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1. 发明申请

US20080072450A1 CLOGGING DETECTING SYSTEM FOR DRYER 有权
标题翻译：干燥机检测系统
公开(公告)号：US20080072450A1
公开(公告)日：2008-03-27
申请号：US11849531
申请日：2007-09-04
申请人： Yang-hwan KIM , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
发明人： Yang-hwan KIM , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
IPC分类号： F26B13/10
CPC分类号： D06F58/28
摘要： The present invention discloses a clogging detecting system for a dryer which can display a clogging degree or state of an air passage to the user through a remote controlling device. The clogging detecting system for the dryer includes the dryer for judging the clogging degree of the air passage, and sending the clogging degree to a remote controlling device, and the remote controlling device for receiving the clogging degree from the dryer, and displaying the clogging degree through a display unit.
摘要翻译：本发明公开了一种用于干燥器的堵塞检测系统，其可以通过远程控制装置向用户显示空气通道的堵塞程度或状态。用于干燥机的堵塞检测系统包括：用于判断空气通道堵塞程度的干燥器，将堵塞程度发送到远程控制装置;以及远程控制装置，用于从烘干机接收堵塞程度，并显示堵塞度通过显示单元。

2. 发明申请

US20080148592A1 DRYER WITH SAFETY FUNCTION 审中-公开
标题翻译：干燥与安全功能
公开(公告)号：US20080148592A1
公开(公告)日：2008-06-26
申请号：US11937684
申请日：2007-11-09
申请人： Yang-hwan KIM , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
发明人： Yang-hwan KIM , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
IPC分类号： F26B19/00 , G06F9/00
CPC分类号： D06F58/28 , D06F2058/2864 , D06F2058/2887 , G05B2219/24091 , G05B2219/2633
摘要： The present invention discloses a dryer with safety function which can interrupt a drying operation of the dryer in clogging of an exhaust duct. The dry with safety function includes a judgment means for judging clogging of the exhaust duct, and a display means interworking with the judgment means, for displaying the clogging state of the exhaust duct in clogging of the exhaust duct. The user can be rapidly informed of the clogging state of the exhaust duct.
摘要翻译：本发明公开了一种具有安全功能的干燥机，其可以在堵塞排气管道时中断烘干机的干燥操作。具有安全功能的干燥包括用于判断排气管道的堵塞的判断装置，以及与判断装置相互作用的显示装置，用于显示排气管堵塞排气管道的堵塞状态。可以迅速地通知使用者排气管的堵塞状态。

3. 发明申请

US20080078100A1 DRYER WITH CLOGGING DETECTING FUNCTION 有权
标题翻译：干燥器具有检测功能
公开(公告)号：US20080078100A1
公开(公告)日：2008-04-03
申请号：US11850080
申请日：2007-09-05
申请人： Ju-hyun KIM , Kyung-hun Kim , Sun-cheol Bae , Jin-seok Hu , Yang-hwan Kim , Ju-young Min , Ja-in Koo
发明人： Ju-hyun KIM , Kyung-hun Kim , Sun-cheol Bae , Jin-seok Hu , Yang-hwan Kim , Ju-young Min , Ja-in Koo
IPC分类号： F26B19/00 , G01D11/00
CPC分类号： D06F58/28
摘要： The present invention discloses a clogging detecting apparatus for a dryer which can check and display a clogging degree of an air passage. The clogging detecting apparatus for the dryer includes a judgment unit for judging the clogging degree of the air passage, a storing unit for storing the clogging degree of the air passage, and a display unit for displaying the clogging degree to the user. The clogging detecting apparatus for the dryer does not only notify clogging of the air passage but also provides information on the clogging degree, so that the user can precisely check the state of the air passage.
摘要翻译：本发明公开了一种用于干燥器的堵塞检测装置，其可以检查和显示空气通道的堵塞程度。用于干燥机的堵塞检测装置包括用于判断空气通道的堵塞程度的判断单元，用于存储空气通道的堵塞程度的存储单元和用于向用户显示堵塞程度的显示单元。用于干燥器的堵塞检测装置不仅通知空气通道的堵塞，而且还提供关于堵塞程度的信息，使得用户可以精确地检查空气通道的状态。

4. 发明授权

US08387272B2 Clogging detecting system for dryer 有权
标题翻译：干燥机堵塞检测系统
公开(公告)号：US08387272B2
公开(公告)日：2013-03-05
申请号：US11849531
申请日：2007-09-04
申请人： Yang-hwan Kim , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
发明人： Yang-hwan Kim , Kyung-hun Kim , Ja-in Koo , Ju-hyun Kim , Sun-cheol Bae , Ju-young Min , Jin-seok Hu
IPC分类号： F26B13/10
CPC分类号： D06F58/28
摘要： The present invention discloses a clogging detecting system for a dryer which can display a clogging degree or state of an air passage to the user through a remote controlling device. The clogging detecting system for the dryer includes the dryer for judging the clogging degree of the air passage, and sending the clogging degree to a remote controlling device, and the remote controlling device for receiving the clogging degree from the dryer, and displaying the clogging degree through a display unit.
摘要翻译：本发明公开了一种用于干燥器的堵塞检测系统，其可以通过远程控制装置向用户显示空气通道的堵塞程度或状态。用于干燥机的堵塞检测系统包括：用于判断空气通道堵塞程度的干燥器，将堵塞程度发送到远程控制装置;以及远程控制装置，用于从烘干机接收堵塞度，并显示堵塞度通过显示单元。

5. 发明授权

US07926201B2 Dryer with clogging detecting function 有权
标题翻译：干燥机具有堵塞检测功能
公开(公告)号：US07926201B2
公开(公告)日：2011-04-19
申请号：US11850080
申请日：2007-09-05
申请人： Ju-hyun Kim , Kyung-hun Kim , Sun-cheol Bae , Jin-seok Hu , Yang-hwan Kim , Ju-young Min , Ja-in Koo
发明人： Ju-hyun Kim , Kyung-hun Kim , Sun-cheol Bae , Jin-seok Hu , Yang-hwan Kim , Ju-young Min , Ja-in Koo
IPC分类号： F26B11/02
CPC分类号： D06F58/28
摘要： A clogging detecting apparatus for a dryer is provided that checks and displays a clogging degree of an air passage. The clogging detecting apparatus includes a judgment device for judging the clogging degree of the air passage, a storing device for storing the clogging degree of the air passage, and a display for displaying the clogging degree to the user. The clogging detecting apparatus provides information on the clogging degree, so that the user precisely checks the state of the air passage.
摘要翻译：提供一种用于干燥器的堵塞检测装置，其检查和显示空气通道的堵塞度。堵塞检测装置包括用于判断空气通道的堵塞程度的判断装置，用于存储空气通道的堵塞程度的存储装置和用于向使用者显示堵塞程度的显示器。堵塞检测装置提供关于堵塞程度的信息，使得用户精确地检查空气通道的状态。

6. 发明授权

US5114873A Method for manufacturing a stacked capacitor DRAM cell 失效
标题翻译：叠层电容器DRAM单元的制造方法
公开(公告)号：US5114873A
公开(公告)日：1992-05-19
申请号：US592807
申请日：1990-10-04
申请人： Kyung-hun Kim , Seong-tae Kim , Hyeong-kyu Lee
发明人： Kyung-hun Kim , Seong-tae Kim , Hyeong-kyu Lee
IPC分类号： H01L21/8242
CPC分类号： H01L27/10852
摘要： The method comprises the steps of: forming the transistor on a substrate and then depositing an interlayer insulating layer, and forming a design pattern of a first conductive layer by vertically etching it using a mask; horizontally overetching the pattern by using the etching process used for forming the pattern; depositing a first insulating film and then depositing the second conductive layer to the thickness needed to protect the first insulating film; vertically etching the second conductive layer, first insulating film and interlayer insulating layer by applying the mask used in vertically etching the first conductive layer; additionally depositing the second conductive layer; forming a design pattern of the second conductive layer by vertically etching it using a mask; horizontally overetching the pattern of the second conductive layer; depositing the second insulating film and then depositing a third conductive layer to have the thickness to protect the second insulating film; vertically etching the third conductive layer and second insulating film by applying the etching mask of the second conductive layer; additionally depositing the third conductive layer. The method attains larger effective capacitance in which a plate electrode layer surrounds even the lower surface of a storage electrode layer of the stack capacitor without using any extra mask.
摘要翻译：该方法包括以下步骤：在衬底上形成晶体管，然后沉积层间绝缘层，并通过使用掩模垂直蚀刻形成第一导电层的设计图案; 通过使用用于形成图案的蚀刻工艺水平地过蚀刻图案; 沉积第一绝缘膜，然后将第二导电层沉积到保护第一绝缘膜所需的厚度; 通过施加用于垂直蚀刻第一导电层的掩模来垂直蚀刻第二导电层，第一绝缘膜和层间绝缘层; 另外沉积第二导电层; 通过使用掩模垂直蚀刻来形成第二导电层的设计图案; 水平地蚀刻第二导电层的图案; 沉积第二绝缘膜，然后沉积第三导电层以具有保护第二绝缘膜的厚度; 通过施加第二导电层的蚀刻掩模来垂直蚀刻第三导电层和第二绝缘膜; 另外沉积第三导电层。该方法获得更大的有效电容，其中平板电极层甚至包围堆叠电容器的存储电极层的下表面，而不使用任何额外的掩模。

7. 发明授权

US5217918A Method of manufacturing a highly integrated semiconductor memory device with trench capacitors and stacked capacitors 失效
标题翻译：制造具有沟槽电容器和叠层电容器的高度集成的半导体存储器件的方法
公开(公告)号：US5217918A
公开(公告)日：1993-06-08
申请号：US832328
申请日：1992-02-07
申请人： Seong-tae Kim , Kyung-hun Kim , Jae-hong Ko , Su-han Choi
发明人： Seong-tae Kim , Kyung-hun Kim , Jae-hong Ko , Su-han Choi
IPC分类号： H01L27/108
CPC分类号： H01L27/10835 , H01L27/10817
摘要： A highly integrated semiconductor memory device comprises a plurality of memory cells formed by alternately disposing a stack-type capacitor cell and a combined stack-trench type capacitor cell both in row and column directions. Each storage electrode of the capacitor of the memory cell is extended to overlap with the storage electrode of the capacitor of the adjacent memory cell. The combined stack-trench type capacitor is formed into the substrate to increase the storage capacitance thereof which allow the storage capacitance of the stack-type capacitor to increase by extending the storage electrode of the capacitor. Due to the alternate arrangement of stack-trench type capacitor and stack-type capacitor, step coverage, leakage current and soft errors of stack-trench type capacitor are prevented.
摘要翻译：高度集成的半导体存储器件包括通过在行和列方向上交替地布置堆叠型电容器单元和组合的堆叠 - 沟槽型电容器单元而形成的多个存储单元。存储单元的电容器的每个存储电极被延伸以与相邻存储单元的电容器的存储电极重叠。组合的堆叠沟槽型电容器形成在衬底中以增加其容量，其通过延长电容器的存储电极而使堆叠型电容器的存储电容增加。由于堆叠沟槽型电容器和堆叠型电容器的交替布置，防止堆叠沟槽型电容器的阶跃覆盖，漏电流和软错误。

8. 发明授权

US08817820B2 System for controlling path maximum transmission unit by detecting repetitional IP packet fragmentation and method thereof 有权
标题翻译：用于通过检测重复的IP分组分段来控制路径最大传输单元的系统及其方法
公开(公告)号：US08817820B2
公开(公告)日：2014-08-26
申请号：US13131847
申请日：2009-07-17
申请人： Seung-hun Oh , Il-kyun Park , Byung-tak Lee , Kyung-hun Kim , Jai-sang Koh
发明人： Seung-hun Oh , Il-kyun Park , Byung-tak Lee , Kyung-hun Kim , Jai-sang Koh
IPC分类号： H04J3/00
CPC分类号： H04L69/16 , H04L69/161 , H04L69/164 , H04L69/166
摘要： A fragmentation repetition detection apparatus (410) for detecting an IP fragmentation repetition which may occur in a multicast or unicast environment is provided. The fragmentation repetition detection apparatus (410) includes a packet capturing unit (411) which captures a received packet, a fragmentation repetition detector which detects whether or not the captured packet is a packet which is repetitively fragmented, and a path maximum transmission unit (PMTU) transmitter (414) which transmits PMTU information acquired by the fragmentation repetition detector (412) to a server which transmits the packet when the captured packet is a packet which is repetitively fragmented. Since a packet is transmitted by readjusting a PMTU, a fragmentation of an IP packet can be prevented.
摘要翻译：提供了用于检测在多播或单播环境中可能发生的IP分段重复的分片重复检测装置（410）。分段重复检测装置（410）包括捕获接收到的分组的分组捕获单元（411），检测捕获的分组是否是重复分段的分组的分片重复检测器和路径最大传输单元（PMTU ）发送器（414），其将由分段重复检测器（412）获取的PMTU信息发送到当所捕获的分组是重复分段的分组时发送分组的服务器。由于通过重新调整PMTU来发送分组，因此可以防止IP分组的分片。

9. 发明授权

US06426308B1 Methods for forming films having high dielectric constants 失效
标题翻译：用于形成具有高介电常数的膜的方法
公开(公告)号：US06426308B1
公开(公告)日：2002-07-30
申请号：US09209196
申请日：1998-12-10
申请人： Young-wook Park , Moon-yong Lee , Kyung-hun Kim , In-sung Park
发明人： Young-wook Park , Moon-yong Lee , Kyung-hun Kim , In-sung Park
IPC分类号： H01L2131
CPC分类号： C23C16/56 , C23C16/405 , C23C16/46 , H01L21/31604 , H01L21/31691 , H01L28/40 , H01L28/55
摘要： A method form forming a dielectric film on a substrate includes the steps of placing the substrate in a process chamber wherein said substrate is isolated from an external environment, depositing the dielectric film on the substrate in the process chamber, and annealing the dielectric film in said process chamber. In particular, the dielectric film can be formed from Ta2O5. Systems for forming the dielectric film are also disclosed.
摘要翻译：在衬底上形成电介质膜的方法形式包括以下步骤：将衬底放置在处理室中，其中所述衬底与外部环境隔离，将电介质膜沉积在处理室中的衬底上，并将所述电介质膜退火处理室。特别地，电介质膜可以由Ta 2 O 5形成。还公开了用于形成电介质膜的系统。

10. 发明授权

US5910218A Systems for forming films having high dielectric constants 失效
标题翻译：用于形成具有高介电常数的膜的系统
公开(公告)号：US5910218A
公开(公告)日：1999-06-08
申请号：US707904
申请日：1996-09-12
申请人： Young-wook Park , Moon-yong Lee , Kyung-hun Kim , In-sung Park
发明人： Young-wook Park , Moon-yong Lee , Kyung-hun Kim , In-sung Park
IPC分类号： C23C16/48 , C23C16/40 , C23C16/46 , C23C16/56 , H01L21/02 , H01L21/285 , H01L21/31 , H01L21/314 , H01L21/316 , H01L21/822 , H01L21/8242 , H01L27/04 , H01L27/108 , C23C16/00
CPC分类号： C23C16/56 , C23C16/405 , C23C16/46 , H01L21/31604 , H01L21/31691 , H01L28/40 , H01L28/55
摘要： A method form forming a dielectric film on a substrate includes the steps of placing the substrate in a process chamber wherein said substrate is isolated from an external environment, depositing the dielectric film on the substrate in the process chamber, and annealing the dielectric film in said process chamber. In particular, the dielectric film can be formed from Ta.sub.2 O.sub.5. Systems for forming the dielectric film are also disclosed.
摘要翻译：在衬底上形成电介质膜的方法形式包括以下步骤：将衬底放置在处理室中，其中所述衬底与外部环境隔离，将电介质膜沉积在处理室中的衬底上，并将所述电介质膜退火处理室。特别地，电介质膜可以由Ta 2 O 5形成。还公开了用于形成电介质膜的系统。

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