to a designated value.
摘要翻译：提供了一种从输出端输出与提供给其的输入信号相对应的输出信号的驱动器电路，包括设置在恒定电压源和输出端之间的输出电阻部分; 输出切换部，其根据输入信号切换输出端的电压; 以及切换部，切换输出电阻部的电阻值。输出电阻部分包括在恒定电压源和输出端之间具有源极/漏极连接的输出电阻FET，并且开关部分向输出电阻FET的栅极提供控制电压，使得源极和源极之间的电阻输出电阻FET的漏极切换到指定值。

6. 发明授权

US08410817B2 Driver circuit 失效
标题翻译：驱动电路
公开(公告)号：US08410817B2
公开(公告)日：2013-04-02
申请号：US12858295
申请日：2010-08-17
申请人： Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
发明人： Yuji Kuwana , Naoki Matsumoto , Yasuhiro Urabe
IPC分类号： H03K19/0175 , H03B1/00
CPC分类号： H03K19/001 , H03K17/04126 , H03K19/0136 , H03K2217/0036
摘要： A level switch circuit receives a digital input signal, and generates a level signal having a voltage level that corresponds to the value of the input signal thus received. A buffer circuit receives a level signal, and outputs the level signal via an output terminal thereof. A bias current generating circuit generates a bias current including a DC component having a constant level and a variable component that changes according to the input signal, and supplies the bias current thus generated to a buffer circuit. The bias current generating circuit detects an edge of the input signal, and raises the bias current by a predetermined amount for a predetermined period of time after the edge thus detected.
摘要翻译：电平开关电路接收数字输入信号，并产生具有与所接收的输入信号的值对应的电压电平的电平信号。缓冲电路接收电平信号，并通过其输出端输出电平信号。偏置电流产生电路产生包括具有恒定电平的DC分量和根据输入信号而变化的可变分量的偏置电流，并将由此产生的偏置电流提供给缓冲电路。偏置电流产生电路检测输入信号的边缘，并且在如此检测到的边缘之后的预定时间段内将偏置电流提高预定量。

7. 发明授权

US08013626B2 Test apparatus and driver circuit 有权
标题翻译：测试设备和驱动电路
公开(公告)号：US08013626B2
公开(公告)日：2011-09-06
申请号：US12414681
申请日：2009-03-31
申请人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
发明人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
IPC分类号： G01R31/02 , G01R31/26
CPC分类号： G01R31/31924 , H04L25/0278
摘要： Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern and supplies the output signal to the device under test; and a measuring section that judges acceptability of the device under test by measuring a response signal output by the device under test. The driver circuit includes an input terminal that receives the input pattern; a switching section that operates according to a logic value of the input pattern to generate the output signal; and an emphasized component generating section that is provided between the input terminal and the switching section, and that (i) generates an emphasized component according to a prescribed high frequency component of the input pattern and (ii) superimposes the emphasized component onto a voltage supplied to the switching section.
摘要翻译：提供了一种测试被测设备的测试装置，包括根据规定的输入模式生成输出信号的驱动电路，并将输出信号提供给被测器件; 以及测量部，其通过测量被测设备输出的响应信号来判断被测设备的可接受性。驱动器电路包括接收输入图案的输入端子; 切换部，其根据所述输入图案的逻辑值进行动作，生成所述输出信号; 以及设置在所述输入端子和所述开关部分之间的强调分量产生部分，以及（i）根据所述输入图案的规定的高频分量产生强调分量，以及（ii）将所述强调分量叠加到所提供的电压到切换部分。

8. 发明申请

US20100244880A1 TEST APPARATUS AND DRIVER CIRCUIT 失效
标题翻译：测试装置和驱动电路
公开(公告)号：US20100244880A1
公开(公告)日：2010-09-30
申请号：US12412364
申请日：2009-03-27
申请人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
发明人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
IPC分类号： G01R31/26 , H03B1/00
CPC分类号： G01R31/2889 , G01R31/31924
摘要： Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern, and supplies the output signal to the device under test; and a measuring section that measures a response signal output by the device under test to judge the acceptability of the device under test, wherein the driver circuit includes an input gate drive section that selects one of a plurality of input drive voltages supplied thereto, according to a logic value of the input pattern, and outputs the selected input drive voltage; a voltage switching section that includes a transistor and that outputs the output signal according to the drain voltage of the transistor, the transistor having a gate terminal that receives the input drive voltage output by the input gate drive section and a source terminal to which is applied a prescribed reference voltage; and an input drive voltage supplying section that generates the input drive voltages according to the reference voltage, and supplies the input drive voltages to the input gate drive section.
摘要翻译：提供了一种测试被测设备的测试装置，包括根据规定的输入模式产生输出信号的驱动电路，并将输出信号提供给被测器件; 以及测量部，其测量由所述被测设备输出的响应信号，判断被测设备的可接受性，其中，所述驱动电路包括：输入栅极驱动部，其根据所述输入栅极驱动部选择供给的多个输入驱动电压中的一个，输入图案的逻辑值，并输出所选择的输入驱动电压; 电压切换部，其包括晶体管，并且根据所述晶体管的漏极电压输出所述输出信号，所述晶体管具有接收由所述输入栅极驱动部输出的输入驱动电压的栅极端子和施加到所述输入栅极驱动部的源极端子规定的参考电压; 以及输入驱动电压供给部，其根据所述基准电压生成所述输入驱动电压，并将所述输入驱动电压提供给所述输入栅极驱动部。

9. 发明授权

US07795897B1 Test apparatus and driver circuit 失效
标题翻译：测试设备和驱动电路
公开(公告)号：US07795897B1
公开(公告)日：2010-09-14
申请号：US12412364
申请日：2009-03-27
申请人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
发明人： Yasuhiro Urabe , Naoki Matsumoto , Yuji Kuwana
IPC分类号： G01R31/26
CPC分类号： G01R31/2889 , G01R31/31924
摘要： Provided is a test apparatus that tests a device under test, comprising a driver circuit that generates an output signal according to a prescribed input pattern, and supplies the output signal to the device under test; and a measuring section that measures a response signal output by the device under test to judge the acceptability of the device under test, wherein the driver circuit includes an input gate drive section that selects one of a plurality of input drive voltages supplied thereto, according to a logic value of the input pattern, and outputs the selected input drive voltage; a voltage switching section that includes a transistor and that outputs the output signal according to the drain voltage of the transistor, the transistor having a gate terminal that receives the input drive voltage output by the input gate drive section and a source terminal to which is applied a prescribed reference voltage; and an input drive voltage supplying section that generates the input drive voltages according to the reference voltage, and supplies the input drive voltages to the input gate drive section.
摘要翻译：提供了一种测试被测设备的测试装置，包括根据规定的输入模式产生输出信号的驱动电路，并将输出信号提供给被测器件; 以及测量部，其测量由所述被测设备输出的响应信号，判断被测设备的可接受性，其中，所述驱动电路包括：输入栅极驱动部，其根据所述输入栅极驱动部选择供给的多个输入驱动电压中的一个，输入图案的逻辑值，并输出所选择的输入驱动电压; 电压切换部，其包括晶体管，并且根据所述晶体管的漏极电压输出所述输出信号，所述晶体管具有接收由所述输入栅极驱动部输出的输入驱动电压的栅极端子和施加到所述输入栅极驱动部的源极端子规定的参考电压; 以及输入驱动电压供给部，其根据所述基准电压生成所述输入驱动电压，并将所述输入驱动电压提供给所述输入栅极驱动部。

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