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    • 9. 发明授权
    • Method of gas cleaving a semiconductor product
    • 气体切割半导体产品的方法
    • US06274458B1
    • 2001-08-14
    • US09348462
    • 1999-07-07
    • Joseph Michael FreundGeorge John PrzybylekDennis Mark Romero
    • Joseph Michael FreundGeorge John PrzybylekDennis Mark Romero
    • H01L2128
    • H01L21/67092B28D5/0011B28D5/0047B28D5/0052H01L21/304
    • A device is provided for cleaving semiconductor products or the like. The device may be formed of an inlet for receiving pressurized gas, an adjustable slot for directing the gas toward the products, and a movable flow control member. According to one aspect of the invention, the flow control member is located within a housing that also defines the inlet and the adjustable slot. A cover may be located on the front of the housing. The cover may have a lower edge that forms one side of the slot. The other side of the slot may be formed by the movable flow control member. The cleave device may have an uncomplicated, compact construction. The cleave device may be operated with a flexible product handling system. That is, the brittle products may be handled within opposed flexible sheets. The sheets may be used to locate the products over a ledge (a cleaving position) where they are bent to cause cleaving along crystal planes initiated at scribe or score lines. Uniform bending forces may applied gently and in a non-destructive fashion across the full widths of the semiconductor products. The pressure and cross sectional dimensions of the sheet flow through the adjustable slot may be precisely controlled, if desired. The invention may be used, for example, to increase production yield by reducing the number of integrated circuits formed with defects due to cracking or splitting of silicon material.
    • 提供了用于切割半导体产品等的装置。 该装置可以由用于接收加压气体的入口,用于将气体引向产品的可调节槽以及可移动流动控制构件形成。 根据本发明的一个方面,流量控制构件位于也限定入口和可调节槽的壳体内。 盖子可能位于外壳的前部。 盖可以具有形成槽的一侧的下边缘。 槽的另一侧可以由可移动流动控制构件形成。 切割装置可以具有不复杂,紧凑的结构。 切割装置可以用柔性产品处理系统操作。 也就是说,脆性产品可以在相对的柔性片材内处理。 片材可以用于将产品定位在突出部分(裂开位置)上,在它们被弯曲的地方,以沿着在划线或刻痕线处开始的晶面裂开。 均匀的弯曲力可以在半导体产品的整个宽度上以非破坏性的方式轻轻施加。 如果需要,可以精确地控制通过可调节槽的片材流的压力和横截面尺寸。 例如,本发明可以通过减少由于硅材料的破裂或分裂而形成的缺陷而形成的集成电路的数量来增加产量。