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1. 发明授权

US09329054B2 Adjustment of measurement system components 有权
标题翻译：测量系统组件的调整
公开(公告)号：US09329054B2
公开(公告)日：2016-05-03
申请号：US13432939
申请日：2012-03-28
申请人： David T. Crook , Areef A. Moin
发明人： David T. Crook , Areef A. Moin
IPC分类号： G01D3/02 , G01N21/64
CPC分类号： G01N21/645 , G01D3/022 , G01N21/643 , G01N2021/6432 , G01N2201/12723
摘要： One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.
摘要翻译：一个方面提供一种包括传感器调节部件的系统，包括：具有存储在其中的调节信息的存储器装置; 信号源能够产生可由传感器检测的信号进行调节; 和一个或多个处理器; 其中所述一个或多个处理器被配置为执行程序指令以操作所述信号源以产生可由待调整的所述传感器的测量部件检测的预定信号图案; 并且其中所述预定信号图案包括所述调整信息。公开其他方面。

2. 发明申请

US20130256515A1 ADJUSTMENT OF MEASUREMENT SYSTEM COMPONENTS 有权
标题翻译：测量系统组件的调整
公开(公告)号：US20130256515A1
公开(公告)日：2013-10-03
申请号：US13432939
申请日：2012-03-28
申请人： David T. Crook , Areef A. Moin
发明人： David T. Crook , Areef A. Moin
IPC分类号： G01J1/42
CPC分类号： G01N21/645 , G01D3/022 , G01N21/643 , G01N2021/6432 , G01N2201/12723
摘要： One aspect provides a system including a sensor adjustment component comprising: a memory device having adjustment information stored therein; signal source capable of producing a signal detectable by a sensor to be adjusted; and one or more processors; wherein the one or more processors are configured to execute program instructions to operate the signal source to produce a predetermined signal pattern detectable by a measurement component of the sensor to be adjusted; and wherein the predetermined signal pattern comprises the adjustment information. Other aspects are disclosed.
摘要翻译：一个方面提供一种包括传感器调节部件的系统，包括：具有存储在其中的调节信息的存储器装置; 信号源能够产生可由传感器检测的信号进行调节; 和一个或多个处理器; 其中所述一个或多个处理器被配置为执行程序指令以操作所述信号源以产生可由待调整的所述传感器的测量部件检测的预定信号图案; 并且其中所述预定信号图案包括所述调整信息。公开其他方面。

3. 发明授权

US06549079B1 Feedback systems for enhanced oscillator switching time 有权
标题翻译：用于增强振荡器切换时间的反馈系统
公开(公告)号：US06549079B1
公开(公告)日：2003-04-15
申请号：US10008433
申请日：2001-11-09
申请人： David T. Crook
发明人： David T. Crook
IPC分类号： H03L700
CPC分类号： H03L7/107 , H03L7/0898 , H03L7/095 , H03L7/18 , Y10S331/02
摘要： Feedback control loop systems are provided that enhance output-signal switching times without degrading other loop performance parameters. The systems reduce “kick-back” voltages that are generated in a loop filter by drive currents which rapidly drive a control loop oscillator to a loop acquisition range. This reduction reduces a frequency step in the oscillator output signal which would otherwise have to be driven to eliminate the frequency step with a consequent increase in the output-signal switching time. Structures are provided that reduce the kick-back voltage to thereby enhance output-signal switching times.
摘要翻译：提供了反馈控制回路系统，可以增强输出信号切换时间，而不会降低其他回路性能参数。系统通过驱动电流降低在环路滤波器中产生的“反冲”电压，驱动电流将控制环路振荡器快速驱动到回路采集范围。这种减少减少了振荡器输出信号中的频率步长，否则，必须驱动振荡器输出信号以消除频率步长，从而导致输出信号切换时间的增加。提供了降低反冲电压从而增强输出信号切换时间的结构。

4. 发明授权

US06522206B1 Adaptive feedback-loop controllers and methods for rapid switching of oscillator frequencies 有权
标题翻译：自适应反馈回路控制器和快速切换振荡器频率的方法
公开(公告)号：US06522206B1
公开(公告)日：2003-02-18
申请号：US09973281
申请日：2001-10-09
申请人： John J. Kornblum , David T. Crook
发明人： John J. Kornblum , David T. Crook
IPC分类号： H03L700
CPC分类号： H03L7/107 , H03L7/0898 , H03L7/095 , H03L7/113 , Y10S331/02
摘要： Feedback methods and systems are provided to achieve rapid switching of oscillator frequencies without compromising operational feedback loop bandwidths that filter out spurious tones and phase noise to thereby enhance loop spectral and noise performance. The methods respond to frequency changes in a reference signal by providing an open-loop drive current to drive a feedback signal towards the reference signal. The drive current is terminated and the feedback control loop closed when the feedback signal is within a predetermined acquisition range of the reference signal. This is determined by successively comparing a feedback frequency of the feedback signal to a destination frequency of the reference signal over a comparison window of time. The invention also provides a feedback control system that practices the invention's methods.
摘要翻译：提供反馈方法和系统以实现振荡器频率的快速切换，而不会影响滤除伪噪声和相位噪声的操作反馈环路带宽，从而增强环路频谱和噪声性能。该方法通过提供开环驱动电流来驱动参考信号的反馈信号来响应参考信号中的频率变化。当反馈信号在参考信号的预定采集范围内时，驱动电流终止并且反馈控制回路闭合。这通过在比较时间窗口上连续地比较反馈信号的反馈频率与参考信号的目的地频率来确定。本发明还提供了实现本发明方法的反馈控制系统。

5. 发明授权

US5557209A Identification of pin-open faults by capacitive coupling through the integrated circuit package 失效
标题翻译：通过集成电路封装的电容耦合识别引脚开路故障
公开(公告)号：US5557209A
公开(公告)日：1996-09-17
申请号：US400787
申请日：1995-03-07
申请人： David T. Crook , Kevin W. Keirn , Ugur Cilingiroglu
发明人： David T. Crook , Kevin W. Keirn , Ugur Cilingiroglu
IPC分类号： G01R31/04 , G01R31/312 , G01R31/02
CPC分类号： G01R31/048 , G01R31/046 , G01R31/312
摘要： Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.
摘要翻译：公开了一种确定半导体部件的输入和输出引脚是否存在并被适当地焊接到印刷电路板的系统。该系统使用一个振荡器，该信号通常以0.2伏特的十千赫兹（10 kHz）信号提供给被测试的引脚。导电电极放置在组件封装的顶部。电极连接到电流测量装置。组件的另一个引脚连接到公共信号返回。通常，另一个引脚被选择为部件的电源或接地引脚。

6. 发明授权

US5469064A Electrical assembly testing using robotic positioning of probes 失效
标题翻译：使用机器人定位探针进行电气组装测试
公开(公告)号：US5469064A
公开(公告)日：1995-11-21
申请号：US122031
申请日：1993-09-15
申请人： Ronald K. Kerschner , John M. Heumann , John E. McDermid , Ed. O. Schlotzhauer , David T. Crook
发明人： Ronald K. Kerschner , John M. Heumann , John E. McDermid , Ed. O. Schlotzhauer , David T. Crook
IPC分类号： G01R1/06 , F02P17/00 , G01R1/067 , G01R1/07 , G01R31/02 , G01R31/26 , G01R31/28 , G01R31/302 , G01R31/312
CPC分类号： G01R1/07 , G01R31/2806 , G01R31/2886 , G01R31/312 , F02P2017/006 , G01R31/3025
摘要： The present invention is an improved printed circuit board test system in which test probes are positioned to electronically engage a selected device or printed circuit board section on a printed circuit board for testing the printed circuit board for manufacturing defects. The printed circuit board test system uses a bed-of-nails test fixture to ground and excite predetermined sites on a first side of the printed circuit board and a robot to mechanically position test probe(s) at selected test sites on a second side of the printed circuit board. A controller is used to control the movement of the robotic tester and the selection of spring probes in the bed-of-nails fixture to be exited, grounded or measured.
摘要翻译：本发明是一种改进的印刷电路板测试系统，其中测试探针定位成电子地接合印刷电路板上的所选择的装置或印刷电路板部分，以测试用于制造缺陷的印刷电路板。印刷电路板测试系统使用床钉测试夹具来研磨并激发印刷电路板的第一侧上的预定位置，并且机器人将测试探针机械地定位在位于第二侧的选定测试位置印刷电路板。控制器用于控制机器人测试仪的运动和选择要退出，接地或测量的指甲夹具中的弹簧探头。

7. 发明授权

US5381417A Circuit testing system 失效
标题翻译：电路测试系统
公开(公告)号：US5381417A
公开(公告)日：1995-01-10
申请号：US8472
申请日：1993-01-25
申请人： Alex Loopik , David T. Crook
发明人： Alex Loopik , David T. Crook
IPC分类号： G01R31/28 , G06F15/20
CPC分类号： G01R31/2846 , G01R31/2806 , Y10S706/919
摘要： The present invention relates to the field of circuit assembly testing systems and provides improved systems and methods for debugging circuit test systems and diagnosing faults in circuit assemblies. An expert system derives possible root causes of test failures, predicts test results based on these possible root causes and uses factual observations to refute inconsistent hypothetical root causes. Tests useful in refuting inconsistent hypothetical root causes are devised and run automatically by the system.
摘要翻译：本发明涉及电路组装测试系统领域，并提供用于调试电路测试系统和诊断电路组件中的故障的改进的系统和方法。专家系统可能导致测试失败的根本原因，根据这些可能的根本原因预测测试结果，并使用事实观察来反驳不一致的假设根本原因。用于反驳不一致假设根本原因的测试由系统自动设计和运行。

8. 发明授权

US5254953A Identification of pin-open faults by capacitive coupling through the integrated circuit package 失效
标题翻译：通过集成电路封装的电容耦合识别引脚开路故障
公开(公告)号：US5254953A
公开(公告)日：1993-10-19
申请号：US892868
申请日：1992-06-03
申请人： David T. Crook , Kevin W. Keirn , Ugur Cilingiroglu
发明人： David T. Crook , Kevin W. Keirn , Ugur Cilingiroglu
IPC分类号： G01R31/02 , G01R31/04 , G01R31/28 , G01R31/312
CPC分类号： G01R31/046 , G01R31/048 , G01R31/312 , H01L2224/48247 , H01L2924/01019 , H01L2924/19041 , H01L2924/30107 , H01L2924/3011 , H01L2924/3025
摘要： Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kiloHertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.
摘要翻译：公开了一种确定半导体部件的输入和输出引脚是否存在并被适当地焊接到印刷电路板的系统。该系统使用振荡器，该信号通常以0.2伏特的十千赫兹（10千赫兹）提供给被测试的引脚。导电电极放置在组件封装的顶部。电极连接到电流测量装置。组件的另一个引脚连接到公共信号返回。通常，另一个引脚被选择为部件的电源或接地引脚。

9. 发明授权

US07492170B2 Probe based information storage for probes used for opens detection in in-circuit testing 失效
标题翻译：用于在线测试中用于打开检测的探针的基于探测器的信息存储
公开(公告)号：US07492170B2
公开(公告)日：2009-02-17
申请号：US11498548
申请日：2006-08-03
申请人： David T. Crook , Curtis A Tesdahl
发明人： David T. Crook , Curtis A Tesdahl
IPC分类号： G01R27/26 , G01R31/02
CPC分类号： G01R1/06766 , G01R35/005
摘要： Disclosed is a novel electrical probe that stores probe-specific information. A probe implemented in accordance with the invention includes a processor, memory, and a communications interface. Probe-specific information such as a probe identifier and/or calibration parameters that affect the true value of a measurement are stored in the probe memory. The probe-specific information may be retrieved by the processor from the probe memory via the communications interface.
摘要翻译：公开了一种新颖的电探针，其存储探针特异性信息。根据本发明实现的探针包括处理器，存储器和通信接口。诸如探针标识符和/或影响测量真实值的校准参数的探针特定信息存储在探针存储器中。探针特定信息可以由处理器经由通信接口从探针存储器检索。

10. 发明授权

US06377901B1 Method and apparatus for adaptively learning test measurement delays on an individual device test for reducing total device test time 失效
标题翻译：用于在单个设备测试中自适应地测试测试测量延迟的方法和装置，用于减少总设备测试时间
公开(公告)号：US06377901B1
公开(公告)日：2002-04-23
申请号：US09259866
申请日：1999-03-01
申请人： Steven K List , David T. Crook
发明人： Steven K List , David T. Crook
IPC分类号： G01R3114
CPC分类号： G01R31/3016 , G01R31/31937
摘要： An adaptive delay learning algorithm is presented that reduces the amount of delay before making test measurements in an automated test that requires a delay of any type to be completed before a measurement is made in order to remove the possibility that a tester component lying in the measurement path has not achieved a ready state. In the execution of an automated test, a current delay time is set to an initial delay value. Test execution does not begin until the current delay time elapses. If, upon execution, the test fails, the current delay time is set to a different delay time, and the test is reexecuted only after the updated current delay time has elapsed.
摘要翻译：提出了一种自适应延迟学习算法，在进行测量之前，需要在任何类型的延迟进行测量之前，进行测试测量之前减少延迟量，以消除测量仪器在测量中的可能性路径尚未实现准备状态。在执行自动测试时，将当前延迟时间设置为初始延迟值。直到目前的延迟时间过去，测试执行才会开始。如果执行测试失败，则当前延迟时间设置为不同的延迟时间，并且只有在更新的当前延迟时间过后才能重新执行测试。

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