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    • 4. 发明授权
    • Apparatus for cleaving laser bars
    • 用于切割激光棒的设备
    • US6074934A
    • 2000-06-13
    • US196956
    • 1998-11-20
    • Mindaugas Fernand DautartasJoseph Michael FreundWilliam Andrew GaultJohn Michael GearyGeorge John PrzybylekDennis Mark Romero
    • Mindaugas Fernand DautartasJoseph Michael FreundWilliam Andrew GaultJohn Michael GearyGeorge John PrzybylekDennis Mark Romero
    • H01S5/02H01L21/46
    • H01S5/0201H01S5/0202
    • A method and apparatus are provided for automated cleaving of semiconductor laser bars into laser devices. The structures to be cleaved are sandwiched between two sheets of plastic film and, while supported on a stabilizing surface, are transported between the sheets in a direction perpendicular to scribe marks defining the sides of the laser devices. At one point, the film sheets with the structures between them pass over a raised breaker assembly on the stabilizing surface. A high pressure air source above the breaker assembly provides a blast of air towards each film sheet enclosed structure as it passes over the breaker assembly. This causes the structure to fracture or cleave along the scribe line. As the film sheet pass over the breaker assembly, the structure is cleaved at each successive scribe line. Thus, downstream of the breaker assembly, there are provided a series of separated devices between the two film sheets. Moreover, there is no possibility that the devices will be displaced as a result of any air currents, since they are securely retained between the two film sheets.
    • 提供了用于将半导体激光棒自动分裂成激光器件的方法和装置。 要被切割的结构被夹在两片塑料膜之间,并且在支撑在稳定表面上时,在垂直于限定激光装置的侧面的划线标记的方向在片材之间传送。 一方面,具有它们之间的结构的薄膜片通过稳定表面上的升高的断路器组件。 断路器组件上方的高压空气源在其穿过断路器组件时向每个膜片封闭结构提供空气。 这导致结构沿着划线断裂或切割。 当膜片通过断路器组件时,在每个连续的划线处将结构切断。 因此,在断路器组件的下游,在两个薄膜片之间提供了一系列分离的装置。 此外,由于它们被牢固地保持在两个薄膜片之间,因此任何气流都不会使装置发生位移。
    • 6. 发明授权
    • Apparatus and method for testing semiconductor laser chips
    • 用于半导体激光芯片测试的装置和方法
    • US06259264B1
    • 2001-07-10
    • US09385378
    • 1999-08-30
    • Joseph Michael FreundWilliam Andrew GaultJohn Michael Geary
    • Joseph Michael FreundWilliam Andrew GaultJohn Michael Geary
    • G01R3102
    • G01R31/2635
    • An apparatus and method for performing tests on laser chips that are not labor intensive and will not result in wasted parts should the laser chip fail the test is disclosed. A “bare” laser chip is subjected to a test in accordance with one embodiment by placing the laser chip on an insulating material with an embedded conducting contact through which the current to power the laser chip is passed. A cover plate provides a channel around the laser chip through which a jet of high pressure inert gas is passed to dissipate the self-heating of the laser chip that occurs during the test process. The laser chip is kept in place by physical pressure. In accordance with another embodiment, the temperature of the laser chip is measured and a thermoelectric cooler is used to cool the laser chip. The test on the “bare” laser chip eliminates the need to solder bond the laser chip to a carrier and attach wire bonds to the laser chip, thus reducing associated labor and parts costs.
    • 本发明公开了一种不需要劳动强度的激光芯片进行试验的装置和方法,不会造成激光芯片失效。 通过将激光芯片放置在具有嵌入式导电接触件的绝缘材料上,通过激光芯片供电的电流通过“裸”激光器芯片进行根据一个实施例的测试。 盖板提供激光芯片周围的通道,通过该通道使高压惰性气体射流消散在测试过程中发生的激光芯片的自发热。 激光芯片通过物理压力保持在适当的位置。 根据另一实施例,测量激光芯片的温度,并使用热电冷却器来冷却激光芯片。 在“裸”激光芯片上的测试消除了将激光芯片焊接到载体并将引线键合到激光芯片上的需要,从而减少相关的劳动力和零件成本。