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1. 发明申请

US20220107357A1 HOUSING WITH ANTI-DISLODGE CAPABILITY 有权
公开(公告)号：US20220107357A1
公开(公告)日：2022-04-07
申请号：US17492347
申请日：2021-10-01
申请人： Johnstech International Corporation
发明人： Bob Chartrand , David Johnson , Brian Sheposh , Mike Andres
IPC分类号： G01R31/28
摘要： A contactor assembly for a testing system is disclosed. The assembly includes a contact having a contact tail and a housing having a top surface and a bottom surface. A slot extends through the housing from the top surface to the bottom surface and defines a first inner side wall of the housing and a first inner end wall. The contact is receivable in the slot. The contact tail includes a sloped terminus. A retainer is disposed on the first inner side wall. When the sloped terminus is engaged with the first inner end wall, at least a portion of the retainer overlaps with the contact forming at an overlapping area in a cross-sectional view, thereby preventing removal of the contact from the top side of the housing.

2. 发明授权

US10725069B1 Integrated circuit contactor for testing ICs and method of construction 有权
公开(公告)号：US10725069B1
公开(公告)日：2020-07-28
申请号：US16134346
申请日：2018-09-18
申请人： Johnstech International Corporation
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
IPC分类号： G01R1/04 , G01R31/28 , G01R1/073
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.

3. 发明申请

US20160370406A1 On-Center Electrically Conductive Pins For Integrated Testing 审中-公开
标题翻译：用于集成测试的中心导电销
公开(公告)号：US20160370406A1
公开(公告)日：2016-12-22
申请号：US15249605
申请日：2016-08-29
申请人： Johnstech International Corporation
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R1/04 , G01R1/073 , G01R31/28
CPC分类号： G01R1/0466 , G01R1/045 , G01R1/07307
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.
摘要翻译：公开了一种用于在被测器件（DUT）和提供轴向对准的上下接触点的负载板之间提供接触针的结构和方法。销具有上部（30）和下部（32）部分以及在其间允许上部和下部接触（24/26）的挠曲的铰链（44/46），但是该轴向对准可以直接替代 POGO引脚，但具有更高的可靠性。它还包括通过使用改进的铰链244a去除上销230的结构和方法。

4. 发明授权

US11209458B2 Integrated circuit contactor for testing ICs and method of construction 有权
公开(公告)号：US11209458B2
公开(公告)日：2021-12-28
申请号：US16939602
申请日：2020-07-27
申请人： Johnstech International Corporation
发明人： John Nelson , Ranauld Perez , Jeffrey Sherry , Michael Andres , David Johnson
IPC分类号： G01R1/04 , G01R31/28 , G01R1/073
摘要： The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are protected against damage from balls on a DUT by a protective ball guide which includes recesses for receiving part of the ball but prevents the ball from driving the pins beyond a limited range. The ball guide provides fine alignment horizontally and vertically enabling stable electrical performance.

5. 发明授权

US10401386B2 On-center electrically conductive pins for integrated testing 有权
公开(公告)号：US10401386B2
公开(公告)日：2019-09-03
申请号：US15249605
申请日：2016-08-29
申请人： Johnstech International Corporation
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R1/04 , G01R1/073
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge (44/46) in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a.

6. 发明授权

US09476936B1 Thermal management for microcircuit testing system 有权
标题翻译：微电路测试系统的热管理
公开(公告)号：US09476936B1
公开(公告)日：2016-10-25
申请号：US14211016
申请日：2014-03-14
申请人： Johnstech International Corporation
发明人： David Johnson , Jeffrey Sherry , Harlan Faller , Brian Warwick , Sarosh Patel , John Bucher , Jay Drescher
IPC分类号： G01R31/28
CPC分类号： G01R31/2891 , G01R31/2874
摘要： The IC test system provides a system and method for thermal management of test pins. A test pin array (22) in a pin guide (24) is mounted in a retainer (20) which is located between an IC wafer (12) which contains IC devices to be tested (DUT) and a load board (40) which provides pathways to test signals to the DUT. On the other side of the load board is a contact plate (50) which together with the retainer straddles the load board. Leg extensions (36) pass through the load board apertures (42) and provide a thermal circuit from the contact plate to the retainer and to the pin array. On the upper side of the contact plate is a cooling/heating system with a thermal electric peltier device (62) and a further heat exchanger (64) as needed. Holes (44) are provided in the legs (36) to provide a supply of dry air to the wafer and pin array to minimize condensation as a result of cooling effects.
摘要翻译： IC测试系统提供了一种用于测试引脚热管理的系统和方法。销引导件（24）中的测试针阵列（22）安装在位于包含要测试的IC器件（DUT）的IC晶片（12）和负载板（40）之间的保持器（20）中，该保持器提供了向DUT测试信号的路径。在负载板的另一侧是与保持架跨接负载板的接触板（50）。腿部延伸部分（36）穿过负载板孔（42）并提供从接触板到保持器和引脚阵列的热回路。在接触板的上侧是具有热电致动器装置（62）和另外的热交换器（64）的冷却/加热系统。孔（44）设置在腿部（36）中，以向晶片和针阵列提供干燥空气供应，以使冷凝效果最小化。

7. 发明授权

US09638714B2 On-center electrically conductive pins for integrated testing 有权
公开(公告)号：US09638714B2
公开(公告)日：2017-05-02
申请号：US14328581
申请日：2014-07-10
申请人： Johnstech International Corporation
发明人： David Johnson , John Nelson , Sarosh Patel , Michael Andres
IPC分类号： G01R1/04
CPC分类号： G01R1/0466
摘要： A structure and method for providing a contact pin between a device under test (DUT) and a load board which provides upper and lower contact point which are axial aligned is disclosed. The pin has an upper (30) and lower (32) section and a hinge in between which allow flex of both upper and lower contact (24/26) which, but the axial alignment can provide a direct replacement for POGO pins but with greater reliability. It also includes a structure and method for removing upper pins 230 by use of a modified hinge 244a. In an alternate embodiment, the lower section includes a leg extension 320 and a sliding contact land 360 which slides against an aperture in the housing. A spacer 342 provides space for decoupling components on the load board. The hinge may include a truncated cylinder 40b which is configured to permit remove of the upper pin without removal of the lower.

8. 发明授权

US11879925B1 Over the air (OTA) chip testing system 有权
公开(公告)号：US11879925B1
公开(公告)日：2024-01-23
申请号：US17230092
申请日：2021-04-14
申请人： Johnstech International Corporation
发明人： Mike Andres , David Johnson , Jason Steinblock
IPC分类号： G01R29/10 , H01L21/67 , H01Q1/12 , G01R1/04
CPC分类号： G01R29/10 , G01R1/045 , H01L21/67288 , H01Q1/125
摘要： A test apparatus for testing device under test (DUT) having an antenna located on the DUT is disclosed. The test apparatus includes: a housing, a socket configured to electrically connect the DUT to a load board, a gripper assembly configured to hold the DUT in place, a retractor configured to release the DUT from the gripper assembly, and an alignment plate configured to align the DUT with the socket. The gripper assembly includes a base and an extender, the base is attached to the housing, and the extender is configured to hold the DUT in place. When the retractor is disengaged from the extender, the extender is configured to hold the DUT in place. When the retractor is engaged with the extender, the extender is configured to release the DUT on the alignment plate.

9. 发明授权

US11674998B2 Housing with anti-dislodge capability 有权
公开(公告)号：US11674998B2
公开(公告)日：2023-06-13
申请号：US17492347
申请日：2021-10-01
申请人： Johnstech International Corporation
发明人： Bob Chartrand , David Johnson , Brian Sheposh , Mike Andres
IPC分类号： G01R31/28
CPC分类号： G01R31/2887 , G01R31/2863 , G01R31/2865
摘要： A contactor assembly for a testing system is disclosed. The assembly includes a contact having a contact tail and a housing having a top surface and a bottom surface. A slot extends through the housing from the top surface to the bottom surface and defines a first inner side wall of the housing and a first inner end wall. The contact is receivable in the slot. The contact tail includes a sloped terminus. A retainer is disposed on the first inner side wall. When the sloped terminus is engaged with the first inner end wall, at least a portion of the retainer overlaps with the contact forming at an overlapping area in a cross-sectional view, thereby preventing removal of the contact from the top side of the housing.

10. 发明授权

US11029335B1 Selectively geometric shaped contact pin for electronic component testing and method of fabrication 有权
公开(公告)号：US11029335B1
公开(公告)日：2021-06-08
申请号：US16115704
申请日：2018-08-29
申请人： Johnstech International Corporation
发明人： David Johnson , Michael Andres , Neil Graf , Kenna Pretts
IPC分类号： G01R1/067 , H01R4/58 , H01R43/16
摘要： This disclosure relates to a method of fabrication contact pins 24 used in testing circuit components, typically integrated circuits and the contact pins themselves. It is desirable to selectively radius certain portions of each pin to achieve desired performance of the entire pin. The portion to be radiused is cut to the desire shaped from a blank material. The portion which is not to be radiused is not cut to its final shape from the blank but to a larger shape which includes the material for the final shape. The entire cut portion is then treated to shape tor round all exposed edges. Then the remaining portion of the pin is cut out from the larger blank area which was previously retained, leaving those portions with non-radiused edged.

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