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    • 2. 发明授权
    • Method for making ink-jet printer nozzles
    • 制造喷墨打印机喷嘴的方法
    • US06557967B1
    • 2003-05-06
    • US09722891
    • 2000-11-27
    • William T. Lee
    • William T. Lee
    • B41S214
    • B41J2/1628B41J2/1433B41J2/162B41J2/1629
    • A method for forming a chamber or nozzle structure in a substrate. The chamber is formed by first creating a surface feature, such as a pit or trench, on the surface of the substrate. A layer of resist is applied to the sidewall of the surface feature and the substrate is isotropically etched such that the etch works back up the inside of the resist on the surface feature sidewall to form a re-entrant angle between the surface feature sidewall and the top of the chamber wall. This results in a chamber that is wider than the opening between the sidewalls of the surface feature. An anisotropic etch step may be performed before or after the isotropic etch step or steps to control the final shape of the chamber.
    • 一种在衬底中形成腔或喷嘴结构的方法。 通过首先在衬底的表面上产生诸如凹坑或沟槽的表面特征来形成腔室。 将抗蚀剂层施加到表面特征的侧壁上,并且基板被各向同性地蚀刻,使得蚀刻在表面特征侧壁上的抗蚀剂的内部起作用以在表面特征侧壁和 室壁顶部。 这导致比表面特征的侧壁之间的开口更宽的室。 可以在各向同性蚀刻步骤之前或之后进行各向异性蚀刻步骤或控制室的最终形状的步骤。
    • 5. 发明授权
    • Power swivel
    • 电动旋转
    • US4074775A
    • 1978-02-21
    • US688464
    • 1976-05-20
    • William T. Lee
    • William T. Lee
    • E21B3/02E21B3/06
    • E21B3/02
    • A power swivel particularly adapted for downhole cementing operations. The power swivel includes a housing having a fluid passageway therethrough and a stem assembly mounted for rotational movement with respect to the housing and having a fluid passageway communicating with the housing passageway. A hollow bore motor mounted with the housing receives the stem assembly through a central bore of the motor and rotates the stem assembly with respect to the housing.
    • 一种电动旋转装置,特别适用于井下固井作业。 动力旋转件包括具有穿过其中的流体通道的壳体和安装成相对于壳体旋转运动并具有与壳体通道连通的流体通道的杆组件。 安装有壳体的中空孔马达通过马达的中心孔接收杆组件,并使杆组件相对于壳体旋转。
    • 7. 发明授权
    • Method for making ink-jet printer nozzles
    • 制造喷墨打印机喷嘴的方法
    • US06171510B2
    • 2001-01-09
    • US08960769
    • 1997-10-30
    • William T. Lee
    • William T. Lee
    • G01D1520
    • B41J2/1628B41J2/1433B41J2/162B41J2/1629
    • A method for forming a chamber or nozzle structure in a substrate. The chamber is formed by first creating a surface feature, such as a pit or trench, on the surface of the substrate. A layer of resist is applied to the sidewall of the surface feature and the substrate is isotropically etched such that the etch works back up the inside of the resist on the surface feature sidewall to form a re-entrant angle between the surface feature sidewall and the top of the chamber wall. This results in a chamber that is wider than the opening between the sidewalls of the surface feature. An anisotropic etch step may be performed before or after the isotropic etch step or steps to control the final shape of the chamber.
    • 一种在衬底中形成腔或喷嘴结构的方法。 通过首先在衬底的表面上产生诸如凹坑或沟槽的表面特征来形成腔室。 将抗蚀剂层施加到表面特征的侧壁上,并且基板被各向同性地蚀刻,使得蚀刻在表面特征侧壁上的抗蚀剂的内部起作用以在表面特征侧壁和 室壁顶部。 这导致比表面特征的侧壁之间的开口更宽的室。 可以在各向同性蚀刻步骤之前或之后进行各向异性蚀刻步骤或控制室的最终形状的步骤。
    • 8. 发明授权
    • Method of probing a net of an IC at an optimal probe-point
    • 在最佳探针点探测IC网络的方法
    • US5530372A
    • 1996-06-25
    • US228027
    • 1994-04-15
    • William T. LeeRonny SoetarmanChristopher G. Talbot
    • William T. LeeRonny SoetarmanChristopher G. Talbot
    • G01R31/26G01R31/28G01R31/302G01R31/303
    • G01R31/303G01R31/2886H01J2237/2594H01J2237/30416
    • Probe-point placement methods are described. A layout description, a netlist description and a cross-reference description of an IC are retrieved from storage. The data structures associate with each net name a list of polygons. Polygons of a selected net are broken into segments of a specified step size. Each segment is evaluated in accordance with a set of prober rules. Values produced by the prober rules are weighted and combined to obtain a prober score for each segment. The prober score indicates suitability of the corresponding net location for probing. If the best prober score indicates an optimal segment exists for probing, the coordinates of that segment are stored and used to direct a probe to the corresponding location of the IC. If the best prober score indicates no optimal segment exists for probing, each segment of the net is evaluated in accordance with a set of probe-point cutter rules. Values produced by the probe-point cutter rules are weighted and combined to obtain a cutter score for each segment. The cutter score indicates suitability of the corresponding net location for cutting a probe-point hole. A segment having the best cutter score is considered optimal for placing a probe point. The methods can be used, e.g., with electron-beam, focused-ion-beam and laser-beam systems, and with mechanical probe systems.
    • 描述探针点放置方法。 从存储器检索布局描述,网表描述和IC的交叉引用描述。 数据结构与每个网络名称相关联的多边形列表。 所选网络的多边形被分解成指定步长的段。 每个段都按照一组探测器规则进行评估。 由探测器规则产生的值被加权并组合以获得每个段的探测器得分。 探测器分数表示相应的净位置适用于探测。 如果最好的探针分数表示存在用于探测的最佳分段,则该段的坐标被存储并用于将探针引导到IC的对应位置。 如果最佳探测器分数表示探测不存在最佳分段,则根据一组探针切割器规则评估网络的每个分段。 由探针切割器规则产生的值被加权并组合以获得每个切片的切割分数。 切割分数表示用于切割探针孔的相应净位置的适用性。 具有最佳切割分数的片段被认为是放置探针点的最佳选择。 该方法可以用于例如电子束,聚焦离子束和激光束系统以及机械探针系统。
    • 9. 发明授权
    • Optimal probe point placement
    • 最佳探针点放置
    • US5675499A
    • 1997-10-07
    • US626484
    • 1996-04-02
    • William T. LeeRonny SoetarmanChristopher Graham Talbot
    • William T. LeeRonny SoetarmanChristopher Graham Talbot
    • G01R31/26G01R31/28G01R31/302G01R31/303
    • G01R31/303G01R31/2886H01J2237/2594H01J2237/30416
    • Probe-point placement methods are described. A layout description, a netlist description and a cross-reference description of an IC are retrieved from storage. The data structures associate with each net name a list of polygons. Polygons of a selected net are broken into segments of a specified step size. Each segment is evaluated in accordance with a set of prober rules. Values produced by the prober rules are weighted and combined to obtain a prober score for each segment. The prober score indicates suitability of the corresponding net location for probing. If the best prober score indicates an optimal segment exists for probing, the coordinates of that segment are stored and used to direct a probe to the corresponding location of the IC. If the best prober score indicates no optimal segment exists for probing, each segment of the net is evaluated in accordance with a set of probe-point cutter rules. Values produced by the probe-point cutter rules are weighted and combined to obtain a cutter score for each segment. The cutter score indicates suitability of the corresponding net location for cutting a probe-point hole. A segment having the best cutter score is considered optimal for placing a probe point. The methods can be used, e.g., with electron-beam, focused-ion-beam and laser-beam systems, and with mechanical probe systems.
    • 描述探针点放置方法。 从存储器检索布局描述,网表描述和IC的交叉引用描述。 数据结构与每个网络名称相关联的多边形列表。 所选网络的多边形被分解成指定步长的段。 每个段都按照一组探测器规则进行评估。 由探测器规则产生的值被加权并组合以获得每个段的探测器得分。 探测器分数表示相应的净位置适用于探测。 如果最好的探针分数表示存在用于探测的最佳分段,则该段的坐标被存储并用于将探针引导到IC的对应位置。 如果最佳探测器分数表示探测不存在最佳分段,则根据一组探针切割器规则评估网络的每个分段。 由探针切割器规则产生的值被加权并组合以获得每个切片的切割分数。 切割分数表示用于切割探针孔的相应净位置的适用性。 具有最佳切割分数的片段被认为是放置探针点的最佳选择。 该方法可以用于例如电子束,聚焦离子束和激光束系统以及机械探针系统。