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    • 4. 发明申请
    • Method for estimating the remaining life span of an X-ray radiator
    • 用于估计X射线辐射器的剩余寿命的方法
    • US20070189463A1
    • 2007-08-16
    • US10922674
    • 2004-08-20
    • Josef DeuringerJorg FreudenbergerPeter SchardtMarkus Schild
    • Josef DeuringerJorg FreudenbergerPeter SchardtMarkus Schild
    • G01D18/00
    • G01R31/257H05G1/28
    • In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory. Alternatively or additionally, a characteristic curve that is associated with the measurement value and with the individual X-ray radiator is stored in the memory. In that case, the forecasted remaining life span of the Xray radiator is forecasted based on the instantaneous measurement value, the characteristic curve, and the limit value.
    • 在用于估计已经安装在X射线设备中并且可操作的X射线辐射器的剩余寿命的方法中,在指定的测试条件和时间间隔下,指示剩余寿命的测量值 X射线辐射器被确定并存储在a中。 然后根据同样的测试条件确定的瞬时测量值和以前的测量值来预测未来测量值的预测进度,这些测量值也存储在存储器中。 然后基于预测的进程和与存储在存储器中的各个X射线辐射器相关联的限制值来确定X射线辐射器的预测剩余寿命。 或者或另外,与测量值和各个X射线辐射器相关联的特性曲线存储在存储器中。 在这种情况下,根据瞬时测量值,特性曲线和极限值预测Xray散热器的预测剩余寿命。
    • 9. 发明授权
    • Method for estimating the remaining life span of an X-ray radiator
    • 用于估计X射线辐射器的剩余寿命的方法
    • US07302041B2
    • 2007-11-27
    • US10922674
    • 2004-08-20
    • Josef DeuringerJörg FreudenbergerPeter SchardtMarkus Schild
    • Josef DeuringerJörg FreudenbergerPeter SchardtMarkus Schild
    • H05G1/54
    • G01R31/257H05G1/28
    • In a method for estimating the remaining life span of an X-ray radiator that has been installed in an X-ray apparatus and is operational, under specified test conditions and at time intervals, a measurement value that is indicative for the remaining life span of the X-ray radiator is determined and stored in a memory. A forecasted progression of future measurement values is then forecasted from the instantaneous measurement value and previous measurement values that were determined under identical test conditions, which also are stored in the memory. The forecasted remaining life span of the X-ray radiator is then determined based on the forecasted progression and a limit value that is associated with the individual X-ray radiator, which is stored in the memory.
    • 在用于估计已经安装在X射线设备中并且可操作的X射线辐射器的剩余寿命的方法中,在指定的测试条件和时间间隔下,指示剩余寿命的测量值 确定X射线辐射器并将其存储在存储器中。 然后根据同样的测试条件确定的瞬时测量值和以前的测量值来预测未来测量值的预测进度,这些测量值也存储在存储器中。 然后基于预测的进程和与存储在存储器中的各个X射线辐射器相关联的限制值来确定X射线辐射器的预测剩余寿命。