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1. 发明授权

US07708446B2 Display film stacks and a method of modeling the films 失效
标题翻译：显示胶片堆叠和对胶片进行建模的方法
公开(公告)号：US07708446B2
公开(公告)日：2010-05-04
申请号：US12037386
申请日：2008-02-26
申请人： Jian Zhou , Kevin Patrick Capaldo , Chung-hei Yeung , Mahari Tjahjadi , Andrei Sharygin
发明人： Jian Zhou , Kevin Patrick Capaldo , Chung-hei Yeung , Mahari Tjahjadi , Andrei Sharygin
IPC分类号： F21V7/04
CPC分类号： G02F1/133606 , G02F2001/133607
摘要： Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.
摘要翻译：这里公开了一种用于背光显示系统的显示膜堆叠。在一个实施例中，显示系统包括：光源，包括由第一折射率的第一材料形成的第一表面纹理层的第一膜和包括第二表面纹理层的第二膜，所述第二表面纹理层由第二折射率材料。第二膜设置在光源和第一膜之间。第二折射率大于第一折射率。光源设置成与第一膜和第二膜光学连通。第一表面纹理层和第二表面纹理层包括独立地选自半球形结构，部分半球形结构，椭圆形结构，浸没的球形珠，椭圆形珠，“钟形”凸块和复合透镜形状结构中的单元结构。

2. 发明申请

US20090219461A1 DISPLAY FILM STACKS AND A METHOD OF MODELING THE FILMS 失效
标题翻译：显示膜片和建模片的方法
公开(公告)号：US20090219461A1
公开(公告)日：2009-09-03
申请号：US12037386
申请日：2008-02-26
申请人： Jian Zhou , Kevin Patrick Capaldo , Chung-hei Yeung , Mahari Tjahjadi , Andrei Sharygin
发明人： Jian Zhou , Kevin Patrick Capaldo , Chung-hei Yeung , Mahari Tjahjadi , Andrei Sharygin
IPC分类号： G02F1/13357 , F21V5/00 , G09F13/04
CPC分类号： G02F1/133606 , G02F2001/133607
摘要： Disclosed herein is a display film stack for a backlight display system. In one embodiment, the display system comprises: a light source, a first film comprising a first surface texture layer that is formed of a first material of a first refractive index, and a second film comprising a second surface texture layer that is formed of a second material of a second refractive index. The second film is disposed between the light source and the first film. The second refractive index is greater than the first refractive index. The light source is disposed in optical communication with the first film and the second film. The first surface texture layer and the second surface texture layer comprise unit structures independently selected from the group consisting of hemispherical structures, partial hemispherical structures, ellipsoidal structures, immersed spherical beads, ellipsoidal beads, “bell-shape” bump and complex lens shape structures.
摘要翻译：这里公开了一种用于背光显示系统的显示膜堆叠。在一个实施例中，显示系统包括：光源，包括由第一折射率的第一材料形成的第一表面纹理层的第一膜和包括第二表面纹理层的第二膜，所述第二表面纹理层由第二折射率材料。第二膜设置在光源和第一膜之间。第二折射率大于第一折射率。光源设置成与第一膜和第二膜光学连通。第一表面纹理层和第二表面纹理层包括独立地选自半球形结构，部分半球形结构，椭圆形结构，浸没的球形珠，椭圆形珠，“钟形”凸块和复合透镜形状结构中的单元结构。

3. 发明授权

US07371590B2 Integrated inspection system and defect correction method 失效
标题翻译：综合检测系统和缺陷校正方法
公开(公告)号：US07371590B2
公开(公告)日：2008-05-13
申请号：US11285331
申请日：2005-11-21
申请人： Kevin Patrick Capaldo , Mark Allen Cheverton , Dennis Joseph Coyle , Michael John Davis , Sameer Kirti Talsania , Masako Yamada , Chung-hei Yeung
发明人： Kevin Patrick Capaldo , Mark Allen Cheverton , Dennis Joseph Coyle , Michael John Davis , Sameer Kirti Talsania , Masako Yamada , Chung-hei Yeung
IPC分类号： H01L21/66
CPC分类号： G01N21/95 , G01N21/8422 , G01N21/8806
摘要： A system for the inspection of and a process for the correction of defects in a microreplicated optical display film manufacturing process. The process steps of manufacturing a master, a plurality of shims from the master, and a multiplicity of display films from each shim are integrated with a systemic defect identification and correction process. Each primary manufacturing step has its own inspection system and correction process where defect information for that step of the process is fed back and analyzed; and from that analysis the subprocess is adjusted to eliminate or reduce the detected defect. The systemic defect is identified as to its source and then fed back and analyzed in the correction step of the respective subprocess in order to cure the root of the defect.
摘要翻译：用于微复制光学显示膜制造工艺中的缺陷校正的检查系统和校正处理。制造主机，来自主机的多个垫片以及来自每个垫片的多个显示胶片的工艺步骤与系统缺陷识别和校正处理相结合。每个主要制造步骤都有自己的检测系统和校正过程，其中反馈和分析该过程的缺陷信息; 并从该分析中调整子过程以消除或减少检测到的缺陷。将系统缺陷确定为其源，然后在相应子过程的校正步骤中反馈并分析，以固化缺陷的根部。

4. 发明授权

US07341784B2 Light management film and its preparation and use 有权
标题翻译：光管理电影及其制作与使用
公开(公告)号：US07341784B2
公开(公告)日：2008-03-11
申请号：US10937942
申请日：2004-09-10
申请人： Chunghei Yeung , Yu Hu , Kevin Patrick Capaldo , Anne Elizabeth Herrmann , Yan Zhang , Bret Chisholm , Paul Smigelski , Dennis Joseph Coyle
发明人： Chunghei Yeung , Yu Hu , Kevin Patrick Capaldo , Anne Elizabeth Herrmann , Yan Zhang , Bret Chisholm , Paul Smigelski , Dennis Joseph Coyle
IPC分类号： B32B27/28 , C09K19/04 , C08F2/46 , C08F20/22 , C08K5/42
CPC分类号： G02B6/0065 , G02B6/0041 , G02B6/0051 , G02B6/0053 , Y10S524/91 , Y10S524/911 , Y10S524/912 , Y10T428/10 , Y10T428/1086 , Y10T428/31551 , Y10T428/31554 , Y10T428/31609
摘要： A light management film includes a first layer with a thermoplastic resin and a particular phosphonium sulfonate salt, and a second layer formed from a curable composition and having a refractive index of at least 1.5. The light management film exhibits reduced static electricity build-up and reduced dust attraction, making it easier to handle during fabrication of display devices such as the flat panel displays of laptop computers.
摘要翻译：光管理膜包括具有热塑性树脂的第一层和特定的磺酸鏻盐，以及由可固化组合物形成的折射率至少为1.5的第二层。光管理膜显示减少的静电积聚和减少的吸尘性，使得在制造显示装置（例如膝上型计算机的平板显示器）时更容易处理。

5. 发明授权

US07251079B2 Brightness enhancement film, and methods of making and using the same 失效
标题翻译：亮度增强膜及其制造和使用方法
公开(公告)号：US07251079B2
公开(公告)日：2007-07-31
申请号：US11326158
申请日：2006-01-04
申请人： Kevin Patrick Capaldo , Brian Thomas Carvill , Dennis Joseph Coyle , Yu Hu , Chunghei Yeung , Yan Zhang
发明人： Kevin Patrick Capaldo , Brian Thomas Carvill , Dennis Joseph Coyle , Yu Hu , Chunghei Yeung , Yan Zhang
IPC分类号： G02B27/30
CPC分类号： G02B6/0053 , G02B5/0221 , G02B5/0242 , G02B5/0278 , G02B6/0065
摘要： In one embodiment, a brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The brightness enhancement film is capable of collimating light, and wherein, without the coating, the diffusing film would be capable of spread light passing through the back surface. In another embodiment, the brightness enhancement film comprises: a diffusing film comprising a front surface and a back surface, a coating on the front surface, and light redirecting structures disposed in the coating. The diffusing film has a stress retardation gradient of less than or equal to 50 nm/in, wherein an interval for calculation of the stress retardation gradient is less than 1 inch. The brightness enhancement film is capable of collimating light.
摘要翻译：在一个实施例中，亮度增强膜包括：扩散膜，其包括前表面和后表面，前表面上的涂层和设置在涂层中的光重定向结构。亮度增强膜能够准直光，并且其中，在没有涂层的情况下，漫射膜能够扩散通过背面的光。在另一个实施例中，亮度增强膜包括：扩散膜，其包括前表面和后表面，前表面上的涂层和布置在涂层中的光重定向结构。漫射膜具有小于或等于50nm / in的应力延迟梯度，其中应力延迟梯度的计算间隔小于1英寸。亮度增强膜能够准直光。

6. 发明授权

US07339664B2 System and method for inspecting a light-management film and method of making the light-management film 失效
标题翻译：用于检查光管理膜的系统和方法以及制造光管理膜的方法
公开(公告)号：US07339664B2
公开(公告)日：2008-03-04
申请号：US10952651
申请日：2004-09-29
申请人： Kevin Patrick Capaldo , Yu Hu , Chunghei Yeung , Yan Zhang
发明人： Kevin Patrick Capaldo , Yu Hu , Chunghei Yeung , Yan Zhang
IPC分类号： G01N21/00
CPC分类号： G01N21/958 , G01N21/8803 , G01N2021/8967
摘要： A method of inspecting a light-management film comprises reflecting light from an overhead light source off a first side of the light-management film and examining the light-management film for defects; directing transmission light from a backlight source through a second side of the light-management film to the first side and examining the light-management film for defects; reflecting light from the overhead light source off the second side of the light-management film and examining the light-management film for defects; directing transmission light from the backlight source through the first side of the light-management film to the second side and examining the light-management film for defects; and measuring a location of each of the examined defects in the light-management film.
摘要翻译：检查光管理膜的方法包括将来自顶部光源的光从光管理膜的第一侧反射并检查光管理膜的缺陷; 将来自背光源的透射光引导到光管理膜的第二侧到第一侧，并检查光管理膜的缺陷; 将来自顶棚光源的光从光管理膜的第二侧反射出来，并检查光管理膜的缺陷; 将来自背光源的透射光通过光管理膜的第一侧引导到第二侧，并检查光管理膜的缺陷; 并测量光管理膜中每个检查缺陷的位置。

7. 发明授权

US07199386B2 System and method for detecting defects in a light-management film 失效
标题翻译：用于检测光管理膜中的缺陷的系统和方法
公开(公告)号：US07199386B2
公开(公告)日：2007-04-03
申请号：US10710708
申请日：2004-07-29
申请人： Kevin Patrick Capaldo , Mark Cheverton , Kevin George Harding , Robert Tait
发明人： Kevin Patrick Capaldo , Mark Cheverton , Kevin George Harding , Robert Tait
IPC分类号： G01N21/86 , G01N21/00 , H01L27/00
CPC分类号： G01N21/95 , G01N2021/9513
摘要： A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device operably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
摘要翻译：提供了一种用于检测光管理膜中的缺陷的系统和方法。该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。最后，该系统包括可操作地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

8. 发明授权

US07435986B2 System and method for detecting repeating defects in a light-management film 有权
标题翻译：用于检测光管理膜中的重复缺陷的系统和方法
公开(公告)号：US07435986B2
公开(公告)日：2008-10-14
申请号：US11609605
申请日：2006-12-12
申请人： Kevin Patrick Capaldo , Mark Cheverton , Kevin George Harding , Robert Tait
发明人： Kevin Patrick Capaldo , Mark Cheverton , Kevin George Harding , Robert Tait
IPC分类号： G01N21/86 , H01L27/00
CPC分类号： G01N21/95 , G01N2021/9513
摘要： A system and a method for detecting defects in a light-management film are provided. The system includes a first light source configured to emit light onto a first side of the film in a first predetermined region of the film. The system further includes a second light source configured to emit light onto a second side of the film in the first predetermined region of the film. The system further includes a first camera configured to receive a first portion of light reflected from the first predetermined region of film from the first light source and a second portion of the light propagating through the film from the second light source. Finally, the system includes a signal-processing device openably coupled to the first camera configured to detect a defect in the first predetermined region of the film based on at least one of the first and second portions of light.
摘要翻译：提供了一种用于检测光管理膜中的缺陷的系统和方法。该系统包括配置成在膜的第一预定区域中将光发射到膜的第一侧上的第一光源。该系统还包括被配置为在薄膜的第一预定区域中将光发射到薄膜的第二侧上的第二光源。该系统还包括第一照相机，其配置为从第一光源接收从第一预定区域反射的光的第一部分，以及从第二光源传播通过膜的光的第二部分。最后，该系统包括可开启地耦合到第一照相机的信号处理设备，其被配置为基于第一和第二光部分中的至少一个来检测胶片的第一预定区域中的缺陷。

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