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1. 发明授权

US07574644B2 Functional pattern logic diagnostic method 失效
标题翻译：功能模式逻辑诊断方法
公开(公告)号：US07574644B2
公开(公告)日：2009-08-11
申请号：US11166019
申请日：2005-06-25
申请人： Donato Forlenza , Franco Molika , Phillip J. Nigh
发明人： Donato Forlenza , Franco Molika , Phillip J. Nigh
IPC分类号： G06F11/00
CPC分类号： G01R31/318586 , G01R31/318544
摘要： A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on functional failure by determining the location of the type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.
摘要翻译：一种诊断半导体器件功能测试故障的方法，通过组合确定性和功能测试，通过确定故障电路中错误类型的位置，基于功能故障创建新的测试模式。这是通过在功能测试期间识别故障向量来实现的，通过在故障向量之前从LSSD扫描链中卸载锁存器的值来观察故障设备的状态，从锁存器的未加载状态生成LOAD，应用生成LOAD作为新创建的独立LSSD确定性模式的第一个事件，将产生故障的主输入和时钟应用于正确操作的设备，卸载正确操作设备的输出以生成确定性LSSD模式; 以及将生成的确定性LSSD模式应用于故障设备，以使用现有的LSSD确定性工具来诊断故障。

2. 发明申请

US20050289426A1 Functional pattern logic diagnostic method 失效
标题翻译：功能模式逻辑诊断方法
公开(公告)号：US20050289426A1
公开(公告)日：2005-12-29
申请号：US11166019
申请日：2005-06-25
申请人： Donato Forlenza , Franco Molika , Phillip Nigh
发明人： Donato Forlenza , Franco Molika , Phillip Nigh
IPC分类号： G01R31/3185 , G01R31/28 , G06F11/00
CPC分类号： G01R31/318586 , G01R31/318544
摘要： A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on functional failure by determining the location of the type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.
摘要翻译：一种诊断半导体器件功能测试故障的方法，通过组合确定性和功能测试，通过确定故障电路中错误类型的位置，基于功能故障创建新的测试模式。这是通过在功能测试期间识别故障向量来实现的，通过在故障向量之前从LSSD扫描链中卸载锁存器的值来观察故障设备的状态，从锁存器的未加载状态生成LOAD，应用生成LOAD作为新创建的独立LSSD确定性模式的第一个事件，将产生故障的主输入和时钟应用于正确操作的设备，卸载正确操作设备的输出以生成确定性LSSD模式; 以及将生成的确定性LSSD模式应用于故障设备，以使用现有的LSSD确定性工具来诊断故障。

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