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    • 4. 发明授权
    • Tactile messaging system
    • 触觉信息系统
    • US08344862B1
    • 2013-01-01
    • US13442154
    • 2012-04-09
    • John Donham
    • John Donham
    • H04B3/26
    • H04M1/72547H04M19/04H04M2250/22
    • The disclosure relates to a tactile messaging system configured to send tactile messages between users. The system may be configured so a first user may input tactile information into a first wearable tactile user device and a second user may receive sensory output from a second tactile user device that corresponds to the tactile information entered by the first user into the first tactile user device. This may allow users to communicate by touch, without having to manually enter electronic input information into the system.
    • 本公开涉及被配置为在用户之间发送触觉消息的触觉消息收发系统。 该系统可以被配置成使得第一用户可以将触觉信息输入到第一可穿戴触觉用户设备中,并且第二用户可以从第二触觉用户设备接收对应于由第一用户输入到第一触觉用户的触觉信息的感觉输出 设备。 这可以允许用户通过触摸进行通信,而无需手动将电子输入信息输入到系统中。
    • 5. 发明授权
    • Device and method for measuring jitter
    • 用于测量抖动的装置和方法
    • US07558991B2
    • 2009-07-07
    • US11440441
    • 2006-05-25
    • Heinz MattesSebastian Sattler
    • Heinz MattesSebastian Sattler
    • G11B20/20G01R31/28G01R29/26H04B3/26
    • H04L1/205G01R31/31709H04B3/462H04B14/044H04B17/364H04J2203/0062
    • A test device contains a data pattern generator for providing a delta-sigma-modulated data stream sampled with a sampling frequency fs at its output. A phase modulator generates a test clock subjected to jitter and having the clock frequency ft at its output. The output of the data pattern generator is connected to a terminal for connection to a data input of a semiconductor component to be tested. The output of the phase modulator is connected to a terminal for connection to a clock input of a semiconductor component to be tested. An evaluation device determines the jitter parameters of the input signal at the input of the data device from the low-frequency component of the input signal. In this case, the low-frequency component contains only frequency components of frequencies which are less than half the sampling frequency fs/2.
    • 测试装置包含一个数据模式发生器,用于提供在其输出端以采样频率fs采样的Δ-Σ调制数据流。 相位调制器产生经受抖动的测试时钟,并在其输出端具有时钟频率ft。 数据模式发生器的输出端连接到用于连接到要测试的半导体元件的数据输入端的端子。 相位调制器的输出连接到用于连接到要测试的半导体部件的时钟输入的端子。 评估装置从输入信号的低频分量确定数据装置的输入处的输入信号的抖动参数。 在这种情况下,低频分量仅包含小于采样频率fs / 2的一半的频率的频率分量。