会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • AL ALLOY FILM FOR USE IN DISPLAY DEVICE
    • AL合金膜用于显示器件
    • US20120301732A1
    • 2012-11-29
    • US13576053
    • 2011-02-16
    • Hiroyuki OkunoToshihiro KugimiyaHiroshi Goto
    • Hiroyuki OkunoToshihiro KugimiyaHiroshi Goto
    • C22C21/00B32B15/04C23C14/14
    • C23C14/165H01L27/124H01L29/458H01L29/4908Y10T428/31678
    • Disclosed is an Al alloy film for use in a display device, which does not undergo the formation of hillocks even when exposed to high temperatures of about 450° C. to 600° C., and has excellent high-temperature heat resistance, low electrical resistance (wiring resistance) and excellent corrosion resistance under alkaline environments. Specifically disclosed is an Al alloy film for use in a display device, which comprises at least one element selected from a group X consisting of Ta, Nb, Re, Zr, W, Mo, V, Hf and Ti and at least one rare earth element, and which meets the following requirement (1) when heated at 450° C. to 600° C. (1) Precipitates each having an equivalent circle diameter of 20 nm or more are present at a density of 500,000 particles/mm2 or more in a first precipitation product containing at least one element selected from Al and the elements included in the group X and at least one rare earth element.
    • 公开了一种用于显示装置的Al合金膜,其即使在暴露于约450℃至600℃的高温下也不会形成小丘,并且具有优异的高温耐热性,低电 电阻(接线电阻)和在碱性环境下优异的耐腐蚀性。 具体公开了一种用于显示装置的Al合金膜,其包括从由Ta,Nb,Re,Zr,W,Mo,V,Hf和Ti组成的组X中选择的至少一种元素和至少一种稀土 元素,并且在450℃〜600℃下加热时满足以下要求(1)。(1)以50万个/ mm 2以上的密度存在各自具有20nm以上的当量圆直径的析出物 在含有选自Al中的至少一种元素和包含在基团X中的元素和至少一种稀土元素的第一沉淀产物中。
    • 9. 发明申请
    • DISPLAY DEVICE, PROCESS FOR PRODUCING THE DISPLAY DEVICE, AND SPUTTERING TARGET
    • 显示装置,用于制造显示装置的方法和喷射目标
    • US20110008640A1
    • 2011-01-13
    • US12922764
    • 2009-03-31
    • Hiroshi GotoAkira NanbuJunichi NakaiHiroyuki OkunoMototaka OchiAya Miki
    • Hiroshi GotoAkira NanbuJunichi NakaiHiroyuki OkunoMototaka OchiAya Miki
    • G02F1/1343C09K19/00C22F1/04C23C14/14
    • H01L29/458C22C21/00C22C21/10C23C14/3414H01L27/12H01L27/124H01L29/4908Y10T428/12049
    • Disclosed is a display device comprising an aluminum alloy film. In a wiring structure of a thin-film transistor substrate for use in display devices, the aluminum alloy film can realize direct contact between a thin film of an aluminum alloy and a transparent pixel electrode, can simultaneously realize low electric resistance and heat resistance, and can improve resistance to corrosion by an amine-based peeling liquid and an alkaline developing solution used in a thin-film transistor production process. In the display device, an oxide electroconductive film is in direct contact with an Al alloy film and at least a part of the Al alloy component is precipitated on the contact surface of the Al alloy film. The Al alloy film comprises at least one element (element X1) selected from the group consisting of Ni, Ag, Zn, and Co and at least one element (element X2) which, together with the element X1, can form an intermetallic compound. An intermetallic compound, which has a maximum diameter of not more than 150 nm and is represented by at least one of X1—X2 and Al—X1—X2, is formed in the Al alloy film.
    • 公开了一种包括铝合金膜的显示装置。 在用于显示装置的薄膜晶体管基板的布线结构中,铝合金膜可以实现铝合金薄膜和透明像素电极之间的直接接触,同时可以实现低电阻和耐热性,并且 可以通过在薄膜晶体管制造方法中使用的胺系剥离液和碱性显影液来提高耐腐蚀性。 在显示装置中,氧化物导电膜与Al合金膜直接接触,Al合金成分的至少一部分析出在Al合金膜的接触面上。 Al合金膜包括选自Ni,Ag,Zn和Co中的至少一种元素(元素X1)和与元素X1一起可以形成金属间化合物的至少一种元素(元素X2)。 在Al合金膜中形成具有最大直径不大于150nm并由至少一个X1-X2和Al-X1-X2表示的金属间化合物。