专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US5654131A Optical memory medium 失效
标题翻译：光存储介质
公开(公告)号：US5654131A
公开(公告)日：1997-08-05
申请号：US595097
申请日：1996-02-01
申请人： Masamichi Fujihira , Hiroshi Muramatsu , Norio Chiba , Tatsuaki Ataka
发明人： Masamichi Fujihira , Hiroshi Muramatsu , Norio Chiba , Tatsuaki Ataka
IPC分类号： G01Q20/02 , G01Q20/04 , G01Q60/26 , G11B7/12 , G11B7/135 , G11B7/244 , G11B7/253 , G11B9/00 , G11B11/00 , G11B7/24
CPC分类号： G11B7/12 , B82Y10/00 , G11B11/007 , G11B7/1384 , G11B7/244 , G11B7/2531 , G11B9/1463 , G01Q80/00 , Y10S430/146 , Y10S430/163
摘要： There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole. Further, information is written and read with high density less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising the optical memory piezoelectric medium constituted by a piezoelectric element modified on the surface thereof by a photolytic residual group, an optical probe having a microscopic aperture on the leading end thereof, a light source, an X-Y-Z position control means, a means for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.
摘要翻译：提供了一种光学存储介质，其包括通过光解残留组在其表面上改性的平板，光学记录装置，包括在其前端具有微小孔的光学探针，光源，XYZ位置控制装置和用于整体控制装置的控制器和用于读取包括光学存储介质的光学存储介质的装置，摩擦检测探针，XYZ位置控制装置和用于整体控制装置的控制器。此外，使用用于写入和读取由光学存储器压电介质构成的光学存储器压电介质的装置，以比光的波长高的密度来写入和读取信息，该光存储器压电介质由其表面上由光解残留物修饰的压电元件构成组，在其前端具有微小孔的光学探针，光源，XYZ位置控制装置，用于测量压电元件的谐振特性的装置和用于整体控制装置的控制器。

2. 发明授权

US06229609B1 Scanning near-field optic/atomic force microscope 失效
标题翻译：扫描近场光学/原子力显微镜
公开(公告)号：US06229609B1
公开(公告)日：2001-05-08
申请号：US08225756
申请日：1994-04-11
申请人： Hiroshi Muramatsu , Tatsuaki Ataka , Masamichi Fujihira , Norio Chiba
发明人： Hiroshi Muramatsu , Tatsuaki Ataka , Masamichi Fujihira , Norio Chiba
IPC分类号： G01B1124
CPC分类号： G01Q30/02 , G01Q60/06 , G01Q60/22 , G01Q60/38 , G01Q70/02 , G02B6/241 , Y10S977/862 , Y10S977/863 , Y10S977/871 , Y10S977/951
摘要： An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a light-propagating body continuous with the front end portion. The front end portion and the light-propagating body are shaped like a hook. The apparatus observes the topography and the optical characteristics of the surface of the sample.
摘要翻译：实现了能够以高分辨率测量样品的表面的形貌和光学特性的装置，而与样品的透射率和导电性无关。该装置包括探针，用光照射样品的光源，光电转换器装置和用于接收通过样品透射的光或由样品反射的光的光学器件，用于检测探针偏转的激光发射激光，冷凝器用于将激光引导到探针的后表面的透镜，用于检测反射光的检测系统，用于使样品和探针相对于彼此移动的粗动作机构和细微运动机构;控制装置，样品与探针之间的距离，以及用于控制整个装置的计算机。探针具有与前端部连续的前端部和光传播体。前端部分和光传播体形状如钩。该装置观察样品表面的形貌和光学特性。

3. 发明授权

US5513168A Optical information read/write apparatus 失效
标题翻译：光信息读写装置
公开(公告)号：US5513168A
公开(公告)日：1996-04-30
申请号：US324741
申请日：1994-10-18
申请人： Masamichi Fujihira , Hiroshi Muramatsu , Norio Chiba , Tatsuaki Ataka
发明人： Masamichi Fujihira , Hiroshi Muramatsu , Norio Chiba , Tatsuaki Ataka
IPC分类号： G01Q20/02 , G01Q20/04 , G01Q60/26 , G11B7/12 , G11B7/135 , G11B7/244 , G11B7/253 , G11B9/00 , G11B11/00 , H01J3/14
CPC分类号： G11B7/12 , B82Y10/00 , G11B11/007 , G11B7/1384 , G11B7/244 , G11B7/2531 , G11B9/1463 , G01Q80/00 , Y10S430/146 , Y10S430/163
摘要： There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole. Further, information is written and read with high density less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising the optical memory piezoelectric medium constituted by a piezoelectric element modified on the surface thereof by a photolytic residual group, an optical probe having a microscopic aperture on the leading end thereof, a light source, an X-Y-Z position control means, a means for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.
摘要翻译：提供了一种光学存储介质，其包括通过光解残留组在其表面上改性的平板，光学记录装置，包括在其前端具有微小孔的光学探针，光源，XYZ位置控制装置和用于整体控制装置的控制器和用于读取包括光学存储介质的光学存储介质的装置，摩擦检测探针，XYZ位置控制装置和用于整体控制装置的控制器。此外，使用用于写入和读取由光学存储器压电介质构成的光学存储器压电介质的装置，以比光的波长高的密度来写入和读取信息，该光存储器压电介质由其表面上由光解残留物修饰的压电元件构成组，在其前端具有微小孔的光学探针，光源，XYZ位置控制装置，用于测量压电元件的谐振特性的装置和用于整体控制装置的控制器。

4. 发明授权

US5449901A Fine surface observing apparatus 失效
标题翻译：精细表面观察装置
公开(公告)号：US5449901A
公开(公告)日：1995-09-12
申请号：US95968
申请日：1993-07-22
申请人： Masamichi Fujihira , Tatsuaki Ataka , Hiroshi Muramatsu
发明人： Masamichi Fujihira , Tatsuaki Ataka , Hiroshi Muramatsu
IPC分类号： G01B9/04 , G01B11/30 , G01N37/00 , G01Q30/20 , G01Q60/18 , G01Q60/22 , G01N21/17
CPC分类号： G01Q10/04 , B82Y20/00 , B82Y35/00 , G01Q60/22
摘要： An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.
摘要翻译：提供了基于具有更高分辨率的新原理的光学扫描型隧道显微镜。本发明的装置至少包括一个光纤3，其光头部分被能量受体6所覆盖，棱镜上装有一个包含能量供给器7或被能量馈给器7覆盖的样品，XY 轴传送机构9，XY轴控制机构10，Z轴传送机构11，Z轴控制机构12，光源13，光学系统14和光学检测系统15。

5. 发明授权

US07507957B2 Probe microscope system suitable for observing sample of long body 有权
标题翻译：探头显微镜系统适用于长时间观察样品
公开(公告)号：US07507957B2
公开(公告)日：2009-03-24
申请号：US11216389
申请日：2005-08-31
申请人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
发明人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
IPC分类号： G01N23/00
CPC分类号： G01Q30/14 , G01Q10/06 , Y10S977/853 , Y10S977/86 , Y10S977/862 , Y10S977/869 , Y10S977/871
摘要： A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.
摘要翻译：本发明要解决的问题在于提供一种用于检测具有高分辨率和物理属性信息的形状的多功能分析装置，其不仅能够从一端到另一端连续读取基本排列，而且还指定与已知RNA杂交的位置到在板上沿一个方向伸长的单个DNA。本发明的显微镜系统设置有荧光显微镜，扫描型近场显微镜和扫描探针显微镜作为检测系统，将显微镜固定在切换机构上，并可移动到各种显微镜可以观察到的位置通过切换机构的操作来获取样品的相同部分。本发明的显微镜系统具有能够通过扫描探针显微镜通过多功能扫描直接检测一片DNA的形状和物理性质信息的功能。

6. 发明申请

US20060060778A1 Probe microscope system suitable for observing sample of long body 有权
公开(公告)号：US20060060778A1
公开(公告)日：2006-03-23
申请号：US11216389
申请日：2005-08-31
申请人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
发明人： Masamichi Fujihira , Masatoshi Yasutake , Tatsuaki Ataka
IPC分类号： G21K7/00
CPC分类号： G01Q30/14 , G01Q10/06 , Y10S977/853 , Y10S977/86 , Y10S977/862 , Y10S977/869 , Y10S977/871
摘要： A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

7. 发明授权

US5304795A High resolution observation apparatus with photon scanning microscope 失效
标题翻译：高分辨率观察装置与光子扫描显微镜
公开(公告)号：US5304795A
公开(公告)日：1994-04-19
申请号：US954317
申请日：1992-09-30
申请人： Masamichi Fujihira , Tatsuaki Ataka , Toshihiro Sakuhara
发明人： Masamichi Fujihira , Tatsuaki Ataka , Toshihiro Sakuhara
IPC分类号： G01B11/30 , G01Q20/02 , G01Q20/04 , G01Q60/18 , G02B6/00 , G11B7/005 , G11B11/00 , H01J3/14
CPC分类号： G01N21/552 , B82Y10/00 , B82Y20/00 , B82Y35/00 , G01N21/645 , G01N21/648 , G01Q60/04 , G01Q60/06 , G01Q60/16 , G01Q60/20 , G01Q60/22 , G01Q60/38 , G11B11/007 , G11B7/005 , G01Q80/00 , Y10S977/862
摘要： A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample and detects detailed distribution of optical constants of the sample. Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiates to the sample material coated on the top surface of the optical prism. The apparatus includes means for maintaining a predetermined distance between the sample and an optical fiber tip or means for detecting a positioning signal. Further, it becomes possible to detect fluorescent condition of the sample.
摘要翻译：具有光子扫描显微镜的材料特征的高分辨率观察装置。该装置检测取决于样品的表面特征的ev逝光，并检测样品的光学常数的详细分布。也就是说，该装置可以以比照射到涂覆在光学棱镜的顶表面上的样品材料的入射光的波长更高的分辨率来检测样品材料内的透明度或折射率的详细分布。该装置包括用于保持样品和光纤末端之间的预定距离的装置或用于检测定位信号的装置。此外，可以检测样品的荧光条件。

8. 发明授权

US6111342A Instrument for chemical measurement 失效
标题翻译：化学测量仪器
公开(公告)号：US6111342A
公开(公告)日：2000-08-29
申请号：US209638
申请日：1994-03-10
申请人： Hiroshi Muramatsu , Tatsuaki Ataka
发明人： Hiroshi Muramatsu , Tatsuaki Ataka
IPC分类号： G01N5/02 , G01N11/00 , G01N11/16 , G01N27/00 , G01N27/04 , G01N27/403 , G01N27/416 , H01L41/08
CPC分类号： G01N29/036 , G01N2291/0256
摘要： A quartz oscillator for detecting a physicochemical change in a substance to be measured comprises a first electrode having at least two separate electrode portions for contact with the substance to be measured, and a second electrode. A chemical measuring instrument comprises a piezoelectric characteristic-measuring circuit having an output signal line connected to capacitors connected in parallel to the separate electrode portions of the first electrode of the quartz oscillator. An input signal line of the piezoelectric characteristic-measuring circuit is connected to the second electrode of the quartz oscillator. A voltage application circuit is connected to one of the separate electrode portions of the first electrode for applying a voltage between the separate electrode portions. An electrical current-measuring circuit is connected to the other of the separate electrode portions which is electrically grounded. The resonant characteristics of the quartz oscillator and the conductivity on the surfaces of the electrodes can be simultaneously and effectively measured.
摘要翻译：用于检测待测物质的物理化学变化的石英振荡器包括具有至少两个用于与被测物质接触的分离电极部分的第一电极和第二电极。一种化学测量仪器包括压电特性测量电路，其具有连接到与石英振荡器的第一电极的分离电极部分并联连接的电容器的输出信号线。压电特性测量电路的输入信号线连接到石英振荡器的第二电极。电压施加电路连接到第一电极的单独电极部分之一，用于在分离的电极部分之间施加电压。电流测量电路连接到电接地的单独电极部分中的另一个。可以同时有效地测量石英振子的谐振特性和电极表面的导电性。

9. 发明授权

US6046053A Method for amino acid sequencing of protein or peptide from carboxy terminus thereof 失效
标题翻译：从羧基末端对蛋白质或肽进行氨基酸测序的方法
公开(公告)号：US6046053A
公开(公告)日：2000-04-04
申请号：US862625
申请日：1997-05-23
申请人： Akira Tsugita , Keiji Takamoto , Tatsuaki Ataka , Toshihiko Sakuhara , Toyoaki Uchida
发明人： Akira Tsugita , Keiji Takamoto , Tatsuaki Ataka , Toshihiko Sakuhara , Toyoaki Uchida
IPC分类号： G01N31/00 , C07K1/00 , G01N33/68 , G01N33/50 , G01N33/00
CPC分类号： G01N33/6821
摘要： A process is disclosed for sequencing proteins or peptides from the C-terminal end. The process comprises the steps of reacting the peptide or protein with an alkyl acid anhydride to convert the carboxy-terminal thereof into oxazolone, liberating the C-terminal amino acid by reaction with acid and alcohol or with ester, and identifying the liberated amino acid or amino acid derivative.
摘要翻译：公开了从C末端测序蛋白质或肽的方法。该方法包括以下步骤：使肽或蛋白质与烷基酸酐反应，将其羧基末端转化成恶唑酮，通过与酸和醇或酯反应释放C端氨基酸，并鉴定释放的氨基酸或氨基酸衍生物。

10. 发明授权

US5885434A Method and apparatus for performing fine working 失效
标题翻译：执行精细加工的方法和装置
公开(公告)号：US5885434A
公开(公告)日：1999-03-23
申请号：US829840
申请日：1997-04-01
申请人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
发明人： Masayuki Suda , Toshihiko Sakuhara , Tatsuaki Ataka
IPC分类号： B23H3/00 , B81C99/00 , C25D21/12 , C25F3/00 , C25F7/00 , G01N27/416 , G01Q60/10 , G01Q70/08 , G01Q80/00 , G11B9/14 , C25D17/00
CPC分类号： C25D21/12 , C25F3/00 , Y10S977/852 , Y10S977/855
摘要： A method for performing fine working of a material by electrochemical reaction comprises a two-step scanning operation in which a surface topography of the material is obtained during a first scan which is used to control the position of a probe during a second scan in which an electrochemical reaction is performed. During the first scan, an electrochemical cell is constructed with a four-electrode system, including the probe, a material to be worked, a reference electrode and a counter electrode. The potential of each of the probe and the material to be worked is set so that no electrochemical reaction occurs during the first scan. Data representative of the surface topography is stored and used to control the position of the probe during the second scan in which an electrochemical cell is constructed with a three-electrode system, including the probe, the material, and the reference electrode. The potential of the material with respect to the probe is set such that the electrochemical reaction occurs during the second scan, and the probe is maintained at a distance determined based on the stored topographical data.
摘要翻译：用于通过电化学反应进行材料精细加工的方法包括两步扫描操作，其中在第一扫描期间获得材料的表面形貌，其用于在第二扫描期间控制探针的位置，其中进行电化学反应。在第一次扫描期间，电化学电池由四电极系统构成，包括探针，待加工材料，参比电极和对电极。设置每个探针和待加工材料的电位，使得在第一次扫描期间不发生电化学反应。存储表示表面形貌的数据并用于在第二扫描期间控制探针的位置，其中使用包括探针，材料和参比电极的三电极系统构建电化学电池。材料相对于探针的电位被设定为使得在第二扫描期间发生电化学反应，并且探针被保持在基于存储的地形数据确定的距离。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式