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    • 3. 发明授权
    • Integrated circuit chip package
    • 集成电路芯片封装
    • US5175397A
    • 1992-12-29
    • US632688
    • 1990-12-24
    • Frank A. Lindberg
    • Frank A. Lindberg
    • H01L23/498H01L23/50H01L23/58
    • H01L22/32H01L23/49838H01L23/50H01L2224/45124H01L2224/45144H01L2224/48227H01L24/45H01L24/48H01L2924/01079H01L2924/01322H01L2924/12042H01L2924/14H01L2924/16152H01L2924/30107
    • A hermetically sealed package for one or more integrated circuit chips that is made of three metal, thick-film layers, and one dielectric, thick-film layer to form a mounting surface for the chip. The first applied metal layer includes the power plane, and the fan-out leads including power and ground leads. The dielectric layer overlays the power plane and includes an annular rectangle overlaying a portion of all the leads of the first layer and an outer boundary strip overlaying extreme ends of the leads. The second screened metallic layer serves as the ground plane, and electrically engages the ground leads of the first metallic layer and the extreme outer ends of the signal leads. A third metallic layer includes a metallic sealing ring on the annular portion of the dielectric layer spaced from the perimeter of the power and ground planes and a plurality of spaced test probe pads overlaying the boundary strip in electrical contact with the first metallic layer, and an optional pad of metal in the central chip mount area. The power and ground leads are provided in the same layer which permits them to be closely spaced without shorting due to misregistration. The grounded metallic sealing ring minimizes capacitive coupling between the outwardly extending leads.
    • 用于一个或多个由三个金属,厚膜层和一个电介质厚膜层制成的集成电路芯片的密封封装,以形成芯片的安装表面。 第一个施加的金属层包括电源平面,并且扇出引线包括电源和接地引线。 电介质层覆盖电源平面并且包括覆盖第一层的所有引线的一部分的环形矩形和覆盖引线的末端的外边界条。 第二屏蔽金属层用作接地平面,并且电接合第一金属层的接地引线和信号引线的极端外端。 第三金属层包括在与电源和接地平面的周边隔开的电介质层的环形部分上的金属密封环以及覆盖与第一金属层电接触的边界条带的多个间隔的测试探针焊盘,以及 可选的金属垫在中央芯片安装区域。 电源和接地引线设置在相同的层中,这允许它们紧密间隔,而不会由于配准失调而短路。 接地的金属密封环最小化了向外延伸引线之间的电容耦合。
    • 9. 发明授权
    • Large scale integrated circuit test system
    • 大规模集成电路测试系统
    • US4760335A
    • 1988-07-26
    • US760386
    • 1985-07-30
    • Frank A. Lindberg
    • Frank A. Lindberg
    • G01R1/04H05K7/10H01R13/62G01R31/26
    • H05K7/1023G01R1/0408H01R12/714
    • A large scale integrated circuit package and test assembly wherein a chip is mounted on an insulating package substrate, and the package substrate is easily demountably connectable on a circuit test board. An alignment and electrical connector member bridges between the substrate conductors and the printed circuit board conductors. An elastomeric member is aligned over the alignment and electrical connector and compressed by a cover plate to make the electrical connection between the substrate and the printed circuit board. A plurality of such circuit package can be mounted upon a large area test board, and each of the individual circuit packages can be tested during system analysis.
    • 一种大规模集成电路封装和测试组件,其中芯片安装在绝缘封装衬底上,并且封装衬底容易可拆卸地连接在电路测试板上。 对准和电连接器构件在衬底导体和印刷电路板导体之间桥接。 弹性体构件对齐在对准和电连接器上并由盖板压缩以使得基板和印刷电路板之间的电连接。 可以在大面积测试板上安装多个这样的电路封装,并且可以在系统分析期间测试每个单独的电路封装。
    • 10. 发明授权
    • Method for manufacturing tape including lead frames
    • 用于制造包括引线框的胶带的方法
    • US4308339A
    • 1981-12-29
    • US119247
    • 1980-02-07
    • Frank A. Lindberg
    • Frank A. Lindberg
    • H01L21/48H01L21/60H01L21/66H01L23/495H01L23/50H01L23/58C23F1/02
    • H01L22/32H01L21/4828H01L21/4839H01L22/00H01L23/49572H01L24/50H01L2924/01322H01L2924/1306H01L2924/14H01L2924/3011
    • A metallic lead frame strip, method of manufacturing same, a test tape, a method of testing together with the art work for same is disclosed. The method of manufacturing includes a method for producing art work that provides for accuracy in etching both sides of the lead frame strip simultaneously and permits a highly accurate positioning of the bonding bumps of at least one integral bonding bump for each lead and also discloses leads having a plurality of bonding bumps for connecting electrically common portions of a chip to be tested. Also, the use of registration aids are disclosed which allow lead bumps to be registered to chip pads even though the bumps cannot be seen in the alignment step. The testing of the chip also includes a method and double-layer test strip that may be used repeatedly for testing successively larger chips having an increasing number of individual leads.
    • 公开了一种金属引线框带,其制造方法,测试带,与本技术相结合的测试方法。 制造方法包括一种用于制造艺术作品的方法,其提供同时蚀刻引线框架条的两侧的精度,并且允许针对每个引线的至少一个整体焊接凸块的焊接凸块的高精度定位,并且还公开了具有 用于连接待测试芯片的电气公共部分的多个接合凸块。 此外,公开了使用配准辅助装置,即使在对准步骤中看不到凸块,也可以将引线凸块注册到芯片焊盘。 该芯片的测试还包括一种方法和双层测试条,可以重复使用以测试具有越来越多的单个引线的连续更大的芯片。