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    • 4. 发明授权
    • Programming method for non-volatile memory device
    • 非易失性存储器件的编程方法
    • US08116131B2
    • 2012-02-14
    • US12264353
    • 2008-11-04
    • Ki-tae ParkYeong-taek Lee
    • Ki-tae ParkYeong-taek Lee
    • G11C11/34
    • G11C16/3418
    • Provided is a method of programming a non-volatile memory device. The method includes applying a first programming pulse to a corresponding wordline of the non-volatile memory device, applying a second programming pulse to the wordline, wherein a voltage of the second programming pulse is different from that of the first programming pulse, and applying voltages to each bitline connected to the wordline, the voltages applied to each of the bitlines are different from each other according to a plurality of bit values to be programmed to corresponding memory cells in response to the first programming pulse or the second programming pulse.
    • 提供了一种对非易失性存储器件进行编程的方法。 该方法包括将第一编程脉冲施加到非易失性存储器件的对应字线,向第二编程脉冲施加第二编程脉冲,其中第二编程脉冲的电压与第一编程脉冲的电压不同,并施加电压 对于连接到字线的每个位线,施加到每个位线的电压根据要响应于第一编程脉冲或第二编程脉冲被编程到相应存储器单元的多个位值而彼此不同。
    • 8. 发明授权
    • Programming method for non-volatile memory device
    • 非易失性存储器件的编程方法
    • US08411501B2
    • 2013-04-02
    • US13372525
    • 2012-02-14
    • Ki-tae ParkYeong-taek Lee
    • Ki-tae ParkYeong-taek Lee
    • G11C11/34
    • G11C16/3418
    • Provided is a method of programming a non-volatile memory device. The method includes applying a first programming pulse to a corresponding wordline of the non-volatile memory device, applying a second programming pulse to the wordline, wherein a voltage of the second programming pulse is different from that of the first programming pulse, and applying voltages to each bitline connected to the wordline, the voltages applied to each of the bitlines are different from each other according to a plurality of bit values to be programmed to corresponding memory cells in response to the first programming pulse or the second programming pulse.
    • 提供了一种对非易失性存储器件进行编程的方法。 该方法包括将第一编程脉冲施加到非易失性存储器件的对应字线,向第二编程脉冲施加第二编程脉冲,其中第二编程脉冲的电压与第一编程脉冲的电压不同,并施加电压 对于连接到字线的每个位线,施加到每个位线的电压根据要响应于第一编程脉冲或第二编程脉冲被编程到相应存储器单元的多个位值而彼此不同。
    • 9. 发明授权
    • Programming and reading five bits of data in two non-volatile memory cells
    • 在两个非易失性存储单元中编程和读取五位数据
    • US07911835B2
    • 2011-03-22
    • US11859465
    • 2007-09-21
    • Doo-gon KimKi-tae ParkYeong-taek Lee
    • Doo-gon KimKi-tae ParkYeong-taek Lee
    • G11C16/04
    • G11C16/10G11C11/5628
    • Non-volatile memory devices and methods of programming the non-volatile memory devices use six threshold voltage levels. Data also may be read from the non-volatile memory devices. The non-volatile memory devices include a first non-volatile memory cell and a second non-volatile memory cell, each of which can be programmed with first through sixth threshold voltage levels that sequentially increase. Programming includes first, second and third data bit program operations. In the first and second data bit program operation, the first and second non-volatile memory cells are programmed with the first or second threshold voltage level in order to store first and second bits of data. In the third data bit program operation, the first non-volatile memory cell is programmed with the third or fourth threshold voltage level according to the first and second bits of the data in order to store a third bit of the data. Fourth and fifth data bit program operations also may be provided.
    • 非易失性存储器件和非易失性存储器件的编程方法使用六个阈值电压电平。 也可以从非易失性存储器件读取数据。 非易失性存储器件包括第一非易失性存储器单元和第二非易失性存储器单元,其中每一个都可以用顺序增加的第一至第六阈值电压电平进行编程。 编程包括第一,第二和第三数据位程序操作。 在第一和第二数据位编程操作中,第一和第二非易失性存储单元用第一或第二阈值电压电平进行编程,以便存储第一和第二位数据。 在第三数据比特编程操作中,根据数据的第一和第二比特,第一非易失性存储单元用第三或第四阈值电压电平进行编程,以便存储数据的第三位。 也可以提供第四和第五数据位程序操作。
    • 10. 发明申请
    • PROGRAMMING AND READING FIVE BITS OF DATA IN TWO NON-VOLATILE MEMORY CELLS
    • 在两个非易失性记忆细胞中编程和读取数据的五个位
    • US20080084740A1
    • 2008-04-10
    • US11859465
    • 2007-09-21
    • Doo-gon KimKi-tae ParkYeong-taek Lee
    • Doo-gon KimKi-tae ParkYeong-taek Lee
    • G11C16/10
    • G11C16/10G11C11/5628
    • Non-volatile memory devices and methods of programming the non-volatile memory devices use six threshold voltage levels. Data also may be read from the non-volatile memory devices. The non-volatile memory devices include a first non-volatile memory cell and a second non-volatile memory cell, each of which can be programmed with first through sixth threshold voltage levels that sequentially increase. Programming includes first, second and third data bit program operations. In the first and second data bit program operation, the first and second non-volatile memory cells are programmed with the first or second threshold voltage level in order to store first and second bits of data. In the third data bit program operation, the first non-volatile memory cell is programmed with the third or fourth threshold voltage level according to the first and second bits of the data in order to store a third bit of the data. Fourth and fifth data bit program operations also may be provided.
    • 非易失性存储器件和非易失性存储器件的编程方法使用六个阈值电压电平。 也可以从非易失性存储器件读取数据。 非易失性存储器件包括第一非易失性存储器单元和第二非易失性存储器单元,其中每一个都可以用顺序增加的第一至第六阈值电压电平进行编程。 编程包括第一,第二和第三数据位程序操作。 在第一和第二数据位编程操作中,第一和第二非易失性存储单元用第一或第二阈值电压电平进行编程,以便存储第一和第二位数据。 在第三数据比特编程操作中,根据数据的第一和第二比特,第一非易失性存储单元用第三或第四阈值电压电平进行编程,以便存储数据的第三位。 也可以提供第四和第五数据位程序操作。