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    • 8. 发明授权
    • Apparatus and method for repairing electronic packages
    • 用于修理电子封装的装置和方法
    • US06713686B2
    • 2004-03-30
    • US10053362
    • 2002-01-18
    • Wiren D. BeckerDinesh GuptaSudipta K. RayRobert A. RitaHerbert I. StollerKathleen M. Wiley
    • Wiren D. BeckerDinesh GuptaSudipta K. RayRobert A. RitaHerbert I. StollerKathleen M. Wiley
    • H01R1204
    • H01L23/5382H01L2924/0002H01L2924/09701H05K1/0292H05K1/113Y10T29/49155H01L2924/00
    • A multi chip module substrate arranged with repair vias and repair lines extending between repair vias of the chip sites of the module by which repairs can be effected to overcome defects in the module circuits and a method for effecting the repairs of defects in the circuits of this module. A defect can occur in any one of a first signal via, a second signal via, and a circuit line extending between and intended to electrically connect the first signal via and the second signal via. After a defective circuit is identified, the signal vias of the circuit are isolated. Then, the first signal via of the defective circuit is electrically connected to that repair via of the chip site having the first signal via that is connected to that repair via of the chip site having the second signal via and the second signal via of the defective circuit is electrically connected to that repair via of the chip site having the second signal via that is connected to that repair via of the chip site having the first signal via.
    • 多芯片模块基板,其布置有在模块的芯片位置的修复通道之间延伸的修理通孔和修复线,通过该维修线可以进行修理以克服模块电路中的缺陷,以及用于实现该电路中的缺陷的修复的方法 模块。 在第一信号通孔,第二信号通孔以及在第一信号通孔和第二信号通孔之间延伸并且用于电连接第一信号通孔的电路线中的任何一个中可能会发生缺陷。 识别出故障电路后,电路的信号通孔被隔离。 然后,故障电路的第一信号通路经由具有第一信号的芯片位置的修复通孔经由与具有第二信号通路的芯片位置的修复通路连接,并且具有缺陷电路的第二信号通孔 电路经由具有第二信号的芯片位置的修复通路经由与经由具有第一信号通孔的芯片位置的修复通路相连接。
    • 9. 发明授权
    • System and method of generating hierarchical block-level timing constraints from chip-level timing constraints
    • 从芯片级定时约束产生分级块级时序约束的系统和方法
    • US07926011B1
    • 2011-04-12
    • US11621915
    • 2007-01-10
    • Oleg LevitskyChien-Chu KuoDinesh Gupta
    • Oleg LevitskyChien-Chu KuoDinesh Gupta
    • G06F17/50
    • G06F17/5031G06F17/505G06F2217/84
    • A system and method of designing an integrated circuit capable of deriving timing constraints for individual block-level circuits of an integrated circuit that are derived from the chip-level timing constraints and analysis. The block-level timing constraints are in the form of one or more logical timing constraint points at the input and output ports of block-level circuits. Each logical timing constraint points specifies a clock source used to clock data through the port, a delay parameter specifying data propagation delay backward from an input port and forward from an output port, and any timing exception associated with the data path. Using the logical timing constraint point, the circuit design system performs independent timing analysis and optimization of each block-level circuit. The system then reassembles the block-level circuits into a modified chip-level circuit for which timing closure can be achieved.
    • 一种设计集成电路的系统和方法,该集成电路能够导出从芯片级定时约束和分析导出的集成电路的各个块级电路的时序约束。 块级定时约束是块级电路的输入和输出端口处的一个或多个逻辑时序约束点的形式。 每个逻辑时序约束点指定用于通过端口对数据进行时钟源的时钟源,从输入端口向后指定数据传播延迟并从输出端口转发的延迟参数以及与数据路径相关联的任何定时异常。 使用逻辑时序约束点,电路设计系统对每个块级电路进行独立的时序分析和优化。 然后,系统将块级电路重新组装成可以实现时序闭合的修改的芯片级电路。
    • 10. 发明授权
    • Methods and apparatus for deskewing VCAT/LCAS members
    • 用于偏移VCAT / LCAS成员的方法和设备
    • US07672315B2
    • 2010-03-02
    • US11210127
    • 2005-08-23
    • Dinesh GuptaDev Shankar MukherjeeRakesh Kumar Malik
    • Dinesh GuptaDev Shankar MukherjeeRakesh Kumar Malik
    • H04L12/56
    • H04J3/0623H04J3/1611H04J2203/0094
    • Write logic and read logic are coupled to SDRAM and a frame status table. VCG members are written into SDRAM by the write logic and an entry (based on the MFI and SQ) in the frame status table is maintained by the write logic for each member. The read logic scans the frame status table to identify the earliest frame number for which data is available in SDRAM. Based on the frame status and the address pointer offset, the read logic maintains a state table entry for each VCG member and a state for each VCG. According to the preferred embodiment, the read logic is provided in two parts separated by a temporary buffer. The first part of the read logic performs the functions described above and writes chunk data into the temporary buffer. The second part of the read logic reads byte data from the temporary buffer according to a selectable leak rate.
    • 写入逻辑和读取逻辑耦合到SDRAM和帧状态表。 VCG成员通过写逻辑写入SDRAM,帧状态表中的条目(基于MFI和SQ)由每个成员的写入逻辑维护。 读逻辑扫描帧状态表以识别SDRAM中数据可用的最早帧号。 基于帧状态和地址指针偏移,读逻辑维护每个VCG成员的状态表条目和每个VCG的状态。 根据优选实施例,读逻辑被提供在由临时缓冲器分开的两个部分中。 读逻辑的第一部分执行上述功能,并将块数据写入临时缓冲区。 读取逻辑的第二部分根据可选择的泄漏率从临时缓冲器读取字节数据。