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    • 1. 发明授权
    • System and method for detecting repeating defects in a light-management film
    • 用于检测光管理膜中的重复缺陷的系统和方法
    • US07435986B2
    • 2008-10-14
    • US11609605
    • 2006-12-12
    • Kevin Patrick CapaldoMark ChevertonKevin George HardingRobert Tait
    • Kevin Patrick CapaldoMark ChevertonKevin George HardingRobert Tait
    • G01N21/86H01L27/00
    • G01N21/95G01N2021/9513
    • A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
    • 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机,其配置为从第一光源接收从第一预定区域反射的光的第一部分,以及从第二光源传播通过膜的光的第二部分。 最后,该系统包括可开启地耦合到第一照相机的信号处理设备,其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。
    • 2. 发明授权
    • System and method for detecting defects in a light-management film
    • 用于检测光管理膜中的缺陷的系统和方法
    • US07199386B2
    • 2007-04-03
    • US10710708
    • 2004-07-29
    • Kevin Patrick CapaldoMark ChevertonKevin George HardingRobert Tait
    • Kevin Patrick CapaldoMark ChevertonKevin George HardingRobert Tait
    • G01N21/86G01N21/00H01L27/00
    • G01N21/95G01N2021/9513
    • A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
    • 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机,其配置为从第一光源接收从第一预定区域反射的光的第一部分,以及从第二光源传播通过膜的光的第二部分。 最后,该系统包括可操作地耦合到第一照相机的信号处理设备,其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。
    • 3. 发明申请
    • System and method for inspection of films
    • 电影检查系统及方法
    • US20070115464A1
    • 2007-05-24
    • US11285332
    • 2005-11-21
    • Kevin HardingRobert TaitMark Cheverton
    • Kevin HardingRobert TaitMark Cheverton
    • G01N21/88
    • G01N21/958G01N2021/8825
    • Disclosed herein is a method for inspection of light management films with a plurality of light refractive surface structures, including positioning at least one illumination source, and at least one imaging device are configured to be in a substantially bright field configuration and imaging at least portion of the light management film to provide an acquired image, wherein light from the at least one illumination source is refracted by the film to produce a dark field image at the at least one imaging device. A system for inspection of light management films is also provided. The system includes at least one illumination source to illuminate a first side of the film, at least one imaging device to receive light refracted through an opposite side of the light management film, wherein the illumination source and the imaging device are configured to be in a substantially bright field configuration to acquire a dark field image, a processor-controller, and a computer-readable medium including instructions for automated defect detection. The fixture, the illumination source, the imaging device, the processor-controller and the computer readable medium are operably coupled for automated defect detection.
    • 本文公开了一种用于检查具有多个光折射表面结构的光管理膜的方法,包括定位至少一个照明源,并且至少一个成像装置被配置为处于基本上明亮的场配置并且成像至少部分 所述光管理膜提供获取的图像,其中来自所述至少一个照明源的光被所述胶片折射以在所述至少一个成像装置处产生暗视场图像。 还提供了一种用于检查光管理膜的系统。 所述系统包括至少一个照明源以照亮所述胶片的第一面,至少一个成像装置,用于接收通过所述光管理膜的相对侧折射的光,其中所述照明源和所述成像装置被配置为处于 用于获取暗视场图像的基本上明亮的场配置,处理器控制器和包括用于自动缺陷检测的指令的计算机可读介质。 固定装置,照明源,成像装置,处理器控制器和计算机可读介质可操作地耦合用于自动缺陷检测。
    • 4. 发明申请
    • SYSTEM AND METHOD FOR DETECTING DEFECTS IN A LIGHT-MANAGEMENT FILM
    • 用于检测光管理膜中的缺陷的系统和方法
    • US20070083577A1
    • 2007-04-12
    • US11609605
    • 2006-12-12
    • Kevin CapaldoMark ChevertonKevin HardingRobert Tait
    • Kevin CapaldoMark ChevertonKevin HardingRobert Tait
    • G06F15/00
    • G01N21/95G01N2021/9513
    • A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
    • 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机,其配置为从第一光源接收从第一预定区域反射的光的第一部分,以及从第二光源传播通过膜的光的第二部分。 最后,该系统包括可开启地耦合到第一照相机的信号处理设备,其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。
    • 5. 发明申请
    • SYSTEM AND METHOD FOR DETECTING DEFECTS IN A LIGHT-MANAGEMENT FILM
    • 用于检测光管理膜中的缺陷的系统和方法
    • US20060022156A1
    • 2006-02-02
    • US10710708
    • 2004-07-29
    • Kevin CapaldoMark ChevertonKevin HardingRobert Tait
    • Kevin CapaldoMark ChevertonKevin HardingRobert Tait
    • G01N21/88
    • G01N21/95G01N2021/9513
    • A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
    • 提供了一种用于检测光管理膜中的缺陷的系统和方法。 该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。 该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。 该系统还包括第一照相机,其配置为从第一光源接收从第一预定区域反射的光的第一部分,以及从第二光源传播通过膜的光的第二部分。 最后,该系统包括可操作地耦合到第一照相机的信号处理设备,其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。