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1. 发明授权

US06735114B1 Method of improving dynamic reference tracking for flash memory unit 有权
标题翻译：改进闪存单元动态参考跟踪的方法
公开(公告)号：US06735114B1
公开(公告)日：2004-05-11
申请号：US10357879
申请日：2003-02-04
申请人： Darlene G. Hamilton , Eric M. Ajimine , Ming-Huei Shieh , Lee Cleveland , Edward F. Runnion , Mark W. Randolph , Sameer S. Haddad
发明人： Darlene G. Hamilton , Eric M. Ajimine , Ming-Huei Shieh , Lee Cleveland , Edward F. Runnion , Mark W. Randolph , Sameer S. Haddad
IPC分类号： G11C1604
CPC分类号： G11C16/3418 , G11C16/0475 , G11C16/28
摘要： A method of programming a memory unit having a plurality of dual cell core memory devices and at least one dual cell dynamic reference device. The memory unit is subjected to an erase configuration operation such that each cell of the core memory devices is in a blank state and such that a threshold voltage of the at least one dynamic reference device is less than a charged program level threshold voltage. Thereafter, the at least one dynamic reference and the core memory devices are programmed using a page programming routine.
摘要翻译：一种编程具有多个双单元核心存储器件和至少一个双单元动态参考器件的存储器单元的方法。对存储器单元进行擦除配置操作，使得核心存储器件的每个单元处于空白状态，并且使得至少一个动态参考器件的阈值电压小于充电的程序电平阈值电压。此后，使用页面编程例程对至少一个动态参考和核心存储器设备进行编程。

2. 发明授权

US06944057B1 Method to obtain temperature independent program threshold voltage distribution using temperature dependent voltage reference 有权
标题翻译：使用温度依赖电压参考获得温度独立程序阈值电压分布的方法
公开(公告)号：US06944057B1
公开(公告)日：2005-09-13
申请号：US10431065
申请日：2003-05-06
申请人： Edward F. Runnion , Tien-Chun Yang , Binh Quang Le , Shigekazu Yamada , Darlene G. Hamilton , Ming-Huei Shieh , Pau-Ling Chen , Kazuhiro Kurihara
发明人： Edward F. Runnion , Tien-Chun Yang , Binh Quang Le , Shigekazu Yamada , Darlene G. Hamilton , Ming-Huei Shieh , Pau-Ling Chen , Kazuhiro Kurihara
IPC分类号： G11C16/06
CPC分类号： G11C16/3418 , G11C16/10
摘要： A method for controlling gate voltage in a memory device is described. The method includes providing a circuit that is adapted to be coupled with the memory device. The circuit is for generating a reference voltage. The method further includes utilizing the reference voltage provided by the circuit to apply a voltage at a gate of the memory device. The voltage has a value corresponding to a temperature of the memory device. The method also includes retaining a proportional relationship between the reference voltage and the temperature of the memory device, regardless of the change in the temperature of the memory device. The reference voltage provides a substantially constant programming time for the memory device regardless of the temperature of the memory device.
摘要翻译：描述了一种用于控制存储器件中的栅极电压的方法。该方法包括提供适于与存储器件耦合的电路。该电路用于产生参考电压。该方法还包括利用由电路提供的参考电压来在存储器件的栅极处施加电压。电压具有对应于存储器件的温度的值。该方法还包括保持参考电压与存储器件的温度之间的比例关系，而与存储器件的温度变化无关。参考电压为存储器件提供基本上恒定的编程时间，而与存储器件的温度无关。

3. 发明授权

US06771545B1 Method for reading a non-volatile memory cell adjacent to an inactive region of a non-volatile memory cell array 有权
标题翻译：用于读取与非易失性存储单元阵列的非活动区域相邻的非易失性存储单元的方法
公开(公告)号：US06771545B1
公开(公告)日：2004-08-03
申请号：US10353558
申请日：2003-01-29
申请人： Edward Hsia , Eric Ajimine , Darlene G. Hamilton , Pauling Chen , Ming-Huei Shieh , Mark W. Randolph , Edward Runnion , Yi He
发明人： Edward Hsia , Eric Ajimine , Darlene G. Hamilton , Pauling Chen , Ming-Huei Shieh , Mark W. Randolph , Edward Runnion , Yi He
IPC分类号： G11C1604
CPC分类号： G11C29/82 , G11C16/0491 , G11C16/3404
摘要： An array of non-volatile memory cells includes active columns of cells wherein a data pattern may be stored adjacent to damaged or inactive columns wherein data is not stored. A method of storing a data pattern and reproducing the data pattern within such an array comprises storing a charge within a selected plurality of the memory cells within the active column. The selected plurality of memory cells represents a portion of the data pattern. An inactive memory cell programming pattern is identified. The inactive memory cell programming pattern identifies all, or a selected plurality, of the memory cells in the inactive column in which a charge is to be stored for the purpose of periodically storing a charge in the memory cells first inactive column to prevent over erasure, during bulk erase, and leakage from the inactive cells to adjacent active cells. A charge is stored on the selected plurality of the memory cells in the first inactive column. The data pattern is reproduced reading each memory cell within the first active column.
摘要翻译：非易失性存储器单元的阵列包括有效的单元格列，其中数据模式可以存储在与不存储数据的损坏或非活动列相邻的位置。存储数据模式并在其中再现数据模式的方法包括将电荷存储在活动列内的所选择的多个存储单元内。所选择的多个存储单元表示数据模式的一部分。识别非活动存储器单元编程模式。非活动存储器单元编程模式识别要在其中存储电荷的所述非活动列中的所有或选定的多个存储单元，以便在存储单元的第一非活动列中周期性地存储电荷以防止过度擦除，在批量擦除期间以及从非活性电池泄漏到相邻的活性电池。在第一非活动列中的所选择的多个存储器单元上存储电荷。读取在第一活动列内的每个存储单元的数据模式。

4. 发明授权

US06822909B1 Method of controlling program threshold voltage distribution of a dual cell memory device 有权
标题翻译：控制双电池存储器件的程序阈值电压分布的方法
公开(公告)号：US06822909B1
公开(公告)日：2004-11-23
申请号：US10422090
申请日：2003-04-24
申请人： Darlene G. Hamilton , Edward Hsia , Mark W. Randolph , Edward F. Runnion , Kulachet Tanpairoj
发明人： Darlene G. Hamilton , Edward Hsia , Mark W. Randolph , Edward F. Runnion , Kulachet Tanpairoj
IPC分类号： G11C1134
CPC分类号： G11C16/0475 , G11C11/5671 , G11C16/3454
摘要： A method of programming a dual cell memory device having a first charge storing cell and a second charge storing cell. The method can include applying an initial program pulse to the memory device; comparing the threshold voltage of the memory device with a verify threshold voltage; and if the threshold voltage of the memory device is less than the verify threshold voltage, applying a second program pulse to the memory device during which at least one condition of the second program pulse is modified from the initial program pulse.
摘要翻译：一种编程具有第一电荷存储单元和第二电荷存储单元的双单元存储器件的方法。该方法可以包括将初始编程脉冲施加到存储器件; 将存储器件的阈值电压与验证阈值电压进行比较; 并且如果所述存储器件的阈值电压小于所述验证阈值电压，则向所述存储器件施加第二编程脉冲，在所述存储器件期间，从所述初始编程脉冲修改所述第二编程脉冲的至少一个条件。

5. 发明授权

US06788583B2 Pre-charge method for reading a non-volatile memory cell 失效
标题翻译：用于读取非易失性存储单元的预充电方法
公开(公告)号：US06788583B2
公开(公告)日：2004-09-07
申请号：US10307749
申请日：2002-12-02
申请人： Yi He , Edward F. Runnion , Zhizheng Liu , Mark W. Randolph , Darlene G. Hamilton , Pauling Chen , Binh Le
发明人： Yi He , Edward F. Runnion , Zhizheng Liu , Mark W. Randolph , Darlene G. Hamilton , Pauling Chen , Binh Le
IPC分类号： G11C1606
CPC分类号： G11C7/12 , G11C16/0475 , G11C16/24
摘要： A method of detecting a charge stored on a charge storage region of a first dual bit dielectric memory cell within an array of dual bit dielectric memory cells comprises grounding a first bit line that forms a source junction with a channel region of the first memory cell. A high voltage is applied to a gate of the first memory cell and to a second bit line that is the next bit line to the right of the first bit line and separated from the first bit line only by the channel region. A third bit line, that is the next bit line to the right of the second bit line, is isolated such that its potential is effected only by its junctions with the a second channel region and a third channel region on opposing sides of the third bit line. A high voltage is applied to a pre-charge bit line that is to the right of the third bit line and current flow is detected at the second bit line to determine the programmed status of a source bit of the memory cell.
摘要翻译：一种检测存储在双位介质存储器单元阵列内的第一双位介质存储单元的电荷存储区域上的电荷的方法包括使与第一存储单元的沟道区形成源极结的第一位线接地。高电压被施加到第一存储单元的栅极和第二位线，第二位线是第一位线右侧的下一个位线，并且仅与通道区域从第一位线分离。位于第二位线右侧的下一个位线的第三位线是隔离的，使得其电位仅由其与第二通道区域的结和仅在第三位的相对侧上的第三通道区域线。将高电压施加到位于第三位线右侧的预充电位线，并且在第二位线处检测电流以确定存储器单元的源位的编程状态。

6. 发明授权

US06901010B1 Erase method for a dual bit memory cell 有权
标题翻译：双位存储单元的擦除方法
公开(公告)号：US06901010B1
公开(公告)日：2005-05-31
申请号：US10119366
申请日：2002-04-08
申请人： Darlene G. Hamilton , Eric M. Ajimine , Binh Le , Edward Hsia , Ken Tanpairoj
发明人： Darlene G. Hamilton , Eric M. Ajimine , Binh Le , Edward Hsia , Ken Tanpairoj
IPC分类号： G11C16/02 , G11C16/04 , G11C7/00
CPC分类号： G11C16/107 , G11C16/0475 , G11C16/3409 , G11C16/3445 , G11C2216/18
摘要： An erase methodology of flash memory cells in a multi-bit memory array with bits disposed in normal and complimentary locations. An erase verify of bits in the normal locations is performed and if a bit in the normal location fails and if the maximum erase pulse count has not been reached, erase pulses are applied to both the normal bit and the complimentary bit. An erase verify of bits in the complimentary locations is performed and if a bit in the complimentary location fails and if the maximum erase pulse count has not been reached, erase pulses are applied to both the complimentary and the normal bit locations. If the bits pass the erase verify, the bits are subjected to a soft programming verify. If the bits are overerased and if the soft programming pulse count has not been reached a soft programming pulse is applied to the overerased bit.
摘要翻译：位于正常和互补位置的位的多位存储器阵列中的闪存单元的擦除方法。执行正常位置中的位的擦除验证，并且如果正常位置中的位失败，并且如果还没有达到最大擦除脉冲计数，则将擦除脉冲施加到正常位和补充位。执行补充位置中的位的擦除验证，并且如果补充位中的位失败，并且如果还没有达到最大擦除脉冲计数，则擦除脉冲将被施加到互补位和正常位位置。如果这些位通过擦除验证，则这些位经过软编程验证。如果这些位过高，并且如果没有达到软编程脉冲计数，则软编程脉冲将被施加到过高位。

7. 发明授权

US06775187B1 Method of programming a dual cell memory device 失效
标题翻译：编程双单元存储器件的方法
公开(公告)号：US06775187B1
公开(公告)日：2004-08-10
申请号：US10422489
申请日：2003-04-24
申请人： Darlene G. Hamilton , Edward F. Runnion , Edward Hsia , Kulachet Tanpairoj
发明人： Darlene G. Hamilton , Edward F. Runnion , Edward Hsia , Kulachet Tanpairoj
IPC分类号： G11C1604
CPC分类号： G11C16/10 , G11C16/0475
摘要： A method of programming a dual cell memory device having a first charge storing cell and second charge storing cell. The first charge storing cell can be pre-read to determine if the first charge storing cell stores an amount of charge to increase a threshold voltage of the memory device over a specified threshold voltage. If not, the second charge storing cell can be programmed with a standard program pulse. If so, the second charge storing cell can be programed with a modified program pulse.
摘要翻译：一种编程具有第一电荷存储单元和第二电荷存储单元的双单元存储器件的方法。可以预先读取第一电荷存储单元，以确定第一电荷存储单元是否存储一定量的电荷以增加存储器件的阈值电压超过指定的阈值电压。如果不是，则可以用标准编程脉冲编程第二电荷存储单元。如果是这样，则可以用修改的编程脉冲对第二电荷存储单元进行编程。

8. 发明授权

US08938655B2 Extending flash memory data retension via rewrite refresh 有权
标题翻译：通过重写刷新来扩展闪存数据
公开(公告)号：US08938655B2
公开(公告)日：2015-01-20
申请号：US11961772
申请日：2007-12-20
申请人： Darlene G. Hamilton , Mark W. Randolph , Don Carlos Darling , Ron Kornitz
发明人： Darlene G. Hamilton , Mark W. Randolph , Don Carlos Darling , Ron Kornitz
IPC分类号： G11C29/00 , G11C7/00 , G11C16/34 , G11C16/10
CPC分类号： G11C16/3418 , G11C16/10 , G11C16/3431
摘要： Providing for extended data retention of flash memory devices by program state rewrite is disclosed herein. By way of example, a memory cell or group of memory cells can be evaluated to determine a program state of the cell(s). If the cell(s) is in a program state, as opposed to a natural or non-programmed state, a charge level, voltage level and/or the like can be rewritten to a default level associated with the program state, without erasing the cell(s) first. Accordingly, conventional mechanisms for refreshing cell program state that require rewriting and erasing, typically degrading storage capacity of the memory cell, can be avoided. As a result, data stored in flash memory can be refreshed in a manner that mitigates loss of memory integrity, providing substantial benefits over conventional mechanisms that can degrade memory integrity at a relatively high rate.
摘要翻译：本文公开了通过程序状态改写提供闪速存储器件的扩展数据保存。作为示例，可以评估存储器单元或存储器单元组以确定单元的程序状态。如果单元处于编程状态，与自然或非编程状态相反，则可以将充电电平，电压电平和/或类似物重写为与程序状态相关联的默认电平，而不擦除电池第一。因此，可以避免用于刷新需要重写和擦除的通常降低存储器单元的存储容量的小区程序状态的常规机制。结果，存储在闪速存储器中的数据可以以减轻内存完整性损失的方式刷新，相对于可以以相对较高的速率降低存储器完整性的传统机制提供实质的益处。

9. 发明授权

US06967873B2 Memory device and method using positive gate stress to recover overerased cell 有权
公开(公告)号：US06967873B2
公开(公告)日：2005-11-22
申请号：US10677790
申请日：2003-10-02
申请人： Darlene G. Hamilton , Zhizheng Liu , Mark W. Randolph , Yi He , Edward Hsia , Kulachet Tanpairoj , Mimi Lee , Alykhan Madhani
发明人： Darlene G. Hamilton , Zhizheng Liu , Mark W. Randolph , Yi He , Edward Hsia , Kulachet Tanpairoj , Mimi Lee , Alykhan Madhani
IPC分类号： G11C16/04 , G11C16/34 , G11C11/34
CPC分类号： G11C16/3404 , G11C16/0475 , G11C16/107 , G11C16/3409 , G11C16/344 , G11C16/3445 , G11C16/345
摘要： A method of erasing a flash electrically erasable read only memory (EEPROM) device composed of a plurality of memory cells includes pre-programming the plurality of memory cells, applying an erase pulse to the plurality of memory cells followed by an erase verification. The erase verification is followed by soft programming any memory cells having a threshold voltage below a predetermined minimum level and applying a positive gate stress to the plurality of memory cells. The erase method prevents overerasing and provides a tightened threshold voltage distribution.

10. 发明授权

US06813752B1 Method of determining charge loss activation energy of a memory array 失效
标题翻译：确定存储器阵列的电荷损耗激活能的方法
公开(公告)号：US06813752B1
公开(公告)日：2004-11-02
申请号：US10306667
申请日：2002-11-26
申请人： Edward Hsia , Darlene G. Hamilton , Wei Zheng , Mark W. Randolph , Kulachet Tanpairoj
发明人： Edward Hsia , Darlene G. Hamilton , Wei Zheng , Mark W. Randolph , Kulachet Tanpairoj
IPC分类号： G06F1750
CPC分类号： G11C29/50 , G11C16/04
摘要： A method of determining charge loss activation for a memory array. Memory arrays are programmed with a pattern for testing charge loss. Then, respective bake times are calculated for the memory arrays to experience a given amount of charge loss at their respective bake temperatures. Then, charge loss activation energy is calculated, based on the respective bake times. In one version, the memory arrays are cycled by repeatedly erasing and reprogramming them before baking. In another embodiment, various regions of the memory arrays are programmed to a plurality of distinct delta threshold voltages before baking.
摘要翻译：确定存储器阵列的电荷损失激活的方法。存储器阵列被编程用于测试电荷损失的模式。然后，对于存储器阵列计算各自的烘烤时间，以在其各自的烘烤温度下经历给定量的电荷损失。然后，基于相应的烘烤时间计算电荷损失激活能。在一个版本中，通过在烘烤之前重复擦除和重新编程它们来循环存储器阵列。在另一个实施例中，存储器阵列的各个区域在烘烤之前被编程为多个不同的增量阈值电压。

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