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    • 5. 发明授权
    • Microwave or UHF plasma improved apparatus
    • 微波或UHF等离子体改进装置
    • US4630566A
    • 1986-12-23
    • US798309
    • 1985-11-15
    • Jes AsmussenDonnie K. Reinhard
    • Jes AsmussenDonnie K. Reinhard
    • H01J27/16H01J37/32C23C13/08H01J7/46
    • H01J37/32256H01J27/16H01J37/32192H01J37/32284H01J37/32678
    • A method for etching or chemically treating a surface of an article utilizing a radio frequency wave ion generating apparatus which provides a thin disk shaped plasma is described. The plasma disks can have a relatively large diameter (on the order of magnitude 50 centimeters). The plasma disks can be created without using a static magnetic field. The radio frequency waves are preferably microwaves or UHF. The method is particularly useful for ion or free radical irradiation of the surface provided in the plasma or for irradiation of the surface by ions accelerated outside a cavity containing the plasma. Disk plasmas are created over a wide pressure range (10.sup.-4 Torr to 1 atmosphere) and are highly ionized at low pressures. An apparatus adapted for treating a surface of an article with ions from a plasma is also described. The method and apparatus are preferably used for treating a surface forming part of an integrated circuit.
    • 描述了利用提供薄盘形等离子体的射频波离子产生装置对制品的表面进行蚀刻或化学处理的方法。 等离子盘可以具有相对大的直径(大约50厘米数量级)。 可以在不使用静态磁场的情况下创建等离子体盘。 射频最好是微波或UHF。 该方法对于提供在等离子体中的表面的离子或自由基照射或通过在包含等离子体的空腔外加速的离子照射表面特别有用。 在宽压力范围(10-4乇至1个大气压)下产生盘等离子体,并在低压下高度电离。 还描述了适于用来自等离子体的离子处理制品的表面的装置。 该方法和装置优选用于处理形成集成电路部分的表面。
    • 6. 发明授权
    • Method for treating a surface with a microwave or UHF plasma and
improved apparatus
    • 用微波或UHF等离子体处理表面的方法和改进的装置
    • US4585668A
    • 1986-04-29
    • US641190
    • 1984-08-16
    • Jes AsmussenDonnie K. Reinhard
    • Jes AsmussenDonnie K. Reinhard
    • H01J27/16H01J37/32B05D3/06
    • H01J37/32256H01J27/16H01J37/32192H01J37/32284H01J37/32678
    • A method for etching or chemically treating a surface of an article utilizing a radio frequency wave ion generating apparatus which provides a thin disk shaped plasma is described. The plasma disks can have a relatively large diameter (on the order of magnitude 50 centimeters). The plasma disks can be created without using a static magnetic field. The radio frequency waves are preferably microwaves or UHF. The method is particularly useful for ion or free radical irradiation of the surface provided in the plasma or for irradiation of the surface by ions accelerated outside a cavity containing the plasma. Disk plasmas are created over a wide pressure range (10.sup.-4 Torr to 1 atmosphere) and are highly ionized at low pressures. An apparatus adapted for treating a surface of an article with ions from a plasma is also described. The method and apparatus are preferably used for treating a surface forming part of an integrated circuit.
    • 描述了利用提供薄盘形等离子体的射频波离子产生装置对制品的表面进行蚀刻或化学处理的方法。 等离子盘可以具有相对大的直径(大约50厘米数量级)。 可以在不使用静态磁场的情况下创建等离子体盘。 射频最好是微波或UHF。 该方法对于提供在等离子体中的表面的离子或自由基照射或通过在包含等离子体的空腔外加速的离子照射表面特别有用。 在宽压力范围(10-4乇至1个大气压)下产生盘等离子体,并在低压下高度电离。 还描述了适于用来自等离子体的离子处理制品的表面的装置。 该方法和装置优选用于处理形成集成电路部分的表面。
    • 9. 发明授权
    • Apparatus for the coating of material on a substrate using a microwave
or UHF plasma
    • 用于使用微波或UHF等离子体在基板上涂覆材料的装置
    • US5311103A
    • 1994-05-10
    • US890877
    • 1992-06-01
    • Jes AsmussenJie Zhang
    • Jes AsmussenJie Zhang
    • C23C16/505C23C16/511H01J37/32H01J7/24
    • H01J37/32449C23C16/505C23C16/511H01J37/32256H01J2237/3325
    • An improved radiofrequency wave apparatus (10) which provides a relatively large diameter (on the order of magnitude 500 millimeters) plasma (56) for the coating of a material on a surface of a substrate (50) is described. The apparatus has a movable stage (54), which is used to change the position of the substrate with respect to the plasma. The radiofrequency waves are preferably microwaves or UHF waves (2.45 GHz or 915 MHg). The apparatus has a probe (30) which is mounted along the longitudinal axis (A--A) through a sliding short (16). The apparatus operates in the TM mode and is particularly useful for uniformly coating a relatively large surface of the substrate (or a number of smaller surfaces of substrates at the same time) with a material which is formed in the plasma. The apparatus has been used for depositing diamond films on a number of substrates (Si, Si.sub.3 N.sub.4 and the like).
    • 描述了提供用于在基板(50)的表面上涂覆材料的等离子体(56)的相对较大直径(大约500毫米数量级)的改进的射频波装置(10)。 该装置具有可移动台(54),用于改变基板相对于等离子体的位置。 射频波优选地是微波或UHF波(2.45GHz或915MHz)。 该装置具有通过滑动短路(16)沿纵向轴线(A-A)安装的探头(30)。 该装置以TM模式工作,并且特别适用于在等离子体中形成的材料均匀地涂覆基板的相对大的表面(或同时涂覆基板的多个较小表面)。 该装置已经用于在许多基底(Si,Si 3 N 4等)上沉积金刚石膜。
    • 10. 发明授权
    • Microwave apparatus
    • 微波炉
    • US4792772A
    • 1988-12-20
    • US88377
    • 1987-08-24
    • Jes Asmussen
    • Jes Asmussen
    • H01P7/06H05H7/18
    • H01P7/06
    • An apparatus 10 with gears (22a, 22b, 22c, 25) for adjusting the position of a plate (13) in a cavity (12) and a rack (51) and gear (53) for moving a probe (15) into and out of the cavity is described. The apparatus includes knobs (34, 55) for controlling the movement of the plate and probe. Micrometers (37, 52) measure the precise position of the plate and probe in the cavity. The apparatus allows very precise tuning for selection of a mode of radiofrequency wave in the cavity and fine tuning within the mode.
    • 具有用于调节空腔(12)中的板(13)的位置和齿条(51)的齿轮(22a,22b,22c,25)的装置10和齿轮(53),用于将探针(15)移动到 描述了空腔。 该装置包括用于控制板和探针运动的旋钮(34,55)。 千分尺(37,52)测量板和探针在腔中的精确位置。 该装置允许非常精确的调谐以选择腔内的射频波模式,并在该模式内进行微调。