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    • 5. 发明授权
    • Integrated circuit capacitor
    • 集成电路电容
    • US06294420B1
    • 2001-09-25
    • US09014724
    • 1998-01-28
    • Robert TsuIsamu AsanoShinpei IijimaWilliam R. McKee
    • Robert TsuIsamu AsanoShinpei IijimaWilliam R. McKee
    • H01L218242
    • H01L28/75H01L21/28518H01L21/76897H01L28/55H01L28/90
    • The present invention discloses a novel integrated circuit capacitor and a method of forming such a capacitor. The capacitor formation begins with a base electrode 18 adjacent an insulating region 26. This base electrode 18 can comprise either polysilicon or a metal. A layer 28 of a first material, such as a siliciding metal, is formed over the base electrode 18 as well as the adjacent insulating region. A self-aligned capacitor electrode 12 can then be formed by reacting the first material 28 with the base electrode 18 and removing unreacted portions of the first material 28 from the insulating region 26. The capacitor is then completed by forming a dielectric layer 16 over the self-aligned capacitor electrode 12 and a second capacitor electrode 14 over the dielectric layer 16.
    • 本发明公开了一种新颖的集成电路电容器及其形成方法。 电容器形成从邻近绝缘区域26的基极18开始。该基极18可以包括多晶硅或金属。 诸如硅化金属的第一材料的层28形成在基极电极18上以及相邻的绝缘区域上。 然后可以通过使第一材料28与基底电极18反应并从绝缘区域26去除第一材料28的未反应部分来形成自对准电容器电极12.然后通过在电容器电极12上形成介电层16来完成电容器 自对准电容器电极12和在电介质层16上的第二电容器电极14。
    • 9. 发明授权
    • Line-to-line reliability enhancement using a dielectric liner for a low dielectric constant interlevel and intralevel (or intermetal and intrametal) dielectric layer
    • 使用用于低介电常数层间和层间(或金属间和内部)介电层的电介质衬垫的线间可靠性增强
    • US07402514B2
    • 2008-07-22
    • US10350451
    • 2003-01-24
    • Robert TsuJoe W. McPhersonWilliam R. McKeeThomas Bonifield
    • Robert TsuJoe W. McPhersonWilliam R. McKeeThomas Bonifield
    • H01L21/4763
    • H01L21/76831H01L21/76807
    • An embodiment of the instant invention is a method of providing a connection between a first conductor and a second conductor wherein the first conductor is situated under the second conductor and separated by a first insulating layer, the method comprising the steps of: forming an opening in the first insulating layer (layer 124 or 128 of FIGS. 1-4), the opening having a top, a bottom and sidewalls and is situated between the first conductor and the second conductor; forming a second insulating layer (layer 134, 138, and 142 of FIGS. 3 and 4) exclusively on the sidewalls of the opening thereby leaving a smaller opening in the first insulating layer; forming a conductive material (material 140 of FIGS. 3 and 4) in the smaller opening; and wherein the first insulating layer is comprised of a low-k material and the second insulating layer is comprised of an insulator which has electrical leakage properties which are less than the electrical leakage properties of the first insulating layer.
    • 本发明的一个实施例是一种在第一导体和第二导体之间提供连接的方法,其中第一导体位于第二导体下方并由第一绝缘层分开,该方法包括以下步骤:在 第一绝缘层(图1-4的层124或128),开口具有顶部,底部和侧壁,并且位于第一导体和第二导体之间; 仅在开口的侧壁上形成第二绝缘层(图3和4的层134,138和142),从而在第一绝缘层中留下较小的开口; 在较小的开口中形成导电材料(图3和图4的材料140) 并且其中所述第一绝缘层由低k材料构成,并且所述第二绝缘层由具有小于所述第一绝缘层的漏电特性的漏电特性的绝缘体构成。