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    • 6. 发明授权
    • Method of manufacturing silicon monocrystal by continuously charged
Czochralski method
    • 通过连续充电的Czochralski法制造单晶硅的方法
    • US5900055A
    • 1999-05-04
    • US829894
    • 1997-03-25
    • Naoki NagaiKoji MizuishiMichiaki Oda
    • Naoki NagaiKoji MizuishiMichiaki Oda
    • C30B15/04C30B29/06H01L21/208C30B15/02
    • C30B15/04Y10T117/1052Y10T117/1056
    • A silicon monocrystal is manufactured according to the continuously charged Czochralski method in which a double crucible is used which includes an outer crucible and an inner crucible which communicate with each other through pores. A dopant is charged to the silicon melt stored in the double crucible before commencing pulling of a silicon monocrystal such that the ratio of the dopant concentration of the silicon melt stored in the outer crucible to the dopant concentration of the silicon melt stored in the inner crucible becomes greater than an effective segregation coefficient of the dopant. The silicon monocrystal is then pulled while silicon material is charged to the silicon melt within the outer crucible, during which the dopant concentration ratio becomes equal to the effective segregation coefficient and then becomes smaller than the effective segregation coefficient. When the dopant concentration ratio becomes smaller than the effective segregation coefficient, the dopant is charged to the silicon melt stored in the outer crucible. The above operation is repeated, so that the specific resistance of the silicon monocrystal pulled from the double crucible can be controlled within a desired range using commonly-employed dopant.
    • 根据连续充电的Czochralski法制造硅单晶,其中使用包括通过孔彼此连通的外坩埚和内坩埚的双坩埚。 在开始拉制硅单晶之前,将掺杂剂充入存储在双坩埚中的硅熔体,使得存储在外坩埚中的硅熔体的掺杂剂浓度与存储在内坩埚中的硅熔体的掺杂剂浓度之比 变得大于掺杂剂的有效偏析系数。 然后拉伸硅单晶,同时将硅材料充入外坩埚内的硅熔体,在此期间掺杂剂浓度比变得等于有效偏析系数,然后变得小于有效偏析系数。 当掺杂剂浓度比变得小于有效偏析系数时,掺杂剂被加到存储在外坩埚中的硅熔体中。 重复上述操作,使得从双坩埚拉出的单晶硅的电阻率可以使用常用的掺杂剂控制在期望的范围内。
    • 9. 发明授权
    • Method and apparatus for producing a Czochralski growth semiconductor
single-crystal
    • 生产Czochralski生长半导体单晶的方法和设备
    • US5419277A
    • 1995-05-30
    • US191658
    • 1994-02-04
    • Masahiko UranoMichiaki Oda
    • Masahiko UranoMichiaki Oda
    • C30B15/26C30B27/02H01L21/208C30B35/00
    • C30B15/26Y10T117/1004Y10T117/1068
    • An apparatus for producing a semiconductor single-crystal grown by the Czochralski method includes a reference reflector disposed at the lower end of a gas rectifying tube, first and second optical systems disposed above the reference reflector for changing the direction of propagation of light from the horizontal to the vertical, and vice versa, a first position sensor composed of a first light source for emitting a light beam in a horizontal direction toward the first optical system, and a first photosensitive member which receives a reflection light reflected from the melt surface in a crucible, a second position sensor composed of a second light source for emitting a light beam in a horizontal direction toward the second optical system, and a second photosensitive member which receives a reflection light reflected from the reference reflector. With this construction, the distance between the gas rectifying tube and the melt surface can be detected and maintained constant throughout the crystal growth process with the result that the crystal quality, especially the concentration of dopant and impurities, such as oxygen and carbon, is uniform.
    • 用于制造通过切克劳斯基法生长的半导体单晶的装置包括设置在气体整流管的下端的参考反射器,设置在参考反射器上方的第一和第二光学系统,用于改变来自水平面的光的传播方向 第一位置传感器,由第一光源构成,该第一光源用于向第一光学系统沿水平方向发射光束;以及第一感光部件,其接收从熔融表面反射的反射光, 坩埚,由第二光源组成的第二位置传感器,用于沿水平方向朝向第二光学系统发射光束;以及第二感光部件,其接收从参考反射器反射的反射光。 利用这种结构,可以在整个晶体生长过程中检测并保持气体整流管和熔体表面之间的距离,结果是晶体质量,特别是掺杂剂和杂质如氧和碳的浓度是均匀的 。