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    • 1. 发明授权
    • Toggle memory burst
    • 切换内存突发
    • US07543211B2
    • 2009-06-02
    • US11047544
    • 2005-01-31
    • Joseph J. NahasThomas W. AndreChitra K. Subramanian
    • Joseph J. NahasThomas W. AndreChitra K. Subramanian
    • H03M13/00
    • G11C7/22G11C11/16G11C2207/2263
    • A controller for a toggle memory that performs burst writes by reading a group of bits in the toggle memory and comparing each received data word of the burst with a portion of the group to determine which cells to toggle to enter the data of the burst write in the toggle memory. In one example the toggle memory includes magnetoresistive random access memory (MRAM) with cells using multiple free magnetic layers that toggle between states when subjected to a sequence of magnetic pulses along two directions. Because one read is performed for a group of data of the burst, the time needed to perform the burst write is reduced.
    • 一种用于触发存储器的控制器,其通过读取触发存储器中的一组位来执行突发写入,并将该脉冲串的每个接收到的数据字与该组的一部分进行比较,以确定哪个单元切换以输入突发写入的数据 切换存储器。 在一个示例中,触发存储器包括具有使用多个自由磁性层的单元的磁阻随机存取存储器(MRAM),当沿两个方向受到一系列磁脉冲时,该状态在状态之间切换。 因为对脉冲串的一组数据执行一次读取,所以执行突发写入所需的时间减少。
    • 4. 发明授权
    • Circuit and method of writing a toggle memory
    • 写入切换存储器的电路和方法
    • US06693824B2
    • 2004-02-17
    • US10186141
    • 2002-06-28
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBrad J. Garni
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBrad J. Garni
    • G11C1100
    • G11C11/16G11C2207/2263
    • A magnetoresistive random access memory is operated in a toggle fashion so that its logic state is flipped from its current state to the alternate state when written. This provides for a more consistent and reliable programming because the magnetic transitional energy states during the toggle operation are stable. In a write situation, however, this does mean that the state of the cell must be read and compared to the desired state of the cell before the cell is flipped. If the cell is already in the desired logic state, then it should not be written. This read time penalty before writing is reduced by beginning the write process while reading and then aborting the write step if the cell is already in the desired state. The write can actually begin on the cell and be aborted without adversely effecting the state of the cell.
    • 磁阻随机存取存储器以触发方式操作,使得其写入时其逻辑状态从其当前状态翻转到备用状态。 这提供了更一致和可靠的编程,因为在切换操作期间的磁过渡能量状态是稳定的。 然而,在写入情况下,这意味着在单元被翻转之前,单元格的状态必须被读取并与单元格的期望状态进行比较。 如果单元已经处于所需的逻辑状态,则不应写入。 写入前的读取时间损失通过在读取时开始写入处理而减少,然后在单元格已经处于所需状态时中止写入步骤。 写入实际上可以在单元格上开始并被中止,而不会不利地影响单元的状态。
    • 6. 发明授权
    • Low voltage reference circuit and method of operation
    • 低电压参考电路和操作方法
    • US5614816A
    • 1997-03-25
    • US560876
    • 1995-11-20
    • Joseph J. Nahas
    • Joseph J. Nahas
    • G05F3/30G05F3/24H03F1/30G05F3/16
    • G05F3/245Y10S323/907
    • A voltage reference generator circuit (600) that operates at low voltages may be obtained by using a summation circuit (618) to combine a divided bipolar junction voltage signal (616) and a multiplied voltage signal (622) that is proportional to absolute temperature. The voltage reference generator circuit (600) generates a voltage reference which is divided by a divide circuit (620) which produces the divided signal (616), and a voltage reference which is multiplied by a multiply circuit (630) which produces the multiplied signal (622). In another form, a bipolar junction voltage and a voltage that is proportional to absolute temperature may be converted to currents and summed to provide a current which is converted into the reference voltage output.
    • 可以通过使用求和电路(618)来组合分压双极结电压信号(616)和与绝对温度成正比的倍增电压信号(622)来获得在低电压下工作的电压参考发生器电路(600)。 电压基准发生器电路(600)生成由产生分频信号(616)的除法电路(620)分压的电压基准,以及乘以产生相乘信号的乘法电路(630)的电压基准 (622)。 在另一种形式中,双极结电压和与绝对温度成比例的电压可以转换为电流并相加以提供转换为参考电压输出的电流。
    • 8. 发明授权
    • MRAM architecture with electrically isolated read and write circuitry
    • 具有电隔离读写电路的MRAM架构
    • US07154772B2
    • 2006-12-26
    • US11076523
    • 2005-03-09
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBradley J. GarniMark A. Durlam
    • Joseph J. NahasThomas W. AndreChitra K. SubramanianBradley J. GarniMark A. Durlam
    • G11C11/00
    • G11C11/16
    • A magnetoresistive random access memory (MRAM) has separate read and write paths. This reduces the peripheral circuitry by not requiring switching between read and write functions on a particular line. By having the paths dedicated to either read signals or write signals, the voltage levels can be optimized for these functions. The select transistors, which are part of only the read function, may be of the low-voltage type because they do not have to receive the relatively higher voltages of the write circuitry. Similarly, the write voltages do not have to be degraded to accommodate the lower-voltage type transistors. The size of the overall memory is kept efficiently small while improving performance. The memory cells are grouped so that adjacent to groups are coupled to a common global bit line which reduces the space required for providing the capacitance-reducing group approach to memory cell selection.
    • 磁阻随机存取存储器(MRAM)具有单独的读写路径。 这通过不需要在特定线路上的读取和写入功能之间切换来减少外围电路。 通过具有专用于读取信号或写入信号的路径,可以针对这些功能优化电压电平。 作为仅读取功能的一部分的选择晶体管可以是低电压型,因为它们不必接收写电路的相对较高的电压。 类似地,写入电压不必降低以适应低电压型晶体管。 整体存储器的大小保持有效小,同时提高性能。 存储器单元被分组,使得与组相邻耦合到公共全局位线,这减少了为降低存储器单元选择提供电容减小组方法所需的空间。
    • 9. 发明授权
    • Method and apparatus for simulating a magnetoresistive random access memory (MRAM)
    • 用于模拟磁阻随机存取存储器(MRAM)的方法和装置
    • US07082389B2
    • 2006-07-25
    • US10302203
    • 2002-11-22
    • Joseph J. Nahas
    • Joseph J. Nahas
    • G06F17/50
    • G06F17/5036
    • A method and apparatus (500) for simulating a magnetoresistive random access memory (MRAM) (102) uses non-linear functions to model both non-linear magnetic tunnel junction (MTJ) effects and non-linear state switching effects. The method includes calculating a high threshold (THI) and a low threshold (TLO) based on a function of the hard axis current (IH). The easy axis current (IE) is compared to the high threshold (THI). If the easy axis current is greater than the high threshold, the MTJ resistance (RHI) is set to represent a stored high value. The easy axis current is compared to the low threshold. If the easy axis current is less than the low threshold, the MTJ resistance (RLO) is set to represent a stored low value. By using non-linear functions to model the MTJ effects and switching effects, the behavior of an MRAM (102) can be more accurately simulated.
    • 用于模拟磁阻随机存取存储器(MRAM)(102)的方法和装置(500)使用非线性函数来模拟非线性磁隧道结(MTJ)效应和非线性状态切换效应。 该方法包括基于硬轴电流(I H H)的函数来计算高阈值(T HI)和低阈值(T LO) SUB>)。 将易轴电流(I E E)与高阈值(T HI)进行比较。 如果容易轴电流大于高阈值,则将MTJ电阻(R SUB HI)设置为表示存储的高值。 将易轴电流与低阈值进行比较。 如果容易轴电流小于低阈值,则将MTJ电阻(R LO LO)设置为表示存储的低值。 通过使用非线性函数来建模MTJ效应和切换效果,可以更精确地模拟MRAM(102)的行为。