会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 4. 发明授权
    • Liquid flow rate estimation and verification by direct liquid measurement
    • 液体流量估算和直接液体测量验证
    • US5866795A
    • 1999-02-02
    • US819593
    • 1997-03-17
    • Yen-Kun WangFong ChangThanh PhamJeff Plante
    • Yen-Kun WangFong ChangThanh PhamJeff Plante
    • G01L25/00
    • G01F25/0007C23C16/4481G01F1/007G01F1/708G01F25/003G01F25/0038
    • An apparatus for controlling the flow of a liquid precursor into a deposition chamber comprises a liquid injection system having a liquid injection outlet connected to a chamber inlet line upstream of the deposition chamber. The liquid injection system includes a liquid precursor supply, a purge gas supply, a carrier gas supply, a liquid flow meter, and a controller managing flows of the liquid precursor and carrier gas to the chamber. A purge line is connected between the purge gas supply and the liquid flow meter and is used to trap a known mass of liquid precursor. To calibrate the flow of the liquid precursor, the purge gas is used to push the trapped liquid precursor through the liquid flow meter at a steady rate. The elapsed time for evacuating the trapped liquid precursor from the purge line is measured. Calibration information is computed using the mass of the trapped liquid precursor and the measured elapsed time based on the direct liquid measurement approach. The calibration information is used to calibrate the controller to correct deviations in the liquid flow rate and achieve a target liquid precursor flow rate for improving wafer uniformity.
    • 用于控制液体前体流入沉积室的装置包括具有连接到沉积室上游的室入口管的液体注入口的液体注入系统。 液体注入系统包括液体前体供应源,吹扫气体供应源,载气供应器,液体流量计和控制液体前体和载体气体流到腔室的控制器。 吹扫管线连接在净化气体供应源和液体流量计之间,用于捕集已知质量的液体前体。 为了校准液体前体的流动,吹扫气体以稳定的速率推动被捕获的液体前体通过液体流量计。 测量从清除管线排出被捕获的液体前体的经过时间。 基于直接液体测量方法,使用捕获的液体前体的质量和测量的经过时间计算校准信息。 校准信息用于校准控制器以校正液体流速中的偏差,并实现目标液体前体流速以改善晶片均匀性。
    • 5. 发明申请
    • Pet car
    • 宠物车
    • US20060169218A1
    • 2006-08-03
    • US11165642
    • 2005-06-24
    • Fong Chang
    • Fong Chang
    • A01K1/03
    • A01K1/0254A01K1/0236
    • A pet carrying apparatus in which a pet can get in or out of a bag structure by itself is provided. The bag structure has a definite inner space defined by a bag body, a positioning frame that is positioned on a periphery the bag body, and a front layer defining a pet opening therein, whereby a pet can get in or out of the inner space. The apparatus further has a vehicle body that defines a vehicle inner space. The vehicle body has a frame and a set of attached wheels. The apparatus also has a pair of connecting devices positioned opposite of each other. Each of the connecting devices being located at an inner side of the vehicle body such that when the bag structure is placed within the vehicle inner space, the pair of connecting devices is symmetrically placed on the positioning frame.
    • 提供宠物可以自己进出袋结构的宠物携带设备。 袋结构具有由袋体定义的确定的内部空间,位于袋体的周边的定位框架和在其中限定宠物开口的前层,由此宠物可以进入或离开内部空间。 该装置还具有限定车辆内部空间的车体。 车体具有框架和一组附接的车轮。 该装置还具有彼此相对定位的一对连接装置。 每个连接装置位于车体的内侧,使得当袋结构被放置在车辆内部空间内时,该对连接装置对称放置在定位架上。
    • 6. 发明授权
    • Headwear comprising a bill which defines an enclosed space
    • 头饰包括一个定义封闭空间的帐单
    • US07950068B2
    • 2011-05-31
    • US11969784
    • 2008-01-04
    • Fong Chang
    • Fong Chang
    • A42B1/00
    • A42B1/242A42B1/063A42B1/064
    • A headwear assembly, comprising a crown, a bill attached to said crown, and extending outwardly therefrom. The bill comprises an upper bill portion comprising a first periphery and a first closure means disposed along that first periphery, a lower bill portion comprising a second periphery and a second closure means disposed along that second periphery, wherein the first periphery can be releaseably attached to the second periphery by releaseably attaching the first closure means to the second closure means to define an enclosed space between the upper bill portion and the lower bill portion.
    • 一种头饰组件,包括冠部,附接到所述冠部的纸币,并从其向外延伸。 纸币包括上部纸币部分,其包括第一周边和沿着该第一周边布置的第一封闭装置,包括第二周边的下部纸币部分和沿着该第二周边设置的第二封闭装置,其中第一周边可以可释放地附接到 所述第二周边通过将所述第一封闭装置可释放地附接到所述第二封闭装置以限定所述上部纸币部分和所述下部纸币部分之间的封闭空间。
    • 8. 发明授权
    • In-situ liquid flow rate estimation and verification by sonic flow method
    • 声流法原位液体流量估算与验证
    • US5968588A
    • 1999-10-19
    • US819674
    • 1997-03-17
    • Visweswaren SivaramakrishnanYen-Kun WangFong ChangThanh PhamJeff Plante
    • Visweswaren SivaramakrishnanYen-Kun WangFong ChangThanh PhamJeff Plante
    • C23C16/448C23C16/52C23C16/00
    • C23C16/52C23C16/4481
    • An apparatus for in-situ control of the flow of a liquid precursor into a deposition chamber comprises a liquid injection system having a liquid injection outlet connected to a chamber inlet line upstream of the deposition chamber. The liquid injection system includes a liquid precursor supply, a carrier gas supply, a vaporizer, and a controller managing flows of the liquid precursor and carrier gas to the chamber. A bypass line is connected to the chamber inlet line and includes a bypass valve, a sonic orifice, and a pressure gauge upstream of the sonic orifice. To calibrate the flow of the liquid precursor, a flow of carrier gas is directed into the bypass line at a carrier gas sonic flow rate. A first steady state pressure is measured with the pressure gauge. The liquid precursor is vaporized and directed to the flow of carrier gas into the bypass line. A second steady state pressure is measured with the pressure gauge. Calibration information is computed using the first steady state pressure and second steady state pressure based on sonic flow theory. The calibration information is used to calibrate the controller to correct deviations in the liquid flow rate and achieve a target liquid precursor flow rate for improving wafer uniformity.
    • 用于原位控制液体前体进入沉积室的装置包括液体注射系统,其具有连接到沉积室上游的室入口管的液体注入口。 液体注射系统包括液体前体供应源,载气供应器,蒸发器和控制液体前体和载气流到腔室的控制器。 旁路管路连接到腔室入口管线,并且包括旁通阀,声波孔口和声波孔口上游的压力计。 为了校准液体前体的流动,以载气声音流速将载气流引导到旁路管线中。 用压力表测量第一稳态压力。 液体前体蒸发并引导到载气流入旁通管线。 用压力表测量第二稳态压力。 基于声流理论,使用第一稳态压力和第二稳态压力计算校准信息。 校准信息用于校准控制器以校正液体流速中的偏差,并实现目标液体前体流速以改善晶片均匀性。