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    • 9. 发明申请
    • Method for manufacturing semiconductor device
    • 制造半导体器件的方法
    • US20060040435A1
    • 2006-02-23
    • US11195725
    • 2005-08-03
    • Masafumi MorisueGen Fujii
    • Masafumi MorisueGen Fujii
    • H01L21/84
    • H01L27/1285H01L27/1292
    • It is an object of the present invention to provide a method for manufacturing a substrate having film patterns such as an insulating film, a semiconductor film, and a conductive film in simple processes. It is another object of the invention to provide a method for manufacturing a semiconductor device with high throughput and high yield at low cost. A method for manufacturing a semiconductor device including the steps of: forming a first film over a substrate; discharging a solution containing a mask material to the first film thereby forming a mask over the first film; patterning the first film with the use of the mask thereby forming low wettability regions and a high wettability region over the substrate; removing the mask; and discharging a solution containing a material of an insulating film, a semiconductor film, or a conductive film to the high wettability region provided between the low wettability regions thereby forming a pattern of the insulating film, the semiconductor film, or the conductive film.
    • 本发明的目的是提供一种在简单的工艺中制造具有绝缘膜,半导体膜和导电膜等膜图案的基板的方法。 本发明的另一个目的是提供一种以低成本生产高产量和高产率的半导体器件的方法。 一种制造半导体器件的方法,包括以下步骤:在衬底上形成第一膜; 将含有掩模材料的溶液排放到第一膜上,从而在第一膜上形成掩模; 通过使用掩模图案化第一膜,从而在衬底上形成低润湿性区域和高润湿性区域; 去除面膜; 并且将包含绝缘膜,半导体膜或导电膜的材料的溶液排出到设置在低润湿性区域之间的高润湿性区域,从而形成绝缘膜,半导体膜或导电膜的图案。