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    • 1. 发明授权
    • Speckle pattern interferometer
    • 斑纹图案干​​涉仪
    • US4352565A
    • 1982-10-05
    • US224184
    • 1981-01-12
    • James M. RoweRudolph W. Modster
    • James M. RoweRudolph W. Modster
    • G01B9/02
    • G01B9/02094
    • A speckle pattern interferometer for use in the non-destructive testing of structures employs a laser beam which is split into reference and object beams having substantially the same optical path lengths to the screen of a sensor, such as a vidicon, where the two beams are combined. The object beam is reflected from the surface of an object under investigation, this object being vibrated periodically. The reference beam passes through an optical fiber cut to the proper length to equalize the length of the reference beam path with that of the object beam. The output of the vidicon is fed to an electronic processor where the signals are appropriately processed to provide a speckle pattern display on a monitor viewing screen.
    • 用于结构的非破坏性测试的散斑图案干涉仪使用激光束,该激光束被分割成参考物体和物镜光束,该参考物体和物镜光束具有与传感器(例如摄影机)的屏幕基本相同的光路长度,其中两个光束 结合在一起 物体光束从被调查物体的表面反射,该物体周期性地振动。 参考光束通过切割到适当长度的光纤,以将参考光束路径的长度与物体光束的长度相等。 摄像机的输出被馈送到电子处理器,其中信号被适当地处理以在监视器观看屏幕上提供散斑图案显示。