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    • 9. 发明授权
    • Power amplifier with multiple power supplies
    • US06825726B2
    • 2004-11-30
    • US09902708
    • 2001-07-12
    • John Barry FrenchCharles Robert May
    • John Barry FrenchCharles Robert May
    • H03F304
    • H03F1/025H03F1/0227H03F1/0238H03F1/0255
    • A power amplifier for receiving an input signal and providing a corresponding amplified output signal. One embodiment of the power amplifier includes a positive half circuit for supplying power to an amplifier during positive half waves of the output signal and a negative half circuit for supplying power to the amplifier during negative half waves of the output signal. Each half circuit has a main power supply, which is typically a switching regulator, and which supplies a first power signal to the amplifier. The slew rate of this first power signal is intentionally limited to control EMI emissions. Each half circuit also has a transient power supply which may be selectively engaged to provide a second power signal to the amplifier when the first power signal is insufficient to power the amplifier. Each half circuit may also include a low voltage power supply which provides a third power signal to the amplifier, allowing the main power supply to be disabled when a low power level is required, further reducing EMI emissions. Each half circuit has a control circuit which regulates the power output from the main and transient power supplies. The control circuit may provide a pulse width modulated control signal or a pulse density modulated control signal to control the switching regulator. If a pulse density control signal is provided, the switching regulator may be a resonant switching regulator. The power amplifier may be modified for use with a bridge amplifier, with multiple channels and may incorporate an overload detection circuit. In another embodiment of power amplifier the transient power supply is replaced with a transient control circuit that, when the first power supply is insufficient to power the amplifier, temporarily forces the first power supply to a 100% duty cycle, and then for a longer period, increases the duty cycle from its normal level to allow the first power supply to adequately power the amplifier more quickly.
    • 10. 发明授权
    • Method and apparatus for focussing and declustering trace ions
    • 用于聚焦和分解微量离子的方法和装置
    • US4121099A
    • 1978-10-17
    • US790216
    • 1977-04-25
    • John Barry FrenchNeil M. ReidJanette A. Buckley
    • John Barry FrenchNeil M. ReidJanette A. Buckley
    • G01N27/64G01N27/68G01N33/00H01J49/04B01D59/44
    • H01J49/067G01N27/64G01N27/68H01J49/0422
    • A method and apparatus for focussing and declustering trace ions travelling from a gas through an orifice into a vacuum chamber and to a mass analyzer in the vacuum chamber. Advantage is taken of the free jet expansion of the gas into the vacuum chamber by applying an electric focussing field in a specific region of the free jet. The region is selected sufficiently close to the orifice that the gas density limits the kinetic energy spread which the ions can acquire under the applied field, typically to 2 ev or less, while the early focussing increases the available ion signal. Declustering can be collision induced in the region by providing a field in the region sufficient to impart an internal energy of between 0.1 and 1.5 ev to ions in the region. The kinetic energy which the ions can acquire under the applied field is still limited by the density of the gas in the free jet, so that the kinetic energy spread which the ions can acquire is still limited. Preferably the focussing and declustering fields are produced by a single conical tapered lens element located at distance X.sub.l from the orifice, where ##EQU1## and D is the orifice diameter, for atmospheric pressure and room temperature source conditions. The electric field between the lens element and the mass spectrometer is then controlled to limit the energy spread imparted to the ions in their travel from the lens elements to the mass spectrometer.
    • 一种用于将从气体通过孔传播到真空室中的痕量离子聚焦和去聚簇的方法和装置,以及真空室中的质量分析器。 通过在自由射流的特定区域中施加电聚焦场,将气体自由射流膨胀到真空室中的优点。 该区域被选择为足够靠近孔口,气体密度限制了在施加场下离子可以获得的动能扩散,通常为2ev或更小,同时早期聚焦增加了可用的离子信号。 在该区域中,通过在该区域内提供足以赋予0.1至1.5ev内部能量的离子的区域中的场,可以使该区域中的碰撞引发碰撞。 在施加场下离子可以获得的动能仍然受到自由射流中气体密度的限制,使离子可以获得的动能扩散仍然受到限制。 优选地,聚焦和去聚簇场由位于孔口距离X1处的单个锥形锥形透镜元件产生,其中和D是孔直径,用于大气压力和室温源条件。 然后控制透镜元件和质谱仪之间的电场,以限制在从透镜元件到质谱仪的行进中赋予离子的能量扩展。