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1. 发明申请

US20080094626A1 Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements 有权
标题翻译：通过两个光谱仪布置改进使用检测器的Echelle光谱仪
公开(公告)号：US20080094626A1
公开(公告)日：2008-04-24
申请号：US11629143
申请日：2005-06-02
申请人： Helmut Becker-Ross , Stefan Florek , Gunter Wesemann , Michael Okruss
发明人： Helmut Becker-Ross , Stefan Florek , Gunter Wesemann , Michael Okruss
IPC分类号： G01J3/28
CPC分类号： G01J3/1809 , G01J3/02 , G01J3/0202 , G01J3/0208 , G01J3/021 , G01J3/0232 , G01J3/0237 , G01J3/0286 , G01J3/0294 , G01J3/08 , G01J3/12 , G01J3/2803
摘要： The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterised in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.
摘要翻译：本发明涉及一种分光计装置（10），其包括用于产生来自检测器（42）上的辐射源的第一波长范围的光谱仪（14）。所述布置还包括：用于在主色散方向（46）上穿透光谱仪装置（10）的辐射的光谱分解的梯形光栅（36）; 分散元件（34），用于通过在与梯形光栅（36）的主色散方向形成角度的横向色散方向（48）上的辐射的光谱分解来分离度数，使得两个可以用多个分离的度数（52）产生维度谱（50）; 用于在图像平面（40）中将穿过入口间隙（20）的辐射成像到成像光学装置（10）中的成像光学元件（24,38）; 以及包括所述图像平面（40）中的多个检测器元件的二维布置的表面检测器（42）。本发明的装置的特征在于，提供包括至少一个其它分散元件（64）和另一成像光学元件（60,66）的另一个光谱仪（12），以产生第二波长范围的辐射（68），其与第一波长范围不同，来自相同检测器（42）上的辐射源。光谱可以在检测器上进行空间或时间分离。

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