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    • 2. 发明申请
    • IMAGE SENSOR CELLS
    • 图像传感器细胞
    • US20070108485A1
    • 2007-05-17
    • US11619024
    • 2007-01-02
    • James AdkissonJohn Ellis-MonaghanJeffrey GambinoMark JaffeRichard Rassel
    • James AdkissonJohn Ellis-MonaghanJeffrey GambinoMark JaffeRichard Rassel
    • H01L31/113H01L21/00
    • H01L27/14609H01L27/1463H01L27/14641H01L27/14643H01L31/035281
    • A structure (and method for forming the same) for an image sensor cell. The method includes providing a semiconductor substrate. Then, a charge collection well is formed in the semiconductor substrate, the charge collection well comprising dopants of a first doping polarity. Next, a surface pinning layer is formed in the charge collection well, the surface pinning layer comprising dopants of a second doping polarity opposite to the first doping polarity. Then, an electrically conductive push electrode is formed in direct physical contact with the surface pinning layer but not in direct physical contact with the charge collection well. Then, a transfer transistor is formed on the semiconductor substrate. The transfer transistor includes first and second source/drain regions and a channel region. The first and second source/drain regions comprise dopants of the first doping polarity. The first source/drain region is in direct physical contact with the charge collection well.
    • 用于图像传感器单元的结构(及其形成方法)。 该方法包括提供半导体衬底。 然后,在半导体衬底中形成电荷收集阱,电荷收集阱包含第一掺杂极性的掺杂剂。 接下来,在电荷收集阱中形成表面钉扎层,表面钉扎层包括与第一掺杂极性相反的第二掺杂极性的掺杂剂。 然后,导电的推动电极形成为与表面钉扎层直接物理接触,但不与电荷收集阱直接物理接触。 然后,在半导体衬底上形成传输晶体管。 传输晶体管包括第一和第二源极/漏极区域和沟道区域。 第一和第二源/漏区包括第一掺杂极性的掺杂剂。 第一源极/漏极区域与电荷收集阱直接物理接触。
    • 8. 发明申请
    • A CMOS IMAGER PHOTODIODE WITH ENHANCED CAPACITANCE
    • 具有增强电容的CMOS成像器光电二极管
    • US20070187734A1
    • 2007-08-16
    • US11276085
    • 2006-02-14
    • James AdkissonJohn Ellis-MonaghanMark JaffeDale PearsonDennis Rogers
    • James AdkissonJohn Ellis-MonaghanMark JaffeDale PearsonDennis Rogers
    • H01L31/062
    • H01L27/14643H01L27/1463H01L27/14689H01L31/035281
    • A pixel sensor cell having a semiconductor substrate having a surface; a photosensitive element formed in a substrate having a non-laterally disposed charge collection region entirely isolated from a physical boundary including the substrate surface. The photosensitive element comprises a trench having sidewalls formed in the substrate of a first conductivity type material; a first doped layer of a second conductivity type material formed adjacent to at least one of the sidewalls; and a second doped layer of the first conductivity type material formed between the first doped layer and the at least one trench sidewall and formed at a surface of the substrate, the second doped layer isolating the first doped layer from the at least one trench sidewall and the substrate surface. In a further embodiment, an additional photosensitive element is provided that includes a laterally disposed charge collection region that contacts the non-laterally disposed charge collection region of the photosensitive element and underlies the doped layer formed at the substrate surface.
    • 一种像素传感器单元,具有具有表面的半导体衬底; 形成在具有与包括基板表面的物理边界完全隔离的非横向布置的电荷收集区域的基板中的感光元件。 感光元件包括具有形成在第一导电类型材料的衬底中的侧壁的沟槽; 与所述侧壁中的至少一个相邻形成的第二导电类型材料的第一掺杂层; 以及形成在所述第一掺杂层和所述至少一个沟槽侧壁之间且形成在所述衬底的表面处的所述第一导电类型材料的第二掺杂层,所述第二掺杂层将所述第一掺杂层与所述至少一个沟槽侧壁隔离, 基材表面。 在另一个实施例中,提供附加的光敏元件,其包括横向设置的电荷收集区域,其接触感光元件的非横向设置的电荷收集区域,并且位于形成在基底表面处的掺杂层的下方。
    • 10. 发明申请
    • RECESSED GATE FOR A CMOS IMAGE SENSOR
    • CMOS图像传感器的接收门
    • US20070184614A1
    • 2007-08-09
    • US11735223
    • 2007-04-13
    • James AdkissonJohn Ellis-MonaghanMark JaffeJerome Lasky
    • James AdkissonJohn Ellis-MonaghanMark JaffeJerome Lasky
    • H01L21/336
    • H01L27/14603H01L27/14601H01L27/14689H01L29/66621
    • A novel CMOS image sensor cell structure and method of manufacture. The imaging sensor comprises a substrate having an upper surface, a gate comprising a dielectric layer formed on the substrate and a gate conductor formed on the gate dielectric layer, a collection well layer of a first conductivity type formed below a surface of the substrate adjacent a first side of the gate conductor, a pinning layer of a second conductivity type formed atop the collection well at the substrate surface, and a diffusion region of a first conductivity type formed adjacent a second side of the gate conductor, the gate conductor forming a channel region between the collection well layer and the diffusion region. A portion of the bottom of the gate conductor is recessed below the surface of the substrate. Preferably, a portion of the gate conductor is recessed at or below a bottom surface of the pinning layer to a depth such that the collection well intersects the channel region thereby eliminating any potential barrier interference caused by the pinning layer.
    • 一种新颖的CMOS图像传感器单元结构及其制造方法。 成像传感器包括具有上表面的基板,包括形成在基板上的电介质层的栅极和形成在栅极电介质层上的栅极导体,形成在基板表面附近的第一导电类型的集合阱层 栅极导体的第一侧,形成在基板表面上的集电阱顶部的第二导电类型的钉扎层,以及邻近栅极导体的第二侧形成的第一导电类型的扩散区域,栅极导体形成沟道 收集阱层和扩散区域之间的区域。 栅极导体的底部的一部分在衬底的表面下方凹进。 优选地,栅极导体的一部分在钉扎层的底表面处或下方凹陷到深度,使得收集阱与沟道区相交,从而消除由钉扎层引起的任何潜在的屏障干扰。