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1. 发明授权

US07015690B2 Omnidirectional eddy current probe and inspection system 失效
标题翻译：全向涡流探头和检测系统
公开(公告)号：US07015690B2
公开(公告)日：2006-03-21
申请号：US10856381
申请日：2004-05-27
申请人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
发明人： Changting Wang , Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , William Stewart McKnight , Gigi Olive Gambrell
IPC分类号： G01N27/90 , G01N27/72
CPC分类号： G01N27/902 , G01N27/9033 , G01N27/904
摘要： An omnidirectional eddy current (EC) probe includes at least one EC channel having a first and a second sense coil that are offset in a first (x) and a second (y) direction and overlap in at least one of the directions (x,y). At least one drive coil is configured to generate a probing field for the EC channel in a vicinity of the sense coils. An omnidirectional EC inspection system includes an omnidirectional EC array probe (ECAP) that includes a number of EC channels and drive coils. Each EC channel includes first and second sense coils with opposite polarities. The drive coils have alternating polarities. Electrical connections perform differential sensing for respective EC channels. Corrective drive coils are disposed at respective ends of the EC channels and generate probing fields. An eddy current instrument is connected to the omnidirectional ECAP and receives differential sensing signals from the EC channels.
摘要翻译：全向涡流（EC）探针包括至少一个具有第一和第二感测线圈的EC通道，该第一和第二感测线圈在第一（x）和第二（y）方向上偏移并且在至少一个方向（x， y）。至少一个驱动线圈被配置为在感测线圈附近产生用于EC通道的探测场。全方位的EC检测系统包括一个包括多个EC通道和驱动线圈的全向EC阵列探针（ECAP）。每个EC通道包括具有相反极性的第一和第二感测线圈。驱动线圈具有交替极性。电气连接对相应的EC通道执行差分感测。纠正驱动线圈设置在EC通道的相应末端并产生探测场。涡流仪器连接到全向ECAP，并从EC通道接收差分感测信号。

2. 发明授权

US08436608B2 Eddy current inspection system and method 有权
标题翻译：涡流检测系统及方法
公开(公告)号：US08436608B2
公开(公告)日：2013-05-07
申请号：US12563403
申请日：2009-09-21
申请人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
发明人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01N27/82 , G01R33/14 , G01R33/00
CPC分类号： G01N27/904
摘要： A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
摘要翻译：提供多频涡流（MFEC）检测系统，用于检查零件上的表面硬化深度。 MFEC检查系统包括被配置为产生一个或多个多频激励信号的发生器和被配置为设置在该部分的一侧的涡流探针。涡流探头包括一个或多个驱动器和一个或多个拾取传感器。一个或多个驱动器被配置为接收一个或多个多频率激励信号以在该部分中引起涡流。一个或多个拾取传感器被配置为检测部件的局部区域内的感应涡流以产生一个或多个多频响应信号。 MFEC系统还包括处理器，其被配置为接收一个或多个多频响应信号以进行处理以确定部件的局部区域的壳体硬化深度。还提出了脉冲涡流检测系统和涡流检测方法。

3. 发明申请

US20110068784A1 EDDY CURRENT INSPECTION SYSTEM AND METHOD 有权
标题翻译： EDDY电流检测系统和方法
公开(公告)号：US20110068784A1
公开(公告)日：2011-03-24
申请号：US12563403
申请日：2009-09-21
申请人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
发明人： Haiyan Sun , Yuri Alexeyevich Plotnikov , Changting Wang , Shridhar Champaknath Nath , Aparna Chakrapani Sheila-Vadde
IPC分类号： G01R33/06 , G01R1/06 , G01R33/00
CPC分类号： G01N27/904
摘要： A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented.
摘要翻译：提供多频涡流（MFEC）检测系统，用于检查零件上的表面硬化深度。 MFEC检查系统包括被配置为产生一个或多个多频激励信号的发生器和被配置为设置在该部分的一侧的涡流探针。涡流探头包括一个或多个驱动器和一个或多个拾取传感器。一个或多个驱动器被配置为接收一个或多个多频率激励信号以在该部分中引起涡流。一个或多个拾取传感器被配置为检测部件的局部区域内的感应涡流以产生一个或多个多频响应信号。 MFEC系统还包括处理器，其被配置为接收一个或多个多频响应信号以进行处理以确定部件的局部区域的壳体硬化深度。还提出了脉冲涡流检测系统和涡流检测方法。

4. 发明授权

US06720775B2 Pulsed eddy current two-dimensional sensor array inspection probe and system 有权
标题翻译：脉冲涡流二维传感器阵列检测探头和系统
公开(公告)号：US06720775B2
公开(公告)日：2004-04-13
申请号：US09681824
申请日：2001-06-12
申请人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
发明人： Yuri Alexeyevich Plotnikov , Shridhar Champaknath Nath , Curtis Wayne Rose , Thomas James Batzinger , Kenneth Gordon Herd
IPC分类号： G01R3128
CPC分类号： G01N27/904
摘要： A pulsed eddy current two-dimensional sensor array probe for electrically conducting component inspection includes a drive coil disposed adjacent to a structure under inspection, a pulse generator connected to the drive coil and operable to energize in a pulsed manner the drive coil to transmit transient electromagnetic flux into the structure under inspection, and an array of sensors arranged in a two-dimensional array and substantially surrounded by the drive coil and operable to sense and generate output signals from the transient electromagnetic flux in the structure under inspection.
摘要翻译：用于导电部件检查的脉冲涡流二维传感器阵列探针包括邻近被检查结构设置的驱动线圈，连接到驱动线圈的脉冲发生器，可操作以脉冲方式激励驱动线圈传递瞬态电磁焊剂进入被检查的结构，以及布置成二维阵列并且基本上被驱动线圈包围的传感器阵列，可操作以感测和产生来自被检查结构中的瞬态电磁通量的输出信号。

5. 发明授权

US06911826B2 Pulsed eddy current sensor probes and inspection methods 有权
标题翻译：脉冲涡流传感器探头和检查方法
公开(公告)号：US06911826B2
公开(公告)日：2005-06-28
申请号：US10727401
申请日：2003-12-03
申请人： Yuri Alexeyevich Plotnikov , Thomas James Batzinger , Shridhar Champaknath Nath , Sandeep Kumar Dewangan , Carl Stephen Lester , Kenneth Gordon Herd , Curtis Wayne Rose
发明人： Yuri Alexeyevich Plotnikov , Thomas James Batzinger , Shridhar Champaknath Nath , Sandeep Kumar Dewangan , Carl Stephen Lester , Kenneth Gordon Herd , Curtis Wayne Rose
IPC分类号： G01B7/34 , G01B7/00 , G01N27/90 , G01N27/82 , G01R31/28 , G01R33/00 , G01R33/12
CPC分类号： G01N27/904
摘要： A pulsed eddy current sensor probe includes a sensor array board. A number of sensors are arranged on the sensor array board and are operable to sense and generate output signals from the transient electromagnetic flux in a part being inspected. Each of the sensors has a differential output with a positive and a negative output. At least one drive coil is disposed adjacent to the sensors and is operable to transmit transient electromagnetic flux into the part. A first and a second multiplexer are arranged on the sensor array board and are operable to switch between the sensors. The first and second multiplexers are connected to the positive and negative outputs of the sensors, respectively.
摘要翻译：脉冲涡流传感器探头包括传感器阵列板。多个传感器布置在传感器阵列板上，并且可操作以在被检查的部件中感测并产生来自瞬态电磁通量的输出信号。每个传感器都具有带正和负输出的差分输出。至少一个驱动线圈被布置成与传感器相邻，并且可操作以将瞬态电磁通量传输到该部件中。第一和第二多路复用器布置在传感器阵列板上并可操作以在传感器之间切换。第一和第二多路复用器分别连接到传感器的正和负输出。

6. 发明授权

US06707297B2 Method for in-situ eddy current inspection of coated components in turbine engines 失效
标题翻译：涡轮发动机涂层部件原位涡流检测方法
公开(公告)号：US06707297B2
公开(公告)日：2004-03-16
申请号：US10122836
申请日：2002-04-15
申请人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Yuri Alexeyevich Plotnikov , Kenneth Gordon Herd
发明人： Shridhar Champaknath Nath , Thomas James Batzinger , Curtis Wayne Rose , Yuri Alexeyevich Plotnikov , Kenneth Gordon Herd
IPC分类号： G01N2782
CPC分类号： G01N27/9046
摘要： A method for in-situ eddy current inspection of at least one coated component includes applying a drive pulse at a measurement position on an outer surface of the coated component, while the coated component is installed in an operational environment of the coated component. The coated component includes a base metal and a coating disposed on the base metal. The method further includes receiving a response signal from the coated component, comparing the response signal with a reference signal to obtain a compared signal, analyzing the compared signal for crack detection, and determining whether a crack near the measurement position has penetrated into the base metal, if the presence of the crack in the coating is indicated.
摘要翻译：用于至少一个涂覆部件的原位涡流检查的方法包括在涂覆部件的外表面上的测量位置处施加驱动脉冲，同时将涂覆部件安装在涂覆部件的操作环境中。涂覆的部件包括贱金属和设置在母材上的涂层。该方法还包括从涂覆部件接收响应信号，将响应信号与参考信号进行比较以获得比较信号，分析用于裂纹检测的比较信号，以及确定测量位置附近的裂纹是否穿透到基底金属如果指示涂层中存在裂纹。

7. 发明授权

US06812697B2 Molded eddy current array probe 有权
公开(公告)号：US06812697B2
公开(公告)日：2004-11-02
申请号：US10253848
申请日：2002-09-24
申请人： William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
发明人： William Stewart McKnight , Shridhar Champaknath Nath , Sandie Elizabeth Gresham , Richard Lloyd Trantow , Douglas Edward Ingram , John William Ertel , Thomas James Batzinger , Curtis Wayne Rose , Francis Howard Little
IPC分类号： G01N2790
CPC分类号： G01N27/9006 , G01N27/902 , G01N27/904
摘要： The present invention provides an eddy current array probe having a complaint body molded around a rigid insert. A flexible eddy current array circuit is wrapped around the outer surface of the compliant body.

8. 发明申请

US20080278151A1 SYSTEM AND METHODS FOR INSPECTING INTERNAL CRACKS 审中-公开
标题翻译：检查内部裂缝的系统和方法
公开(公告)号：US20080278151A1
公开(公告)日：2008-11-13
申请号：US11745122
申请日：2007-05-07
申请人： Changting Wang , Shridhar Champaknath Nath , Weston Blaine Griffin , Michael Wayne Fields , Darren Lee Hallman , Abdul Rahman Abdallah Al-Khalidy
发明人： Changting Wang , Shridhar Champaknath Nath , Weston Blaine Griffin , Michael Wayne Fields , Darren Lee Hallman , Abdul Rahman Abdallah Al-Khalidy
IPC分类号： G01N27/90 , G01R33/14
CPC分类号： G01N27/9046 , G01N27/902
摘要： A method for inspecting an internal cavity in a part is provided. The method includes inserting a probe into the internal cavity. The method also includes controlling movement of the probe using a defined scan path to scan the probe over a region of interest in the internal cavity. The method also includes applying multiple multifrequency excitation signals to the probe to generate a number of multifrequency response signals. The multifrequency excitation signals are applied at multiple positions within the internal cavity. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity.
摘要翻译：提供了用于检查零件中的内部空腔的方法。该方法包括将探针插入内腔。该方法还包括使用限定的扫描路径控制探针的移动，以在内腔中的感兴趣区域上扫描探针。该方法还包括将多个多频激励信号应用于探针以产生多个多频响应信号。多频激励信号被施加在内腔内的多个位置处。该方法还包括对多频响应信号执行多频相分析以检查内腔。

9. 发明授权

US06888347B2 Omnidirectional eddy current probes, array probes, and inspection systems 失效
标题翻译：全向涡流探头，阵列探头和检测系统
公开(公告)号：US06888347B2
公开(公告)日：2005-05-03
申请号：US10662681
申请日：2003-09-12
申请人： Thomas James Batzinger , Shridhar Champaknath Nath , Curtis Wayne Rose
发明人： Thomas James Batzinger , Shridhar Champaknath Nath , Curtis Wayne Rose
IPC分类号： G01N27/90 , G01N27/82
CPC分类号： G01N27/9033
摘要： An omnidirectional eddy current probe includes a number of sense coils arranged in a stack having a principal axis. At least two of the sense coils are rotationally skewed about the principal axis relative to one another. The sense coils are operatively connected to each other and a drive coil is also positioned in the stack. An impulse through the drive coil induces a magnetic influx through a conducting material specimen having a surface, thereby generating eddy currents on the surface. Secondary magnetic field generated from the eddy currents produces corresponding signals in the sense coils, and the signals are then analyzed for the possibility of surface flaw in the conducting material.
摘要翻译：全向涡流探针包括布置在具有主轴的堆叠中的多个感测线圈。感测线圈中的至少两个相对于彼此围绕主轴旋转倾斜。感测线圈可操作地彼此连接，并且驱动线圈也位于堆叠中。通过驱动线圈的冲击通过具有表面的导电材料试样引起磁流入，从而在表面上产生涡流。从涡流产生的二次磁场在感测线圈中产生相应的信号，然后分析信号中导电材料表面缺陷的可能性。

10. 发明申请

US20090158821A1 DEVICES, METHODS AND SYSTEMS FOR MEASURING ONE OR MORE CHARACTERISTICS OF A SUSPENSION 审中-公开
标题翻译：用于测量悬挂的一个或更多特征的装置，方法和系统
公开(公告)号：US20090158821A1
公开(公告)日：2009-06-25
申请号：US11961070
申请日：2007-12-20
申请人： Zongqi Sun , Shridhar Champaknath Nath , Alan M. Williams , Baskaran Ganesan , Mottito Togo , Roger Nordberg , Matthew Allen Radebach
发明人： Zongqi Sun , Shridhar Champaknath Nath , Alan M. Williams , Baskaran Ganesan , Mottito Togo , Roger Nordberg , Matthew Allen Radebach
IPC分类号： G01N15/06
CPC分类号： G01N30/56 , G01N15/06 , G01N29/024 , G01N2030/565 , G01N2291/02416 , G01N2291/045
摘要： A device, method and system for measuring one or more ultrasound parameters of a suspension comprising particles dispersed in a liquid carrier comprising, an immersible devices, comprising, one or more ultrasonic probes; a reflector having staggered reflective; a housing having an opening into the housing to allow the suspension to flow into the space between the probe surface and the reflective surface; an ultrasound wave generator/receiver device; and a signal processing device.
摘要翻译：一种用于测量悬浮液的一个或多个超声参数的装置，方法和系统，所述悬浮液包含分散在液体载体中的颗粒，所述液体载体包括浸没装置，具有交错反射的反射器; 壳体，其具有通向所述壳体的开口，以允许所述悬架流入所述探针表面和所述反射表面之间的空间; 超声波发生器/接收器装置; 和信号处理装置。

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