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1. 发明授权

US08102527B2 Spectrometer assembly 有权
标题翻译：光谱仪组装
公开(公告)号：US08102527B2
公开(公告)日：2012-01-24
申请号：US12665665
申请日：2008-05-09
申请人： Helmut Becker-Ross , Michael Okruss , Stefan Florek
发明人： Helmut Becker-Ross , Michael Okruss , Stefan Florek
IPC分类号： G01J3/28
CPC分类号： G01J3/22 , G01J3/02 , G01J3/0208 , G01J3/08 , G01J3/1809 , G01J3/2823 , G01J3/32
摘要： The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.
摘要翻译：本发明涉及一种具有用于在检测器（34）上产生来自辐射源的辐射光谱的光谱仪的光谱仪装置（10），该光谱仪包括用于对进入光谱仪装置的辐射进行成像的光学成像Littrow布置（18,20） 16），用于对进入光谱仪装置的辐射的第一波长范围进行光谱分解的第一色散装置（28,30），用于第二波长的光谱分解的第二色散装置（58,60）进入光谱仪布置的辐射的范围以及布置在想象光学器件的图像平面中的公共检测器（34），其特征在于，成像光学装置（18,20）包括可在两者之间移动的元件（20）位置（20,50），其中在第一位置进入分光计装置的辐射经由第一分散装置被引导，并且经由第二分散布置。

2. 发明授权

US07876435B2 Method for determining background and correction of broadband background 有权
标题翻译：确定宽带背景背景和校正的方法
公开(公告)号：US07876435B2
公开(公告)日：2011-01-25
申请号：US11985798
申请日：2008-01-14
申请人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
IPC分类号： G01J3/28
CPC分类号： G01J3/2803 , G01J3/02 , G01J3/0202 , G01J3/06 , G01J3/1809 , G01J3/28 , G01J2003/2866
摘要： A method to determine and correct broadband background in complex spectra in a simple and automatized manner includes carrying out a background correction with respect to broadband background before a calibration step. The background correction may involve recording a spectral graph and smoothing the recorded spectral graph, determining all values in the initially recorded graph having a value higher than the value of the smoothed graph and reducing such values to the value of the smoothed graph, and repeating these two steps. The background graph obtained is then subtracted from the initial graph. The smoothing of the graph is carried out by moving average, where each intensity value I at the position x in the spectrum is replaced by an average value. The characteristics of the found peaks can be stored in a file so that the calibration can be used at any time.
摘要翻译：以简单且自动化的方式确定和校正复谱中的宽带背景的方法包括在校准步骤之前对宽带背景执行背景校正。背景校正可以包括记录光谱图并平滑所记录的光谱图，确定初始记录的图中具有高于平滑图的值的值的所有值，并将这些值减小为平滑图的值，并重复这些两步。然后从初始图中减去所获得的背景图。通过移动平均来进行曲线的平滑处理，其中频谱中位置x处的每个强度值I被平均值代替。找到的峰值的特征可以存储在文件中，以便可以随时使用校准。

3. 发明申请

US20080106735A1 Method for determining background and correction of broadband background 有权
标题翻译：确定宽带背景背景和校正的方法
公开(公告)号：US20080106735A1
公开(公告)日：2008-05-08
申请号：US11985798
申请日：2008-01-14
申请人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
IPC分类号： G01J3/28 , G06F19/00
CPC分类号： G01J3/2803 , G01J3/02 , G01J3/0202 , G01J3/06 , G01J3/1809 , G01J3/28 , G01J2003/2866
摘要： A method to determine and correct broadband background in complex spectra in a simple and automatized manner includes carrying out a background correction with respect to broadband background before a calibration step. The background correction may involve recording a spectral graph and smoothing the recorded spectral graph, determining all values in the initially recorded graph having a value higher than the value of the smoothed graph and reducing such values to the value of the smoothed graph, and repeating these two steps. The background graph obtained is then subtracted from the initial graph. The smoothing of the graph is carried out by moving average, where each intensity value I at the position x in the spectrum is replaced by an average value. The characteristics of the found peaks can be stored in a file so that the calibration can be used at any time.
摘要翻译：以简单且自动化的方式确定和校正复谱中的宽带背景的方法包括在校准步骤之前对宽带背景执行背景校正。背景校正可以包括记录光谱图并平滑所记录的光谱图，确定初始记录的图中具有高于平滑图的值的值的所有值，并将这些值减小为平滑图的值，并重复这些两步。然后从初始图中减去所获得的背景图。通过移动平均来进行曲线的平滑处理，其中频谱中位置x处的每个强度值I被平均值代替。找到的峰值的特征可以存储在文件中，以便可以随时使用校准。

4. 发明授权

US06717670B2 High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile 有权
标题翻译：高分辨率立体光谱仪和准同时测定波长和线轮廓的方法
公开(公告)号：US06717670B2
公开(公告)日：2004-04-06
申请号：US10168314
申请日：2002-06-20
申请人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
IPC分类号： G01J318
CPC分类号： G01J3/22 , G01J3/18
摘要： The invention relates to a spectrometer (10) with a dispersive element (16) that can be displaced between at least two positions. In the first position, the simply dispersed radiation (44) of a selected wavelength is reflected directly back in the incident beam path (42), while in the second position the dispersed radiation (32) of the selected wavelength can be directed to a reflective element (30) that is positioned such that the radiation (34) can be directed at least one more time across the dispersive element (16) and then back to the incident beam path (38). The spectrometer is provided with a device, for example, a mirror, an echelle grating or a prism that deflects the beam from the plane of dispersion, which is arranged in such a manner that the simply dispersed beam (34) runs in another plane than the multiply dispersed beam (36). The mirror (30) is inclined by an axis (54) that extends parallel to the plane of dispersion and perpendicular to the incident beam (32).
摘要翻译：本发明涉及一种具有分散元件（16）的分光计（10），其可在至少两个位置之间移位。在第一位置，所选择的波长的简单分散的辐射（44）被直接反射入入射光束路径（42），而在第二位置，所选波长的分散辐射（32）可以被引导到反射定位成使得辐射（34）可以穿过色散元件（16）至少一次以上并且然后返回到入射光束路径（38）的元件（30）。光谱仪设置有例如镜子，梯形光栅或棱镜，其将光束从分散体平面偏转，该棱镜以这样的方式布置，使得简单分散的光束（34）在另一个平面中延伸，多分散光束（36）。反射镜（30）由垂直于入射光束（32）平行延伸的轴（54）倾斜。

5. 发明申请

US20110285993A1 ECHELLE SPECTROMETER ARRANGEMENT USING INTERNAL PREDISPERSION 有权
标题翻译：使用内部预测的ECHELLE光谱仪布置
公开(公告)号：US20110285993A1
公开(公告)日：2011-11-24
申请号：US13147190
申请日：2010-01-25
申请人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Michael Okruss
IPC分类号： G01J3/40 , G01J3/443 , G01J3/42
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0213 , G01J3/2803 , G01J2003/1828
摘要： An Echelle spectrometer arrangement (10) with internal order separation contains an Echelle grating (34) and a dispersing element (38) for order separation so that a two-dimensional spectrum having a plurality of separate orders (56) can be generated, an imagine optical system (18, 22, 28, 46), a flat-panel detector (16), and predispersion means (20) for predispersing the radiation into the direction of traverse dispersion of the dispersion element (38). The arrangement is characterized in that the predispersion means (20) comprise a predispersion element which is arranged along the optical path behind the inlet spacing (12) inside the spectrometer arrangement. The imaging optical system is designed in such a manner that the predispersed radiation can be imaged onto an additional image plane (24) which does not have any boundaries in the predispersion direction and which is arranged along the optical path between the predispersion element (20) and the echelle grating (34). Optical means (20, 68) in the area of the predispersed spectrum are arranged to influence the spatial and/or the spectral beam density distribution on the detector (16).
摘要翻译：具有内部顺序分离的Echelle光谱仪装置（10）包含Echelle光栅（34）和分散元件（38），用于顺序分离，使得可以产生具有多个分开的阶数（56）的二维光谱，光学系统（18,22,28,46），平板检测器（16）和用于将辐射预分散到分散元件（38）的横向分散方向的预分散装置（20）。该装置的特征在于，预分散装置（20）包括预分散元件，该预分散元件沿着光谱仪装置内的入口间隔（12）的光路布置。成像光学系统被设计成使得预分散的辐射可以被成像到在预分散方向上没有任何边界并且沿着预分散元件（20）之间的光路布置的附加图像平面（24）上，和梯形光栅（34）。在预分散频谱的区域中的光学装置（20,68）被布置成影响检测器（16）上的空间和/或光谱光束密度分布。

6. 发明申请

US20100171953A1 Spectrometer Assembly 有权
标题翻译：光谱仪组装
公开(公告)号：US20100171953A1
公开(公告)日：2010-07-08
申请号：US12665665
申请日：2008-05-09
申请人： Helmut Becker-Ross , Michael Okruss , Stefan Florek
发明人： Helmut Becker-Ross , Michael Okruss , Stefan Florek
IPC分类号： G01J3/28
CPC分类号： G01J3/22 , G01J3/02 , G01J3/0208 , G01J3/08 , G01J3/1809 , G01J3/2823 , G01J3/32
摘要： The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.
摘要翻译：本发明涉及一种具有用于在检测器（34）上产生来自辐射源的辐射光谱的光谱仪的光谱仪装置（10），该光谱仪包括用于对进入光谱仪装置的辐射进行成像的光学成像Littrow布置（18,20） 16），用于对进入光谱仪装置的辐射的第一波长范围进行光谱分解的第一色散装置（28,30），用于第二波长的光谱分解的第二色散装置（58,60）进入光谱仪布置的辐射的范围以及布置在想象光学器件的图像平面中的公共检测器（34），其特征在于，成像光学装置（18,20）包括可在两者之间移动的元件（20）位置（20,50），其中在第一位置进入分光计装置的辐射经由第一分散装置被引导，并且经由第二分散布置。

7. 发明授权

US07319519B2 Method for the analysis of echelle spectra 有权
公开(公告)号：US07319519B2
公开(公告)日：2008-01-15
申请号：US10416566
申请日：2001-11-03
申请人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
发明人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
IPC分类号： G01J3/28
CPC分类号： G01J3/2803 , G01J3/02 , G01J3/0202 , G01J3/06 , G01J3/1809 , G01J3/28 , G01J2003/2866
摘要： A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function γm(x), determination of a provisional wavelength scale γ?m 1(x) for at least one neighboring order m 1, by means of addition/subtraction of a wavelength difference γFSR which corresponds to a free spectral region, according to γm 1 ?(x)=γm(x)γFSR with γFSR=γm(x)/m, determination of the wavelengths of lines in said neighboring order m 1, by means of the provisional wavelength scale γ 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighboring order.

8. 发明授权

US08873048B2 Spectrometer arrangement 有权
标题翻译：光谱仪布置
公开(公告)号：US08873048B2
公开(公告)日：2014-10-28
申请号：US13518797
申请日：2010-12-13
申请人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
发明人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
IPC分类号： G01J3/28 , G01J3/02 , G01J3/18 , G01J3/14
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0235 , G01J3/14 , G01J3/2803 , G01J2003/1828
摘要： A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).
摘要翻译：一种光谱仪组件（10），包括用于分散在主分散方向上进入光谱仪组件（10）的辐射的梯形光栅（18; 46）和用于分散从所述分散体组件（10; 40）产生的平行辐射束辐射进入光谱仪组件的横向分散方向，其特征在于分散体组件（16; 40）是反射性的，分散体组件（16; 40）相对于Echelle光栅（18; 46）平行辐射束在Echelle光栅的方向上反射的方式。可以将梯形光栅（18; 46）布置成使得分散的辐射被反射回到分散体组件（16; 40）。

9. 发明申请

US20120262713A1 SPECTROMETER ARRANGEMENT 有权
标题翻译：光谱仪布置
公开(公告)号：US20120262713A1
公开(公告)日：2012-10-18
申请号：US13518797
申请日：2010-12-13
申请人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
发明人： Stefan Florek , Michael Okruss , Helmut Becker-Ross
IPC分类号： G01J3/42
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/0235 , G01J3/14 , G01J3/2803 , G01J2003/1828
摘要： A spectrometer assembly (10), comprising an Echelle grating (18; 46) for dispersing radiation entering the spectrometer assembly (10) in a main dispersion direction, and a dispersion assembly (16; 40) for dispersing a parallel radiation bundle generated from the radiation entering the spectrometer assembly in a lateral dispersion direction, is characterized in that the dispersion assembly (16; 40) is reflective, and the dispersion assembly (16; 40) is arranged relative to the Echelle grating (18; 46) in such a way that the parallel radiation bundle is reflected in the direction of the Echelle grating. The Echelle grating (18; 46) may be arranged in such a way that the dispersed radiation is reflected back to the dispersion assembly (16; 40).
摘要翻译：一种光谱仪组件（10），包括用于分散在主分散方向上进入光谱仪组件（10）的辐射的梯形光栅（18; 46）和用于分散从所述分散体组件（10; 40）产生的平行辐射束辐射进入光谱仪组件的横向分散方向，其特征在于分散体组件（16; 40）是反射性的，分散体组件（16; 40）相对于Echelle光栅（18; 46）平行辐射束在Echelle光栅的方向上反射的方式。可以将梯形光栅（18; 46）布置成使得分散的辐射被反射回到分散体组件（16; 40）。

10. 发明申请

US20080094626A1 Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements 有权
标题翻译：通过两个光谱仪布置改进使用检测器的Echelle光谱仪
公开(公告)号：US20080094626A1
公开(公告)日：2008-04-24
申请号：US11629143
申请日：2005-06-02
申请人： Helmut Becker-Ross , Stefan Florek , Gunter Wesemann , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Gunter Wesemann , Michael Okruss
IPC分类号： G01J3/28
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0202 , G01J3/0208 , G01J3/021 , G01J3/0232 , G01J3/0237 , G01J3/0286 , G01J3/0294 , G01J3/08 , G01J3/12 , G01J3/2803
摘要： The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterised in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.
摘要翻译：本发明涉及一种分光计装置（10），其包括用于产生来自检测器（42）上的辐射源的第一波长范围的光谱仪（14）。所述布置还包括：用于在主色散方向（46）上穿透光谱仪装置（10）的辐射的光谱分解的梯形光栅（36）; 分散元件（34），用于通过在与梯形光栅（36）的主色散方向形成角度的横向色散方向（48）上的辐射的光谱分解来分离度数，使得两个可以用多个分离的度数（52）产生维度谱（50）; 用于在图像平面（40）中将穿过入口间隙（20）的辐射成像到成像光学装置（10）中的成像光学元件（24,38）; 以及包括所述图像平面（40）中的多个检测器元件的二维布置的表面检测器（42）。本发明的装置的特征在于，提供包括至少一个其它分散元件（64）和另一成像光学元件（60,66）的另一个光谱仪（12），以产生第二波长范围的辐射（68），其与第一波长范围不同，来自相同检测器（42）上的辐射源。光谱可以在检测器上进行空间或时间分离。

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