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    • 1. 发明授权
    • Avalanche transit time diode with heterojunction structure
    • 具有异质结结构的雪崩运行时间二极管
    • US4176366A
    • 1979-11-27
    • US871881
    • 1978-01-24
    • Daniel Delagebeaudeuf
    • Daniel Delagebeaudeuf
    • H01L29/267H01L29/864H01L29/90H03B9/12
    • H01L29/267H01L29/864
    • An avalanche diode of the IMPact Avalanche Transit Time (IMPATT) type with heterojunction structure of two different semiconductor materials, wherein a semiconductor junction P/N or N/P is located at the interface of the two materials. In order to improve the efficiency of the diode functioning as an oscillator, the impurity concentrations of the semiconductors are chosen so that the avalanche zone is located in one and only one of the materials, the thickness of the materials being determined in conjunction with the impurity concentrations to have transit zones of equal length, thus producing a "double drift" avalanche zone. In the case of Ge/Ga As the condition to be fulfilled by the impurity concentration K.sub.1 of Ge and the impurity concentration K.sub.2 of Ga AS is very simple:K.sub.1 =2/3K.sub.2
    • 具有两种不同半导体材料的异质结结构的IMPACT雪崩运行时间(IMPATT)型的雪崩二极管,其中半导体结P / N或N / P位于两种材料的界面处。 为了提高作为振荡器起作用的二极管的效率,选择半导体的杂质浓度,使得雪崩区位于一种且仅一种材料中,材料的厚度与杂质结合确定 浓度有相等长度的过境区,从而产生“双漂”的雪崩区。 在Ge / Ga的情况下,由Ge的杂质浓度K1和Ga AS的杂质浓度K2所满足的条件非常简单:K1 = 2 / 3K2