会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明申请
    • MICROWAVE PLASMA REACTOR FOR MANUFACTURING SYNTHETIC DIAMOND MATERIAL
    • 用于制造合成金刚石材料的微波等离子体反应器
    • US20150030786A1
    • 2015-01-29
    • US13994903
    • 2011-12-14
    • Steven Edward CoeJonathan James WilmanDaniel James TwitchenGeoffrey Alan ScarsbrookJohn Robert BrandonChristopher John Howard Wort
    • Steven Edward CoeJonathan James WilmanDaniel James TwitchenGeoffrey Alan ScarsbrookJohn Robert BrandonChristopher John Howard Wort
    • C23C16/455C23C16/511C23C16/27
    • C23C16/45563C23C16/274C23C16/45504C23C16/45565C23C16/511C30B25/105C30B29/04H01J37/32192H01J37/32238H01J37/3244H01J37/32449
    • A microwave plasma reactor for manufacturing synthetic diamond material via chemical vapour deposition, the microwave plasma reactor comprising: a plasma chamber; a substrate holder disposed in the plasma chamber for supporting a substrate on which the synthetic diamond material is to be deposited in use; a microwave coupling configuration for feeding microwaves from a microwave generator into the plasma chamber; and a gas flow system for feeding process gases into the plasma chamber and removing them therefrom; wherein the gas flow system comprises a gas inlet nozzle array comprising a plurality of gas inlet nozzles disposed opposite the substrate holder for directing process gases towards the substrate holder, the gas inlet nozzle array comprising: at least six gas inlet nozzles disposed in a substantially parallel or divergent orientation relative to a central axis of the plasma chamber; a gas inlet nozzle number density equal to or greater than 0.1 nozzles/cm2, wherein the gas inlet nozzle number density is measured by projecting the nozzles onto a plane whose normal lies parallel to the central axis of the plasma chamber and measuring the gas inlet number density on said plane; and a nozzle area ratio of equal to or greater than 10, wherein the nozzle area ratio is measured by projecting the nozzles onto a plane whose normal lies parallel to the central axis of the plasma chamber, measuring the total area of the gas inlet nozzle area on said plane, dividing by the total number of nozzles to give an area associated with each nozzle, and dividing the area associated with each nozzle by an actual area of each nozzle.
    • 一种通过化学气相沉积制造合成金刚石材料的微波等离子体反应器,所述微波等离子体反应器包括:等离子体室; 设置在等离子体室中的衬底保持器,用于支撑在使用中沉积合成金刚石材料的衬底; 用于将微波从微波发生器馈入等离子体室的微波耦合配置; 以及用于将工艺气体进料到等离子体室中并从中除去它们的气体流动系统; 其中所述气体流动系统包括气体入口喷嘴阵列,所述气体入口喷嘴阵列包括与所述衬底保持器相对设置的多个气体入口喷嘴,用于将工艺气体引向所述衬底保持器,所述气体入口喷嘴阵列包括:至少六个气体入口喷嘴, 或相对于等离子体室的中心轴线的发散取向; 气体入口喷嘴数密度等于或大于0.1喷嘴/ cm2,其中气体入口喷嘴数密度通过将喷嘴投影到平行于等离子体室的中心轴线的平面上并测量气体入口数 所述平面上的密度; 并且喷嘴面积比等于或大于10,其中通过将喷嘴投影到平行于等离子体室的中心轴的平面的平面上来测量喷嘴面积比,测量气体入口喷嘴面积的总面积 在所述平面上除以总喷嘴数量以给出与每个喷嘴相关联的区域,并且将与每个喷嘴相关联的区域除以每个喷嘴的实际面积。