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    • 3. 发明授权
    • Method of measuring a minute displacement
    • 测量微小位移的方法
    • US5315373A
    • 1994-05-24
    • US904730
    • 1992-06-26
    • Keishi KuboYoshihiro IkemotoTatsuo Itou
    • Keishi KuboYoshihiro IkemotoTatsuo Itou
    • G01B9/02G01B11/02G01B11/30G01B21/30G01C3/06G01N21/88G01N37/00G01Q20/02G01Q60/24G01Q70/02G01B7/34
    • G01Q20/02B82Y35/00G01B11/026G01B11/303
    • A method for detecting a minute displacement of a probe includes an emission from a light source of two light beams having different polarizing directions. The light beams are subsequently diverged by a first lens so as to pass through a beam splitter towards a separating prism. The light beams having passed through the prism are separated into first and second measuring beams which are subsequently focused by a second lens on first and second, spaced reflecting surfaces. The first and second measuring beams are then reflected by the first and second reflecting surfaces, respectively, so as to enter respective photodetectors after having passed through the separating prism, the beam splitter and a polarizing beam splitter for passing therethrough the first and second measuring beams or reflecting them depending on the polarizing direction of the incoming light. The first and second photodetectors outputs respective signals indicative of the associated positions of foci which are then processed by a signal processing circuit to provide an indication of the minute displacement of the probe.
    • 用于检测探头的微小位移的方法包括来自具有不同偏振方向的两个光束的光源的发射。 光束随后被第一透镜发散,以便穿过分束器朝向分离棱镜。 已经穿过棱镜的光束被分离成第一和第二测量光束,其随后由第二透镜聚焦在第一和第二间隔的反射表面上。 然后第一和第二测量光束分别被第一和第二反射表面反射,以便在穿过分离棱镜,分束器和偏振分束器之后进入相应的光电检测器,用于穿过第一和第二测量光束 或者根据入射光的偏振方向反射它们。 第一和第二光电检测器输出指示相关联的焦点位置的相应信号,然后由信号处理电路对其进行处理,以提供探针的微小位移的指示。
    • 4. 发明授权
    • Minute displacement detector using optical interferometry
    • 使用光学干涉测量的分位移检测器
    • US5164791A
    • 1992-11-17
    • US664623
    • 1991-03-04
    • Keishi KuboTatsuo Itou
    • Keishi KuboTatsuo Itou
    • G01B9/02G01B11/00G01D5/38G01Q10/00G01Q20/02G01Q60/24
    • G01D5/38B82Y35/00G01Q20/02
    • A displacement detector device has a source of laser beam; a diffraction grating for separating the laser beam into a plurality of beam components; a filter for shielding the beam components other than the two beam components of .+-. primary order produced by the diffraction grating; a wavelength plate operable to vary the polarized state of one of the two beam components of .+-. primary order; a lens element for focusing the two beam components of .+-. primary order on a displacement plane and a reference plane, respectively; and a photosensor. The two beam components of .+-. primary order focused on the reference and displacement planes, respectively, are subsequently reflected therefrom and are then collimated by the lens element after having again entered the lens element in substantially overlapped relationship. The two beam components emerging from the lens element are again diffracted by the diffraction grating, and the photosensor detects an interfering component of the beam components of primary order.
    • 位移检测器装置具有激光束源; 用于将激光束分离成多个光束分量的衍射光栅; 用于屏蔽由衍射光栅产生的+/-一级的两个光束分量以外的光束分量的滤光器; 波长板,其可操作以改变+/-一阶的两个光束分量之一的偏振状态; 一个透镜元件,分别用于将+/-一级的两个光束分量聚焦在位移平面和参考平面上; 和光电传感器。 分别聚焦在参考位移平面上的+/-一级的两个光束分量随后从其反射,然后在基本上重叠的关系再次进入透镜元件之后被透镜元件准直。 从透镜元件出射的两个光束分量再次被衍射光栅衍射,并且光电传感器检测一阶光束分量的干扰分量。
    • 8. 发明授权
    • Heat-sensitive recording material
    • 热敏记录材料
    • US4513052A
    • 1985-04-23
    • US552847
    • 1983-11-16
    • Keishi KuboEiichi Kawamura
    • Keishi KuboEiichi Kawamura
    • B41M5/30B41M5/327B41M5/337B05D3/06
    • B41M5/3375B41M5/327B41M5/3275Y10S428/913Y10S428/914Y10T428/273
    • A heat-sensitive recording material comprising a support and a heat-sensitive color forming layer formed on said support that comprises a colorless or pale-color leuco dye and an acidic material capable of making said leuco dye develop color when heated, wherein said heat-sensitive color forming layer further comprises at least one of the compounds which are expressed by the following general formulas (I), (II) or (III): ##STR1## (wherein X.sup.1 represents a hydrogen atom or a halogen atom; Y.sup.1 represents an alkyl group, an alkoxy group, a halogen atom, a benzyl group, a hydroxyl group, a carboxyl group or an allyl group; m and n are each an integer ranging from 1 to 3, respectively; and X.sup.1 and Y.sup.1 may be either identical or different from each other when m or n is an integer of 2 or more) ##STR2## (wherein X.sup.2 represents a hydrogen atom or a halogen atom; Y.sup.2 represents a hydrogen atom, an alkyl group, an alkoxy group, a halogen atom, a benzyl group, a hydroxyl group, a carboxyl group or an allyl group; m and n are each an integer ranging from 1 to 3, respectively; and X.sup.2 and Y.sup.2 may be either identical or different from each other when m or n is an integer of 2 or more) ##STR3## [wherein X.sup.2, Y.sup.2, n and m are respectively the same as in the foregoing general formula (II).]
    • 一种热敏记录材料,其包括形成在所述载体上的载体和热敏颜色形成层,其包含无色或浅色无色染料和能够使所述无色染料在加热时显色的酸性物质, 敏感色素形成层还包含由以下通式(I),(II)或(III)表示的化合物中的至少一种:其中X 1表示氢原子或卤原子; Y1表示烷基,烷氧基,卤素原子,苄基,羟基,羧基或烯丙基; m和n分别为1〜3的整数,X1和Y1可以 (II)(其中X 2表示氢原子或卤素原子; Y 2表示氢原子,烷基,烷氧基 基团,卤素原子,苄基,羟基,羧基 或烯丙基; m和n分别为1至3的整数; (III)其中X2,Y2,n和m分别与前述通式(1)中相同或不同, (二)。
    • 10. 发明授权
    • Configuration measuring method and apparatus for optically detecting a
displacement of a probe due to an atomic force
    • 用于光学地检测由原子力引起的探头位移的配置测量方法和装置
    • US5616916A
    • 1997-04-01
    • US563071
    • 1995-11-27
    • Koji HandaKeishi KuboMasateru DoiKeiichi Yoshizumi
    • Koji HandaKeishi KuboMasateru DoiKeiichi Yoshizumi
    • G01B11/00G01B21/30G01H9/00G01H17/00G01N37/00G01Q10/04G01Q20/02G01Q20/04G01Q60/24G01Q80/00G02B21/00H01J37/28H01J3/14
    • G01Q60/38B82Y35/00G01H9/00G01Q10/04G01Q30/025G02B21/0004Y10S977/87
    • Substantially collimated displacement detection light is led to a first lens and condensed by the first lens to proximities to a reflecting surface of a probe. The reflected light is displaced by an atomic force acting against a surface of a sample, where the reflected light varies in reflection angle according to the displacement. The displaced light is lead to the first lens, changed in direction by a mirror, and detected by magnifying the displacement of the probe. The detection further includes steps of moving a Z direction scan block in a direction vertical to the sample surface by a Z direction driving device, the Z direction scan block having the first lens and the probe, moving an X direction scan block in a first axial direction within a plane parallel to the sample surface by an X direction driving device, the X direction scan block having the Z direction scan block, the Z direction driving device, and the mirror, and moving a Y direction scan block by a Y direction driving device in a second axial direction perpendicular to the first axial direction within a plane parallel to the sample surface, the Y direction scan block having the X direction scan block, the X direction driving device, the detection light radiation system, and the displacement detection system.
    • 基本上准直的位移检测光被引导到第一透镜,并且被第一透镜聚光到探针的反射表面。 反射光被作用在样品表面上的原子力移位,其中反射光根据位移以反射角度变化。 偏移的光线通过第一透镜,通过镜子改变方向,并且通过放大探针的位移来检测。 该检测还包括以下步骤:通过Z方向驱动装置使Z方向扫描块沿垂直于样品表面的方向移动,Z方向扫描块具有第一透镜和探头,沿X方向扫描块移动第一轴向 通过X方向驱动装置在与样品表面平行的平面内的方向,具有Z方向扫描块的X方向扫描块,Z方向驱动装置和反射镜,并且通过Y方向驱动来移动Y方向扫描块 在垂直于第一轴向的第二轴向方向的平面内的装置,具有X方向扫描块的Y方向扫描块,X方向驱动装置,检测光辐射系统和位移检测系统 。