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    • 2. 发明授权
    • Semi-aqueous solvent cleaning of paste processing residue from substrates
    • 半水溶剂清洗膏从底物处理残留物
    • US06742530B2
    • 2004-06-01
    • US10294236
    • 2002-11-14
    • Krishna G. SachdevJames N. HumenikChon Cheong LeiGlenn A. Pomerantz
    • Krishna G. SachdevJames N. HumenikChon Cheong LeiGlenn A. Pomerantz
    • B08B308
    • H01L21/02063B23K35/025C11D7/263C11D11/0047C11D11/007C23G5/032H05K3/1233H05K3/26Y10S134/902
    • A process of cleaning of objects that relate to semiconductor fabrication processes, such as, for example, conductive paste screening in the production of multilayer ceramic substrates and composite solder paste by stencil printing in electronic circuit assembly. Specifically, the process removes a metal/polymer composite paste from screening masks and associated paste making and processing equipment used in printing conductive metal pattern onto ceramic green sheet in the fabrication of semiconductor packaging substrates. The process also cleans solder paste residue from stencil printing equipment used in electronic module assembly surface mount technology for SMT discretes, solder column attachment, and BGA (Ball Grid Array) attachment on ceramic chip carrier or for screening solder paste onto printed circuit board. More particularly, paste residue is cleaned from metal, ceramic, and plastic substrates by a non-alkaline semi-aqueous cleaning method employing high boiling propylene glycol alkyl ether or mixtures of propylene glycol alkyl ether and propylene glycol solvents.
    • 清洁与半导体制造工艺有关的物体的过程,例如通过在电子电路组件中的模版印刷生产多层陶瓷衬底中的导电糊料和复合焊膏。 具体地说,该方法在半导体封装衬底的制造中,将金属/聚合物复合糊剂从掩模掩模和用于印刷导电金属图案的相关糊剂制造和加工设备移除到陶瓷生片上。 该工艺还可以将陶瓷芯片载体上用于SMT离散,焊料柱附件和BGA(球栅阵列)附件的电子模块组件表面贴装技术中使用的模版印刷设备的焊膏残留物清理或用于将焊膏屏蔽到印刷电路板上。 更具体地,通过使用高沸点丙二醇烷基醚或丙二醇烷基醚和丙二醇溶剂的混合物的非碱性半水洗涤方法,从金属,陶瓷和塑料基材中清除糊状残余物。
    • 3. 发明授权
    • Semi-aqueous solvent cleaning of paste processing residue from substrates
    • 半水溶剂清洗膏从底物处理残留物
    • US06569252B1
    • 2003-05-27
    • US09609283
    • 2000-06-30
    • Krishna G. SachdevJames N. HumenikChon Cheong LeiGlenn A. Pomerantz
    • Krishna G. SachdevJames N. HumenikChon Cheong LeiGlenn A. Pomerantz
    • C23G502
    • H01L21/02063B23K35/025C11D7/263C11D11/0047C11D11/007C23G5/032H05K3/1233H05K3/26Y10S134/902
    • A process of cleaning of objects that relate to semiconductor fabrication processes, such as, for example, conductive paste screening in the production of multilayer ceramic substrates and composite solder paste by stencil printing in electronic circuit assembly. Specifically, the process removes a metal/polymer composite paste from screening masks and associated paste making and processing equipment used in printing conductive metal pattern onto ceramic green sheet in the fabrication of semiconductor packaging substrates. The process also cleans solder paste residue from stencil printing equipment used in electronic module assembly surface mount technology for SMT discretes, solder column attachment, and BGA (Ball Grid Array) attachment on ceramic chip carrier or for screening solder paste onto printed circuit board. More particularly, paste residue is cleaned from metal, ceramic, and plastic substrates by a non-alkaline semi-aqueous cleaning method employing high boiling propylene glycol alkyl ether or mixtures of propylene glycol alkyl ether and propylene glycol solvents.
    • 清洁与半导体制造工艺有关的物体的过程,例如通过在电子电路组件中的模版印刷生产多层陶瓷衬底中的导电糊料和复合焊膏。 具体地说,该方法在半导体封装衬底的制造中,将金属/聚合物复合糊剂从掩模掩模和用于印刷导电金属图案的相关糊剂制造和加工设备移除到陶瓷生片上。 该工艺还可以将陶瓷芯片载体上用于SMT离散,焊料柱附件和BGA(球栅阵列)附件的电子模块组件表面贴装技术中使用的模版印刷设备的焊膏残留物清理或用于将焊膏屏蔽到印刷电路板上。 更具体地,通过使用高沸点丙二醇烷基醚或丙二醇烷基醚和丙二醇溶剂的混合物的非碱性半水洗涤方法,从金属,陶瓷和塑料基材中清除糊状残余物。
    • 10. 发明授权
    • Ceramic probe card and method for reducing leakage current
    • 陶瓷探针卡和减少漏电流的方法
    • US5532608A
    • 1996-07-02
    • US417623
    • 1995-04-06
    • Abbas Behfar-RadCharles H. PerryKrishna G. Sachdev
    • Abbas Behfar-RadCharles H. PerryKrishna G. Sachdev
    • G01R31/26G01R1/073H05K3/28H05K9/00G01R15/12
    • G01R1/07307
    • An electrical probe card for parametric testing of microelectronics having reduced leakage current, includes a hydrophobic layer of a self curing silicone material coating the entire exposed surface of the ceramic card between exposed conductors. The hydrophobic layer has a thickness of less than 1 micrometer, preferably less than 0.1 micrometer and most preferably between 0.01 and 0.001 micrometers. The hydrophobic layer does not interfere with subsequent soldering to the contacts on the card, is inexpensive, solvent resistant and easily applied to new and pre-existing probe cards. The method of application involves applying an excess of the hydrophobic silicone material in its uncured state, followed by vigorously wiping excess material off to thin the layer, produce a good bond and clean the exposed conductors on the probe card.
    • 用于具有减小的漏电流的微电子学参数测试的电探针卡包括在裸露导体之间涂覆陶瓷卡的整个暴露表面的自固化硅氧烷材料的疏水层。 疏水层的厚度小于1微米,优选小于0.1微米,最优选为0.01至0.001微米。 疏水层不会干扰随后焊接到卡上的触点,价格低廉,耐溶剂性,并且易于应用于新的和预先存在的探针卡。 施用方法包括将过量的疏水性硅氧烷材料应用于其未固化状态,然后剧烈擦拭多余的材料以使层变薄,产生良好的粘结并清洁探针卡上的暴露的导体。