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    • 2. 发明申请
    • LOW-POWER VOLTAGE REFERENCE CIRCUIT
    • 低功耗电压参考电路
    • US20130120050A1
    • 2013-05-16
    • US13293850
    • 2011-11-10
    • Wuyang HAOJungwon Suh
    • Wuyang HAOJungwon Suh
    • H03K17/14
    • G05F3/242
    • Methods and apparatus for a providing temperature-compensated reference voltage are provided. In an example, a temperature-compensated voltage reference circuit includes a current mirror portion and a temperature-compensated output portion coupled to the current mirror portion. The temperature-compensated output portion comprises a very low threshold voltage (Vt) transistor coupled in series with a negative temperature coefficient transistor. The output portion can further include a positive temperature coefficient element coupled in series with the very low Vt transistor. The positive temperature coefficient element can be an adjustable resistive element. The output portion can further include an output transistor having a gate coupled to the current mirror portion and coupled between a supply voltage and the positive temperature coefficient element. The very low Vt transistor can be a substantially zero Vt n-channel metal-oxide-semiconductor (NMOS) transistor, and can be coupled in a diode configuration.
    • 提供了提供温度补偿参考电压的方法和装置。 在一个示例中,温度补偿电压参考电路包括耦合到电流镜部分的电流镜部分和温度补偿输出部分。 温度补偿输出部分包括与负温度系数晶体管串联耦合的非常低的阈值电压(Vt)晶体管。 输出部分还可以包括与极低Vt晶体管串联耦合的正温度系数元件。 正温度系数元件可以是可调电阻元件。 输出部分还可以包括输出晶体管,其具有耦合到电流镜部分并且耦合在电源电压和正温度系数元件之间的栅极。 非常低的Vt晶体管可以是基本为零的Vt n沟道金属氧化物半导体(NMOS)晶体管,并且可以以二极管配置耦合。
    • 6. 发明申请
    • Sensing Current Recycling Method During Self-Refresh
    • 自刷新期间感应当前回收方法
    • US20070140032A1
    • 2007-06-21
    • US11677457
    • 2007-02-21
    • Jungwon Suh
    • Jungwon Suh
    • G11C7/00
    • G11C11/40615G11C7/12G11C11/406G11C11/4094
    • A bit line sensing scheme is provided for a semiconductor memory device that significantly reduces current drain during a self-refresh mode. After bit line sensing of a selected wordline and deactivation of the selected wordline, a capacitor is connected to a source node associated with a bit line sensing amplifier for the selected wordline to charge the capacitor with charge remaining on the bit line. Then, during the next activate-precharge cycle for another selected wordline, the capacitor is coupled to the source node of a bit line sensing amplifier associated with another selected wordline to discharge charge stored by the capacitor to the bit line associated with said other selected wordline. Thus, charge is returned from the bit line to the capacitor. This is where the self-refresh current reduction is achieved.
    • 为半导体存储器件提供位线检测方案,其在自刷新模式期间显着减少电流消耗。 在对所选择的字线进行位线检测和停用所选择的字线之后,将电容器连接到与用于选定字线的位线检测放大器相关联的源节点,以对位线上剩余电荷充电电容器。 然后,在下一个激活预充电循环期间,对于另一个选定的字线,电容器耦合到与另一选定字线相关联的位线感测放大器的源节点,以将由电容器存储的电荷放电到与所述另一选定字线相关联的位线 。 因此,电荷从位线返回到电容器。 这是实现自刷新电流降低的地方。
    • 8. 发明申请
    • Circuit including a deskew circuit
    • 电路包括一个歪斜电路
    • US20060242448A1
    • 2006-10-26
    • US11111140
    • 2005-04-21
    • Alessandro MinzoniJungwon Suh
    • Alessandro MinzoniJungwon Suh
    • G06F1/04
    • G06F1/10H03K5/06
    • A circuit including a deskew circuit. The deskew circuit is configured to receive a first signal having a first edge delayed from a second edge of a second signal by a first delay and a third edge delayed from a fourth edge of the second signal by a second delay. The deskew circuit is configured to provide a third signal having a first deskewed edge delayed from the first edge by a third delay and a second deskewed edge delayed from the third edge by a fourth delay. The difference between the fourth delay and the third delay is substantially equal to the difference between the first delay and the second delay.
    • 包括歪斜电路的电路。 歪斜电路被配置为接收具有从第二信号的第二边缘延迟的第一边缘第一延迟的第一信号和从第二信号的第四边缘延迟第二延迟的第三边沿。 该去歪斜电路被配置为提供具有从第一边缘延迟了第三延迟的第一偏斜偏移边缘和从第三边缘延迟第四延迟的第二偏斜边缘的第三信号。 第四延迟和第三延迟之间的差异基本上等于第一延迟和第二延迟之间的差。
    • 9. 发明授权
    • Voltage down converter for low voltage operation
    • 降压转换器用于低电压工作
    • US06861872B2
    • 2005-03-01
    • US10358581
    • 2003-02-05
    • Jungwon Suh
    • Jungwon Suh
    • H03K19/0185H04L25/02H03K19/0175
    • H03K19/018578
    • A voltage down converter for a semiconductor memory device to convert an external voltage to a lower value internal voltage for the device, has a voltage generator that produces a reference voltage corresponding to the value of the internal voltage, a comparator having opposite polarity inputs for producing an amplified output control signal, and a pull-up device operating from the external voltage that receives the control signal from the comparator to produce the internal voltage as an input. A dual source follower is located between the reference voltage generator and comparator and has two sections having cross-coupled inputs which respectively receive the internal reference voltage and the internal voltage to produce output voltages moving in opposite directions, each of which is applied to one input of the comparator, thereby translating the difference between Vintref and Vint to a level in a range that can be better amplified by the comparator.
    • 用于将外部电压转换为器件的较低值内部电压的半导体存储器件的降压转换器具有产生与内部电压值相对应的参考电压的电压发生器,具有相反极性输入的比较器,用于产生 放大的输出控制信号和从外部电压工作的上拉装置,其接收来自比较器的控制信号以产生内部电压作为输入。 双源极跟随器位于参考电压发生器和比较器之间,并且具有两个部分,其交叉耦合输入分别接收内部参考电压和内部电压,以产生沿相反方向移动的输出电压,每个输入电压施加到一个输入端 的比较器,从而将Vintref和Vint之间的差异转换为可以被比较器更好地放大的范围内的电平。