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1. 发明申请

US20050245053A1 Semiconductor device and process for fabricating the same 失效
公开(公告)号：US20050245053A1
公开(公告)日：2005-11-03
申请号：US11172908
申请日：2005-07-05
申请人： Hongyong Zhang , Hideto Ohnuma , Yasuhico Takemura
发明人： Hongyong Zhang , Hideto Ohnuma , Yasuhico Takemura
IPC分类号： H01L21/20 , H01L21/322 , H01L21/336 , H01L21/77 , H01L21/84
CPC分类号： H01L21/02672 , H01L21/02532 , H01L21/02675 , H01L21/2022 , H01L21/3221 , H01L27/1277 , H01L29/66757 , Y10S148/004 , Y10S148/016 , Y10S148/06
摘要： After a pattern is transferred on silicon film crystallized by annealing, the silicon film is annealed by radiation of intense rays for a short time. Especially, in the crystallizing process by annealing, an element which promotes crystallization such as nickel is doped therein. The area not crystallized by annealing is also crystallized by radiation of intense rays and a condensed silicon film is formed. After a metal element which promotes crystallization is doped, annealing by light for a short time is performed by radiating intense rays onto the silicon film crystallized by annealing in an atmosphere containing halide. After the surface of the silicon film is oxidized by heating or by radiating intense rays in a halogenated atmosphere and an oxide film is formed on the silicon film, the oxide film is then etched. As a result, nickel in the silicon film is removed.

2. 发明授权

US07635895B2 Display device 失效
标题翻译：显示设备
公开(公告)号：US07635895B2
公开(公告)日：2009-12-22
申请号：US11647179
申请日：2006-12-29
申请人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
发明人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
IPC分类号： H01L27/12
CPC分类号： H01L27/127 , H01L27/1214 , H01L29/66757 , H01L29/78621 , H01L29/78627
摘要： There is provided a method by which lightly doped drain (LDD) regions can be formed easily and at good yields in source/drain regions in thin film transistors possessing gate electrodes covered with an oxide covering. A lightly doped drain (LDD) region is formed by introducing an impurity into an island-shaped silicon film in a self-aligning manner, with a gate electrode serving as a mask. First, low-concentration impurity regions are formed in the island-shaped silicon film by using rotation-tilt ion implantation to effect ion doping from an oblique direction relative to the substrate. Low-concentration impurity regions are also formed below the gate electrode at this time. After that, an impurity at a high concentration is introduced normally to the substrate, so forming high-concentration impurity regions. In the above process, a low-concentration impurity region remains below the gate electrode and constitutes a lightly doped drain region.
摘要翻译：提供了一种方法，通过该方法可以容易地形成轻掺杂漏极（LDD）区域，并且在具有覆盖有氧化物覆盖层的栅电极的薄膜晶体管中的源/漏区域中以良好的产率形成。通过以栅极电极作为掩模，以自对准的方式将杂质引入岛状硅膜中形成轻掺杂漏极（LDD）区域。首先，通过使用旋转 - 倾斜离子注入在岛状硅膜中形成低浓度杂质区，以相对于衬底从倾斜方向进行离子掺杂。此时也在栅电极下方形成低浓度杂质区。之后，将高浓度的杂质通常引入衬底，从而形成高浓度杂质区域。在上述过程中，低浓度杂质区域保留在栅电极下方并构成轻掺杂漏区。

3. 发明授权

US07381599B2 Semiconductor device and method for manufacturing the same 失效
标题翻译：半导体装置及其制造方法
公开(公告)号：US07381599B2
公开(公告)日：2008-06-03
申请号：US11064821
申请日：2005-02-25
申请人： Toshimitsu Konuma , Akira Sugawara , Yukiko Uehara , Hongyong Zhang , Atsunori Suzuki , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi , Yasuhiko Takemura
发明人： Toshimitsu Konuma , Akira Sugawara , Yukiko Uehara , Hongyong Zhang , Atsunori Suzuki , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi , Yasuhiko Takemura
IPC分类号： H01L21/336
CPC分类号： H01L29/665 , H01L21/02145 , H01L21/02244 , H01L21/02258 , H01L21/31116 , H01L21/31144 , H01L21/31683 , H01L21/31687 , H01L21/321 , H01L27/124 , H01L27/127 , H01L29/458 , H01L29/66598 , H01L29/66757 , H01L29/78621 , H01L29/78627
摘要： A TFT formed on an insulating substrate source, drain and channel regions, a gate insulating film formed on at least the channel region and a gate electrode formed on the gate insulating film. Between the channel region and the drain region, a region having a higher resistivity is provided in order to reduce an Ioff current. A method for forming this structure comprises the steps of anodizing the gate electrode to form a porous anodic oxide film on the side of the gate electrode; removing a portion of the gate insulating using the porous anodic oxide film as a mask so that the gate insulating film extends beyond the gate electrode but does not completely cover the source and drain regions. Thereafter, an ion doping of one conductivity element is performed. The high resistivity region is defined under the gate insulating film.
摘要翻译：形成在绝缘基板源极，漏极和沟道区上的TFT，至少形成在沟道区上的栅极绝缘膜和形成在栅极绝缘膜上的栅电极。在沟道区域和漏极区域之间，提供具有较高电阻率的区域以便减小偏转电流。形成该结构的方法包括以下步骤：在栅电极侧阳极氧化栅电极以形成多孔阳极氧化膜; 使用多孔阳极氧化膜去除一部分栅极绝缘体作为掩模，使得栅极绝缘膜延伸超过栅极电极但不完全覆盖源极和漏极区域。此后，进行一个导电性元素的离子掺杂。高电阻率区域限定在栅极绝缘膜下。

4. 发明授权

US06924213B2 Semiconductor device and process for fabricating the same 失效
标题翻译：半导体器件及其制造方法
公开(公告)号：US06924213B2
公开(公告)日：2005-08-02
申请号：US10252393
申请日：2002-09-24
申请人： Hongyong Zhang , Hideto Ohnuma , Yasuhiko Takemura
发明人： Hongyong Zhang , Hideto Ohnuma , Yasuhiko Takemura
IPC分类号： H01L21/20 , H01L21/322 , H01L21/336 , H01L21/77 , H01L21/84 , H01L21/36
CPC分类号： H01L21/02672 , H01L21/02532 , H01L21/02675 , H01L21/2022 , H01L21/3221 , H01L27/1277 , H01L29/66757 , Y10S148/004 , Y10S148/016 , Y10S148/06
摘要： After a pattern is transferred on silicon film crystallized by annealing, the silicon film is annealed by radiation of intense rays for a short time. Especially, in the crystallizing process by annealing, an element which promotes crystallization such as nickel is doped therein. The area not crystallized by annealing is also crystallized by radiation of intense rays and a condensed silicon film is formed.After a metal element which promotes crystallization is doped, annealing by light for a short time is performed by radiating intense rays onto the silicon film crystallized by annealing in an atmosphere containing halide. After the surface of the silicon film is oxidized by heating or by radiating intense rays in a halogenated atmosphere and an oxide film is formed on the silicon film, the oxide film is then etched. As a result, nickel in the silicon film is removed.
摘要翻译：在通过退火结晶的硅膜上转移图案后，通过强烈射线的辐射短时间对硅膜进行退火。特别是在通过退火的结晶工艺中，掺杂促进结晶的元素如镍掺杂。通过退火而未结晶的区域也通过强烈射线的辐射而结晶，形成冷凝的硅膜。在掺杂促进结晶的金属元素之后，通过在含有卤化物的气氛中退火而结晶化的硅膜上发射强光，进行短时间的光退火。在硅膜的表面通过加热或通过在卤化气氛中辐射强射线而被氧化并且在硅膜上形成氧化物膜之后，然后蚀刻氧化膜。结果，硅膜中的镍被去除。

5. 发明授权

US06777763B1 Semiconductor device and method for fabricating the same 失效
标题翻译：半导体装置及其制造方法
公开(公告)号：US06777763B1
公开(公告)日：2004-08-17
申请号：US09190618
申请日：1998-11-12
申请人： Hongyong Zhang , Hideto Ohnuma , Naoaki Yamaguchi , Yasuhiko Takemura
发明人： Hongyong Zhang , Hideto Ohnuma , Naoaki Yamaguchi , Yasuhiko Takemura
IPC分类号： H01L2976
CPC分类号： H01L27/1296 , H01L27/1214 , H01L27/127 , H01L29/66757 , H01L29/78618
摘要： In a thin film transistor (TFT), a mask is formed on a gate electrode, and a porous anodic oxide is formed in both sides of the gate electrode using a relatively low voltage. A barrier anodic oxide is formed between the gate electrode and the porous anodic oxide and on the gate electrode using a relatively high voltage. A gate insulating film is etched using the barrier anodic oxide as a mask. The porous anodic oxide is selectively etched after etching barrier anodic oxide, to obtain a region of an active layer on which the gate insulating film is formed and the other region of the active layer on which the gate insulating film is not formed. An element including at least one of oxygen, nitrogen and carbon is introduced into the region of the active layer at high concentration in comparison with a concentration of the other region of the active layer. Further, N- or P-type impurity is introduced into the active layer. Accordingly, high resistance impurity regions are formed in both sides of a channel forming region.
摘要翻译：在薄膜晶体管（TFT）中，在栅电极上形成掩模，并且使用相对低的电压在栅电极的两侧形成多孔阳极氧化物。在栅电极和多孔阳极氧化物之间以及使用较高电压的栅电极上形成阻挡阳极氧化物。使用阻挡阳极氧化物作为掩模蚀刻栅极绝缘膜。在蚀刻阻挡阳极氧化物之后，选择性地蚀刻多孔阳极氧化物，以获得其上形成有栅极绝缘膜的有源层的区域和不形成栅极绝缘膜的有源层的另一区域。与活性层的其他区域的浓度相比，包含氧，氮和碳中的至少一种的元素以高浓度被引入活性层的区域。此外，将N型或P型杂质引入有源层。因此，在沟道形成区域的两侧形成高电阻杂质区域。

6. 发明授权

US06174757B1 Method for producing semiconductor device 有权
标题翻译：半导体器件的制造方法
公开(公告)号：US06174757B1
公开(公告)日：2001-01-16
申请号：US09273425
申请日：1999-03-19
申请人： Naoaki Yamaguchi , Hongyong Zhang , Satoshi Teramoto , Hideto Ohnuma
发明人： Naoaki Yamaguchi , Hongyong Zhang , Satoshi Teramoto , Hideto Ohnuma
IPC分类号： H01L2184
CPC分类号： H01L27/127 , H01L21/3003 , H01L27/1214 , H01L29/66757 , Y10S438/91
摘要： In producing a semiconductor device such as a thin film transistor (TFT), a silicon semiconductor film is formed on a substrate having an insulating surface, such as a glass substrate, and then a silicon nitride film is formed on the silicon semiconductor film. After that, a hydrogen ion, fluorine ion, or chlorine ion is introduced into the silicon semiconductor film through the silicon nitride film, and then the silicon semiconductor film into which an ion is introduced is heated in an atmosphere containing hydrogen, fluorine, chlorine or these mixture, to neutralize dangling bonds in the silicon semiconductor film and reduce levels in the silicon semiconductor film.
摘要翻译：在制造诸如薄膜晶体管（TFT）的半导体器件中，在具有绝缘表面的衬底（例如玻璃衬底）上形成硅半导体膜，然后在硅半导体膜上形成氮化硅膜。之后，通过氮化硅膜将氢离子，氟离子或氯离子引入硅半导体膜，然后在其中引入离子的硅半导体膜在含有氢，氟，氯或这些混合物，以中和硅半导体膜中的悬挂键并降低硅半导体膜中的水平。

7. 发明授权

US6159777A Method of forming a TFT semiconductor device 失效
标题翻译： TFT半导体器件的形成方法
公开(公告)号：US6159777A
公开(公告)日：2000-12-12
申请号：US967317
申请日：1997-10-28
申请人： Akira Takenouchi , Atsunori Suzuki , Hideto Ohnuma , Hongyong Zhang , Shunpei Yamazaki
发明人： Akira Takenouchi , Atsunori Suzuki , Hideto Ohnuma , Hongyong Zhang , Shunpei Yamazaki
IPC分类号： H01L21/265 , B23K26/073 , H01L21/268 , H01L21/336 , H01L29/78 , H01L29/786 , H01L21/84
CPC分类号： H01L29/66757 , B23K26/0738 , Y10S117/904
摘要： An improved method of forming a semiconductor device on a glass substrate is described. The method comprises forming a semiconductor film on a glass substrate, heating the semiconductor film by means of a heater to a predetermined temperature, exposing the semiconductor film to pulsed laser light after the semiconductor film has been heated to the predetermined temperature by the heating step. The thermal shock due to sharp temperature change is lessened by the pre-heating step.
摘要翻译：描述了在玻璃基板上形成半导体器件的改进方法。该方法包括在玻璃基板上形成半导体膜，通过加热器将半导体膜加热到预定温度，在通过加热步骤将半导体膜加热到预定温度之后将半导体膜暴露于脉冲激光。由于预热步骤而导致的急剧的温度变化导致的热冲击减轻。

8. 发明授权

US5561081A Method of forming a semiconductor device by activating regions with a laser light 失效
标题翻译：用激光激活区域形成半导体器件的方法
公开(公告)号：US5561081A
公开(公告)日：1996-10-01
申请号：US190846
申请日：1994-02-03
申请人： Akira Takenouchi , Atsunori Suzuki , Hideto Ohnuma , Hongyong Zhang , Shunpei Yamazaki
发明人： Akira Takenouchi , Atsunori Suzuki , Hideto Ohnuma , Hongyong Zhang , Shunpei Yamazaki
IPC分类号： H01L21/265 , B23K26/073 , H01L21/268 , H01L21/336 , H01L29/78 , H01L29/786 , H01L21/306
CPC分类号： H01L29/66757 , B23K26/0738 , Y10S117/904
摘要： An improved method of forming a semiconductor device on a glass substrate is described. The method comprises forming a semiconductor film on a glass substrate, heating the semiconductor film by means of a heater to a predetermined temperature, exposing the semiconductor film to pulsed laser light after the semiconductor film has been heated to the predetermined temperature by the heating step. The thermal shock due to sharp temperature change is lessened by the pre-heating step. The width of the pulsed laser light is greater than the height when a cross section is taken perpendicular to a length.
摘要翻译：描述了在玻璃基板上形成半导体器件的改进方法。该方法包括在玻璃基板上形成半导体膜，通过加热器将半导体膜加热到预定温度，在通过加热步骤将半导体膜加热到预定温度之后将半导体膜暴露于脉冲激光。由于预热步骤而导致的急剧的温度变化导致的热冲击减轻。脉冲激光的宽度大于垂直于长度的横截面时的高度。

9. 发明授权

US08273613B2 Semiconductor device and method of manufacture thereof 失效
标题翻译：半导体装置及其制造方法
公开(公告)号：US08273613B2
公开(公告)日：2012-09-25
申请号：US12621537
申请日：2009-11-19
申请人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
发明人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
IPC分类号： H01L21/84
CPC分类号： H01L27/127 , H01L27/1214 , H01L29/66757 , H01L29/78621 , H01L29/78627
摘要： There is provided a method by which lightly doped drain (LDD) regions can be formed easily and at good yields in source/drain regions in thin film transistors possessing gate electrodes covered with an oxide covering. A lightly doped drain (LDD) region is formed by introducing an impurity into an island-shaped silicon film in a self-aligning manner, with a gate electrode serving as a mask. First, low-concentration impurity regions are formed in the island-shaped silicon film by using rotation-tilt ion implantation to effect ion doping from an oblique direction relative to the substrate. Low-concentration impurity regions are also formed below the gate electrode at this time. After that, an impurity at a high concentration is introduced normally to the substrate, so forming high-concentration impurity regions. In the above process, a low-concentration impurity region remains below the gate electrode and constitutes a lightly doped drain region.
摘要翻译：提供了一种方法，通过该方法可以容易地形成轻掺杂漏极（LDD）区域，并且在具有覆盖有氧化物覆盖层的栅电极的薄膜晶体管中的源/漏区域中以良好的产率形成。通过以栅极电极作为掩模，以自对准的方式将杂质引入岛状硅膜中形成轻掺杂漏极（LDD）区域。首先，通过使用旋转 - 倾斜离子注入在岛状硅膜中形成低浓度杂质区，以相对于衬底从倾斜方向进行离子掺杂。此时也在栅电极下方形成低浓度杂质区。之后，将高浓度的杂质通常引入衬底，从而形成高浓度杂质区域。在上述过程中，低浓度杂质区域保留在栅电极下方并构成轻掺杂漏区。

10. 发明授权

US07183614B2 Semiconductor device and method of manufacture thereof 有权
标题翻译：半导体装置及其制造方法
公开(公告)号：US07183614B2
公开(公告)日：2007-02-27
申请号：US11137513
申请日：2005-05-26
申请人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
发明人： Hongyong Zhang , Yasuhiko Takemura , Toshimitsu Konuma , Hideto Ohnuma , Naoaki Yamaguchi , Hideomi Suzawa , Hideki Uochi
IPC分类号： H01L29/786
CPC分类号： H01L27/127 , H01L27/1214 , H01L29/66757 , H01L29/78621 , H01L29/78627
摘要： There is provided a method by which lightly doped drain (LDD) regions can be formed easily and at good yields in source/drain regions in thin film transistors possessing gate electrodes covered with an oxide covering. A lightly doped drain (LDD) region is formed by introducing an impurity into an island-shaped silicon film in a self-aligning manner, with a gate electrode serving as a mask. First, low-concentration impurity regions are formed in the island-shaped silicon film by using rotation-tilt ion implantation to effect ion doping from an oblique direction relative to the substrate. Low-concentration impurity regions are also formed below the gate electrode at this time. After that, an impurity at a high concentration is introduced normally to the substrate, so forming high-concentration impurity regions. In the above process, a low-concentration impurity region remains below the gate electrode and constitutes a lightly doped drain region.
摘要翻译：提供了一种方法，通过该方法可以容易地形成轻掺杂漏极（LDD）区域，并且在具有覆盖有氧化物覆盖层的栅电极的薄膜晶体管中的源/漏区域中以良好的产率形成。通过以栅极电极作为掩模，以自对准的方式将杂质引入岛状硅膜中形成轻掺杂漏极（LDD）区域。首先，通过使用旋转 - 倾斜离子注入在岛状硅膜中形成低浓度杂质区，以相对于衬底从倾斜方向进行离子掺杂。此时也在栅电极下方形成低浓度杂质区。之后，将高浓度的杂质通常引入衬底，从而形成高浓度杂质区域。在上述过程中，低浓度杂质区域保留在栅电极下方并构成轻掺杂漏区。

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