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    • 8. 发明授权
    • Method and apparatus for solid state molecular analysis
    • 固态分子分析方法和装置
    • US06573369B2
    • 2003-06-03
    • US09574519
    • 2000-05-18
    • Eric HendersonCurtis MosherMichael P. Lynch
    • Eric HendersonCurtis MosherMichael P. Lynch
    • C07H2102
    • G01N33/543C12Q1/6834C12Q1/6837Y10S977/853Y10S977/858C12Q2565/601C12Q2565/501
    • The invention is a method for the formation and analysis of novel miniature deposition domains. These deposition domains are placed on a surface to form a molecular array. The molecular array is scanned with an AFM to analyze molecular recognition events and the effect of introduced agents on defined molecular interactions. This approach can be carried out in a high throughput format, allowing rapid screening of thousands of molecular species in a solid state array. The procedures described here have the added benefit of allowing the measurement of changes in molecular binding events resulting from changes in the analysis environment or introduction of additional effector molecules to the assay system. The processes described herein are extremely useful in the search for compounds such as new drugs for treatment of undesirable physiological conditions. The method and apparatus of the present invention does not require the labeling of the deposition material or the target sample and may also be used to deposit large size molecules without harming the same.
    • 本发明是形成和分析新型微型沉积区域的方法。 将这些沉积区域放置在表面上以形成分子阵列。 用AFM扫描分子阵列以分析分子识别事件以及引入的试剂对定义的分子相互作用的影响。 该方法可以以高通量格式进行,允许在固态阵列中快速筛选成千上万个分子物质。 这里描述的程序具有允许测量由分析环境的变化引起的分子结合事件的变化或将附加效应分子引入测定系统的附加益处。 本文所述的方法在寻找用于治疗不良生理条件的新药物等化合物方面非常有用。 本发明的方法和装置不需要对沉积材料或目标样品进行标记,也可以用于沉积大尺寸分子而不伤害它们。
    • 10. 发明申请
    • NOVEL ENHANCED PROCESSES FOR MOLECULAR SCREENING AND CHARACTERIZATION
    • 用于分子筛选和表征的新型增强方法
    • US20100154086A1
    • 2010-06-17
    • US11776511
    • 2007-07-11
    • Eric HendersonCurtis Mosher
    • Eric HendersonCurtis Mosher
    • G01Q60/24
    • G01Q60/42
    • A general high-throughput screening (HTS) process using an atomic force microscope (AFM) to detect and measure molecular recognition events. The AFM is used to measure changes in molecular complex height, friction, shape, elasticity or any other relevant parameters that report a molecular recognition event. In addition, the force involved in molecular recognition and bonding is directly measured using the technique of force spectroscopy. In one embodiment, a flow chamber is used to introduce molecules and assay their effect on a molecular interaction occurring between molecules on the AFM probe and a surface. In some cases the surface may be an introduced microparticle. In a second embodiment, the sample is a solid phase array of molecules that is interrogated by a functionalized AFM probe, and the effects of introduced agents at each molecular address in the array is measured by force spectroscopy.
    • 使用原子力显微镜(AFM)检测和测量分子识别事件的通用高通量筛选(HTS)过程。 AFM用于测量分子复合物高度,摩擦,形状,弹性或报告分子识别事件的任何其他相关参数的变化。 此外,使用力光谱技术直接测量参与分子识别和结合的力。 在一个实施方案中,流动室用于引入分子并测定它们对在AFM探针和表面上的分子之间发生的分子相互作用的影响。 在一些情况下,表面可以是引入的微粒。 在第二个实施方案中,样品是由功能化的AFM探针询问的分子的固相阵列,并且通过力谱测量在阵列中的每个分子地址处引入的试剂的影响。