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    • 6. 发明授权
    • Data storage medium and associated method
    • 数据存储介质及相关方法
    • US08445122B2
    • 2013-05-21
    • US12338281
    • 2008-12-18
    • Chrystel DeguetLaurent ClavelierFranck FournelJean-Sebastien Moulet
    • Chrystel DeguetLaurent ClavelierFranck FournelJean-Sebastien Moulet
    • G11C11/22H01L21/02
    • G11B9/02B82Y10/00G11B5/743G11B9/1472G11B9/149Y10T428/115
    • A data storage medium includes a carrier substrate having an electrode layer on the surface thereof and a sensitive material layer extending along the electrode layeradapted to be locally modified between two electrical states by the action of a localized electric field. A reference plane extends globally parallel to the sensitive material layer and is configured to accommodate at least one element for application of an electrostatic field in combination with the electrode layer the electrode layer including a plurality of conductive portions having a dimension at most equal to 100 nm in at least one direction parallel to the reference plane and separated by at least one electrically insulative zone, where at least some of the conductive portions are electrically interconnected, the conductive portions defining data write/read locations within the sensitive material layer.
    • 数据存储介质包括其表面上具有电极层的载体衬底和沿着电极层延伸的敏感材料层,所述敏感材料层通过局部电场的作用被局部地改变为两个电气状态。 参考平面全局平行于敏感材料层延伸,并且被配置为容纳用于与电极层组合施加静电场的至少一个元件,该电极层包括具有至多等于100nm的尺寸的多个导电部分 在平行于参考平面的至少一个方向上并且由至少一个电绝缘区隔开,其中至少一些导电部分电互连,导电部分在敏感材料层内限定数据写/读位置。
    • 7. 发明申请
    • DATA STORAGE MEDIUM AND ASSOCIATED METHOD
    • 数据存储介质及相关方法
    • US20090161405A1
    • 2009-06-25
    • US12338281
    • 2008-12-18
    • Chrystel DeguetLaurent ClavelierFranck FournelJean-Sebastien Moulet
    • Chrystel DeguetLaurent ClavelierFranck FournelJean-Sebastien Moulet
    • G11C11/22H01L21/02
    • G11B9/02B82Y10/00G11B5/743G11B9/1472G11B9/149Y10T428/115
    • A data storage medium includesa carrier substrate having an electrode layer on the surface,and a sensitive material layer extending along the electrode layer, the volume whereof is adapted to be locally modified between two electrical states by the action of a localized electric field.A reference plane extends globally parallel to the sensitive material layerand is configured to pass along it at least one element for application of an electrostatic field in combination with the electrode layer. The storage medium also includes, parallel to the reference plane, a plurality of conductive portions forming part of the electrode layer and separated by at least one electrically insulative zone, the electrically conductive portions having, in at least one direction parallel to the reference plane, a dimension at most equal to 100 nm, where at least some of the conductive portions are electrically interconnected, the conductive portions defining data write/read locations within the sensitive material layer.
    • 数据存储介质包括在表面上具有电极层的载体衬底和沿着电极层延伸的敏感材料层,其体积适于通过局部电场的作用在两个电气状态之间局部改变。 参考平面全局平行于敏感材料层延伸,并被配置为沿着至少一个元件传递静电场与电极层的组合。 存储介质还包括平行于参考平面的多个导电部分,其形成电极层的一部分并由至少一个电绝缘区隔开,导电部分在平行于参考平面的至少一个方向上具有, 至多等于100nm的尺寸,其中至少一些导电部分电互连,导电部分在敏感材料层内定义数据写入/读取位置。
    • 10. 发明授权
    • Method for manufacturing a SOI substrate associating silicon based areas and GaAs based areas
    • 制造与硅基区域和GaAs基区域相关联的SOI衬底的方法
    • US07608491B2
    • 2009-10-27
    • US11959924
    • 2007-12-19
    • Laurent ClavelierChrystel Deguet
    • Laurent ClavelierChrystel Deguet
    • H01L21/00
    • H01L31/184C30B19/12C30B23/025C30B25/18C30B29/08C30B29/42G02B6/12004G02B6/43H01L21/02381H01L21/02433H01L21/0245H01L21/02543H01L21/02546H01L21/02625H01L21/02639H01L21/02647H01L21/8258H01L21/84H01L27/1203Y02E10/544
    • The invention relates to a method for manufacturing an SOI substrate, associating silicon based areas and areas of GaAs based material at the thin layer of the SOI substrate, the SOI substrate comprising a silicon support supporting successively a layer of dielectric material and a thin layer of silicon. The method comprises the following steps: supply of a SOI substrate comprising a silicon support mismatched by an angle of between 2° and 10° inclusive, the thin silicon based layer being oriented parallel to the plane (001) or (010), or (100) or (110) or (101) or (011) or (111), preservation of at least one area of the thin silicon layer, elimination of at least one non-preserved area of the thin silicon layer until the layer of dielectric material is revealed, opening, in said non-preserved area, of the layer of dielectric material until the silicon support is revealed, growth, from the silicon of the support revealed by said opening and by liquid phase epitaxy or by lateral epitaxy, of mismatched germanium on the layer of dielectric material revealed, growth of GaAs based material from the mismatched germanium obtained in the preceding step.
    • 本发明涉及一种用于制造SOI衬底的方法,该SOI衬底的薄层将基于硅的区域和GaAs基材料的区域相关联,所述SOI衬底包括依次支撑介电材料层和硅层的薄层 硅。 该方法包括以下步骤:提供包含不同于2°和10°之间角度的硅载体的SOI衬底,所述薄硅基层平行于平面(001)或(010)或(010)定向,或( 100)或(110)或(101)或(011)或(111),保存薄硅层的至少一个区域,消除薄硅层的至少一个未保存区域直到电介质层 在所述非保存区域中,揭示介质材料层的开口,直到硅支撑体露出,从由所述开口显示的支撑体的硅和通过液相外延或横向外延生长的不匹配的 介电材料层上的锗显示出,在前面步骤中获得的来自错配锗的GaAs基材料的生长。