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    • 4. 发明授权
    • Method and apparatus for measuring non-reciprocal loss of thin magnetic
films and magnetic mirrors
    • 用于测量薄磁膜和磁镜的不可逆损耗的方法和装置
    • US4866264A
    • 1989-09-12
    • US265390
    • 1988-10-31
    • V. Warren BiricikFrank R. Nakatsukasa
    • V. Warren BiricikFrank R. Nakatsukasa
    • G01N21/21
    • G01N21/211G01N2021/218
    • Method and apparatus for high accuracy measurement of non-reciprocal reflectivity of magnetic thin film materials and magnetic mirrors. An ellipsometer which employs a Helmholtz coil to supply magneto-optic modulation to p-polarized light and an acousto-optic modulator to provide intensity modulation is utilized in conjunction with a novel scheme of analyzer rotation and computational techniques to accurately measure non-reciprocal reflectivity. A microcomputer is used to provide controlled rotation of polarizing elements, data logging, data analysis, and output. The non-reciprocal reflectivity value is determined by the slope of the measured ratio of magneto-optically modulated and absolute intensities (.delta.I.sub.magnetic /I.sub.total), plotted against a function of the analyzer angle G(.PSI.).
    • 用于高精度测量磁性薄膜材料和磁性反射镜的非互易反射率的方法和装置。 结合使用分析仪旋转和计算技术的新方案来准确地测量非互逆反射率,利用了使用亥姆霍兹线圈向p偏振光提供磁光调制并提供强度调制的声光调制器的椭偏仪。 微机用于提供极化元件的受控旋转,数据记录,数据分析和输出。 非相互反射率值由测量的磁光调制比和绝对强度的比值(delta Imagnetic / Itotal)决定,相对于分析仪角度G(PSI)的函数。